렌탈 사업
TTC 그룹은 각종 제조/분석 장치등의 매입도 담당하고 있습니다.
또한 고객이 필요로 하는 장치에 관해 수시로 문의를 받고 있습니다.
매매에 관한 각종 문의 사항을홈페이지 문의 양식, 또는 전화(03)3344-5540로 연락 주세요.
또한 고객이 필요로 하는 장치에 관해 수시로 문의를 받고 있습니다.
매매에 관한 각종 문의 사항을홈페이지 문의 양식, 또는 전화(03)3344-5540로 연락 주세요.
리스, 렌탈 장치 정보
| TTC ID | 제조업체 | 형식 | 품명・사양 | 연식 | 수량 | 리스 개시 일시 | 가격 |
| 61SpiMI1HN35411 | MIKASA | 1H-DXII | Spin Coater/6in. | Inq. | 1 | ||
| 61UV USUMQ36192 | USHIO | UMA-1002-HC94 | UV Cure | 1994 | 1 | ||
| 62AshKoRAR37168 | Kokusai | RAM-6500 | Asher/Batch/Plasma/6in. | 2002 | 1 | ||
| 62AshKoRAR37169 | Kokusai | RAM-6500 | Asher/Batch/Plasma/6in. | 2002 | 1 | ||
| 62AshKoRAR37170 | Kokusai | RAM-6500 | Asher/Batch/Plasma/6in. | 2002 | 1 | ||
| 87PlaEECUN36176 | EEJA | CUP-PLATER | Plating/Gold/2-8in. | Inq. | 1 | ||
| A4PacCaCAS34280 | Canon Machinery | CAP500 | Package Picker | 2005 | 1 | ||
| A4PacCaCAS34281 | Canon Machinery | CAP500 | Package Picker | 2005 | 1 | ||
| A4PacCaCAS34282 | Canon Machinery | CAP500 | Package Picker | 2007 | 1 | ||
| E1ACFNiAFN36693 | Nikka Equipment | AF-40A | ACF Attachment | 2007 | 1 | ||
| E1ACFNiFBN36694 | Nikka Equipment | FBM-40M | ACF Crimping | 2007 | 1 | ||
| E3AliCaPLN37362 | Canon | PLA-501FA | Aligner/3in./5in. | Inq. | 1 | ||
| E4MagASHSN36695 | AS ONE | HS-50D | Magnetic Stirrer | Inq. | 1 | ||
| E5RinFSK1N37616 | FSI | K131R.D | Rinser Dryer/2.5in. | Inq. | 1 | ||
| E5RinFSK1N37617 | FSI | K120 | Rinser Dryer/2.5in. | Inq. | 1 | ||
| H1LapSp24N37754 | Speedfam | 24-BTW | Lapping/2.5in. | Inq. | 1 | ||
| H1MouSp24N37744 | Speedfam | 24-MTW | Mounting Station | Inq. | 1 | ||
| H1PolSp24N37759 | Speedfam | 24-SPW | Polisher/2.5in. | Inq. | 1 | ||
| M3RefAsBaN35222 | Asahi Electronics | Ba-300N2II | Reflow Oven/Desktop/N2 | 2002 | 1 | ||
| M4DisMUSHN35404 | MUSASHI | SHOTMASTER-2 | Dispenser/Desktop type | 1996 | 1 | ||
| M5BoaSoCPD37039 | Sony | CPC-1000 | Board Inspection | 2001 | 2 | ||
| T1TesTSEMN35407 | TSK | EM-20 | Tester | Inq. | 1 | ||
| T2ProTSA-N35406 | TSK | A-PM-50A | Prober/6in. | Inq. | 1 | ||
| T2ProTSEMN35405 | TSK | EM-20-100 | Prober/6in. | 1987 | 1 | ||
| T2TDDESTPR36240 | ESJ | TPS-8000 | TDDB Probe Station/8in. | Inq. | 1 | ||
| W3PolALTER36245 | ALLIED HIGH TECH | TECHPREP | Polisher | Inq. | 1 | ||
| X1DefDKRUR36242 | DKL | RU-700 | Defect Review Unit | 1995 | 1 | ||
| X1IonPVTWR37666 | PVA TEPLA | TWIN SC4 | Ion-implant Dose Monitoring/8in.~12in. | 2004 | 1 | ||
| X1IonTHTPR36250 | THERMA-WAVE | TP400 | Ion Implantation Analyzer/6in. | Inq. | 1 | ||
| X1LifSEWTR37174 | SEMILAB | WT-85 | Life time measuring | Inq. | 1 | ||
| X1Rs KoVRQ36197 | Kokusai | VR-70 | Rs Measure/5in. | 1990 | 1 | ||
| X1ThiDNVLQ36198 | DNS | VL-M6000 | Thickness Measurement/6in. | 1993 | 1 | ||
| X1ThiDNVLQ36199 | DNS | VL-M6000 | Thickness Measurement/6in. | 1995 | 1 | ||
| X1WafHIWIQ36194 | HITACHI | WI-890 | Wafer Visual Inspection/6in. | 1997 | 1 | ||
| X1WafInLTQ36193 | Inq. | LTA-330A | Wafer Lifetime Measuring/5in. | Inq. | 1 | ||
| X1WafNiOPQ36195 | Nikon | OPTISTATION-3A | Wafer Visual Inspection/6in. | Inq. | 1 | ||
| X1X-rHoEMR36243 | Horiba | EMAX-5770 | X-ray Microanalyxer | 1995 | 1 | ||
| X2FE-HIS-R36237 | HITACHI | S-5000 | FE-SEM/6in./8in. | 1995 | 1 | ||
| X2SEMHIS-R36241 | HITACHI | S-4160 | SEM/6in./8in. | 1995 | 1 | ||
| X3MicKEVFN35403 | KEYENCE | VF-7500 | Microscope | Inq. | 1 | ||
| X3MicNiOPR36244 | Nikon | OPTIPHOT-88 | Microscope/8in. | Inq. | 1 | ||
| X3MicQFemR36247 | QFI(Quality Focus Instruments) | emmi1645 | Microscope/Emission/8in. | 1997 | 1 | ||
| X4CRYHPE4L38401 | HP | E4916A | CRYSTAL IMPEDANCE /LCR Meter | Inq. | 1 | ||
| X4CV ESHCR37667 | ESJ | HC-8610R | CV Measurement/6in. | 1994 | 3 | ||
| X4DigMIIDR36246 | MITUTOYO | ID-C112C | Digimatic Indicator | Inq. | 1 | ||
| X4FreAnMFL38378 | Anritsu | MF1601A | Frequency Counter | Inq. | 1 | ||
| X4MasLUIBR36248 | LUCAS LABS | IB420 | Mass Spectrum Analyzer | 1996 | 1 | ||
| X4MasLUIBR36249 | LUCAS LABS | IB420 | Mass Spectrum Analyzer | 1996 | 1 | ||
| X4NetHP87L38372 | HP | 8711A | Network Analyzer | 1997 | 1 | ||
| X4NetHP87L38389 | HP | 8751A | Network Analyzer | 1991 | 1 | ||
| X4OxiSAMIR36238 | SANWA | MI-476 | Oxide Film Evaluation Tool | Inq. | 1 | ||
| X4RF R&A2L38406 | R&K | A250HP-R | RF Power Amplifier | 2007 | 1 | ||
| X4S-PATATL38399 | ATN MICROWAVE | ATN-4111A-1 | S-PARAMETER TEST SET | 1999 | 1 | ||
| X4S-PHP85L38395 | HP | 85046A | S-PARAMETER TEST SET | 1995 | 1 | ||
| X4S-PHP85L38396 | HP | 85046A | S-PARAMETER TEST SET | Inq. | 1 | ||
| X4S-PHP85L38397 | HP | 85046A | S-PARAMETER TEST SET | 1990 | 1 | ||
| X4S-PHP87L38393 | HP | 87511A | S-PARAMETER TEST SET | 1991 | 1 | ||
| X4S-PHP87L38394 | HP | 87511A | S-PARAMETER TEST SET | Inq. | 1 | ||
| X4SynHP86L38400 | HP | 8644A | Synthesize Signal Generator | 2000 | 1 | ||
| X4SysHP60L38405 | HP | 6033A | System Power Supply | Inq. | 1 | ||
| X4TDDSAInR37182 | SANWA | Inq. | TDDB Probe Station | 1996 | 1 | ||
| Z3DryIsSSN36112 | Isuzu Seisakusho | SSF-113S+AT-S13 | Drying Oven+Controller | Inq. | 1 | ||
| Z3HigESSTR38675 | ESPEC | STH-120 | High-Temp Chamber | 2000 | 1 | ||
| Z3IncYaIHR38674 | Yamato | IH400 | Incubator | Inq. | 1 | ||
| Z3OveADFCN35224 | ADVANTEC | FC-612 | Oven | Inq. | 1 | ||
| Z3OveTOMON35223 | TOYAMA SANGYO | MO-9216 | Oven | 1995 | 1 | ||
| Z3TheSAMON37022 | SANYO | MOV-1025 | Thermostatic Bath | Inq. | 1 | ||
| Z5N2 InN2N36942 | Inq. | N2 BOX | N2 Box | Inq. | 1 | ||
| Z6DraKKDrN36854 | KKC | Draft | Draft | Inq. | 3 | ||
| Z7CleYOCMR38182 | YOKOGAWA | CM500 | Clean Room Gas Monitor | 2000 | 1 | ||
| Z7OzoAMORR36903 | AMAT | OR-4ZA | Ozonator | Inq. | 1 | ||
| Z7OzoAMORR36904 | AMAT | OR-4ZA | Ozonator | Inq. | 1 | ||
| Z7OzoAMORR36905 | AMAT | OR-4ZA | Ozonator | Inq. | 1 | ||
| Z7OzoAMORR36906 | AMAT | OR-4ZA | Ozonator | Inq. | 1 | ||
| Z8ScrFEInN37159 | FEEDMAT | Inq. | Screw Driver | Inq. | 1 | ||
| Z9FreNiNFN36113 | Nihon Freezer | NF-140S | Freezer | Inq. | 1 | ||
| Z9ManTAGBN35231 | TAIKA | GBR-10 | Mantle Heater | 2008 | 1 |
