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中古装置情報

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INDEX
売却装置情報
半導体装置
(前工程) 印刷用
Photolitho
Etch,Ash
Diff,T/F,Impla
Wafer Clean
計測,分析
Others

半導体装置
(後工程) 印刷用
B/G, Dicing
Bonding
Others

半導体装置
(テスト) 印刷用
Tester
Prober
Handler
Others
表面実装
液晶・その他

買取装置情報 印刷用
半導体装置
液晶・その他

Bidding
TTC RAS
Parts

FOR SALE TOOLS --- Semiconductor Fabrication
  • Lithography, Photoresist, Dry Etching
  • Diffusion/Oxidation/Thermal(RTP/RTA,Traditional Furnace),CVD , PVD(Sputter), Evaporation
  • Wet Process(Cleaning, Wet etching)
  • Ion Implantation, CMP, Reticle/Photomask, Clean Roometc...

Wafer Fab: Photolitho
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20081004f2N008TELMARK 8(8")PIQ developInq.1TTC半導体中古装置_2008
20081004f2N007TELMARK 8(8")DeveloperInq.1TTC半導体中古装置_2008
20081004f2N006TELMARK 8(8")DeveloperInq.1TTC半導体中古装置_2008
20080926f4T004CanonFPA-3000iWStepper19961TTC中古装置_20080916f1A002
20080605f2E05NIKONS308FScanner (W/F=200mm)Inq.1半導体装置情報問合せ
20080605f2E06NIKONSF-1004X SF Stepper (W/F=200mm)Inq.1半導体装置情報問合せ
20080605f2E07NIKONSF-100Stepper (W/F=200mm)Inq.1半導体装置情報問合せ
20080605f2E08TELAct-8Track,Coat/Develop (W/F=200mm)Inq.1半導体装置情報問合せ
20080605f2E09CanonAS4Arf Scanner (W/F=200mm)Inq.1半導体装置情報問合せ
20080605f2E10JEOLJBX-3030MVElectron Beam Lithography (W/F=200mm)Inq.1半導体装置情報問合せ


Wafer Fab: Etch/Ash
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20081028f1N001FSIEXCALIBUR(8")Vapor HF etcher-SingleInq.1TTC半導体中古装置_2008
20081008f1N001AMATCentura DPSD/Etch,Metal19981TTC半導体中古装置_2008
20081004f2N005HITACHIUA-5200A(8")Ozone AsherInq.1TTC半導体中古装置_2008
20081004f2N004HITACHIUA-5200A(8")Ozone AsherInq.1TTC半導体中古装置_2008
20080903f1J004HITACHIU-722(12")Dry Etch, Oxide20021半導体装置情報問合せ
20080903f1J003HITACHIU-722(12")Dry Etch, Oxide20041半導体装置情報問合せ
20080903f1J002HITACHIU-722(12")Dry Etch, Oxide20031半導体装置情報問合せ
20080903f1J001HITACHIU-722(12")Dry Etch, Oxide20051半導体装置情報問合せ
20080826f1O0043MJS3000-4609-6(8")Insulator support etcher20051半導体装置情報問合せ
20080825f1O005HITACHIM-511A(8")Dry Etch, Si20051半導体装置情報問合せ
20080801f9L02ULVACRH-200Dry Etching System19901半導体装置情報問合せ
20080613f1Y05CanonGIR-261R Dry Etch(GIR-3) 1998 1 半導体装置情報問合せ
20080613f1Y04ALCATELAMS-200 Deep RIE(D-RIE) 2005 1 半導体装置情報問合せ
20080507f6Y01ALCATELMS200
I-Productivity
Deep RIE20051半導体装置情報問合せ


Wafer Fab: Diff, T/F, Implant
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20081120f1N005TELAlpha-808SC(8")LPCVD,D-Poly新着中古装置情報_New_Release_200819961TTC半導体中古装置_2008
20081120f1N004TELAlpha-8S-Z(8")LPCVD,ND Poly新着中古装置情報_New_Release_200819971TTC半導体中古装置_2008
20081120f1N003TELAlpha-8S-Z(8")LPCVD,TEOS新着中古装置情報_New_Release_200819982TTC半導体中古装置_2008
20081120f1N002TELAlpha-8S-Z(8")LPCVD,TEOS新着中古装置情報_New_Release_200819971TTC半導体中古装置_2008
20081120f1N001TELAlpha-808SC(8")LPCVD,TEOS新着中古装置情報_New_Release_200819963TTC半導体中古装置_2008
20081030f2N014MattsonAtmosRTA Tool新着中古装置情報_New_Release_2008Inq.1TTC半導体中古装置_2008
20081030f2N013MattsonAST3000RTA Tool新着中古装置情報_New_Release_2008Inq.3TTC半導体中古装置_2008
20081030f2N012MattsonHeliosRTA Tool新着中古装置情報_New_Release_2008Inq.7TTC半導体中古装置_2008
20081030f2N011AMATHTF CenturaH/Temp, T/Film Dep.新着中古装置情報_New_Release_2008Inq.2TTC半導体中古装置_2008
20081030f2N010AvizaCelsiorALD(T/Film Dep)新着中古装置情報_New_Release_2008Inq.2TTC半導体中古装置_2008
20081004f2N010VARIANVISta80HP(8")H/C ImplanterInq.1TTC半導体中古装置_2008
20081030f2N009AxcelisImaxImplant, H/Curr.新着中古装置情報_New_Release_2008Inq.1TTC半導体中古装置_2008
20081030f2N008AxcelisOHDImplant, H/Curr.新着中古装置情報_New_Release_2008Inq.1TTC半導体中古装置_2008
20081030f2N007AxcelisHC3Implant, H/Curr.新着中古装置情報_New_Release_2008Inq.1TTC半導体中古装置_2008
20081030f2N006VarianVIISta HCPImplant, H/Curr.新着中古装置情報_New_Release_2008Inq.1TTC半導体中古装置_2008
20080916f1A002EEJAInq.CUP-PLATER semi-auto type1995
?
1TTC中古装置_20080916f1A002
20080903f1J014Canon AnelvaI-2300SRE(12")Surface Reaction Epitaxy 20021半導体装置情報問合せ
20080903f1J013TELTrias(12")CVD, Ta2O520041半導体装置情報問合せ
20080903f1J012TELTrias(12")CVD, Ta2O520041半導体装置情報問合せ
20080903f1J011TELTrias(12")CVD, Ta2O520031半導体装置情報問合せ
20080903f1J010TorrexFlexstar(12")LPCVD, As-poly20031半導体装置情報問合せ
20080903f1J009ASMA412(12")LPCVD, SiN20021半導体装置情報問合せ
20080903f1J008TELAlpha-303i(12")Furnace, PH3 Anl.20021半導体装置情報問合せ
20080903f1J007TELAlpha-303i(12")Furnace, PH3 Anl.20021半導体装置情報問合せ
20080903f1J006TELAlpha-303i(12") Furnace, Sinter20041半導体装置情報問合せ
20080903f1J005AMATRadiance(12")RTP, SiN20051半導体装置情報問合せ
20080825f1O002ANELVAI-1052(8")Sputter19891半導体装置情報問合せ
20080801p2L01ULVACMLH-2308RE(5")Sputter19881半導体装置情報問合せ
20080801f9L06Shinko Seiki Inq.Plasma reflow system 20061半導体装置情報問合せ
20080801f9L05EBARAUFP-200/300Bump plating machine20051半導体装置情報問合せ
20080801f9L04EBARAUFP-200/300Plating machine -low temperature-20061半導体装置情報問合せ
20080801f9L03EEJACP2001-02-0059CUP-PLATER semi-auto type20011半導体装置情報問合せ
20080711f2L03ULVACMLH-2308RESputter(5")19881


Wafer Fab: Wafer Cleaning
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20081004f2N009FSIFS-820L(8")Wet BenchInq.1TTC半導体中古装置_2008
20080929f1D005DNSFC-821L(8")Cleaning tool20011
20080711f4L02Chemical Art
Technology
Inq.Draft Chamber(8")19951
20080711f4L01PuretronMM-1-W-SC-AOzone water systems(8")19951
20080702f2H04DNSFL-820LClean Tool19971
20080605f2E13DNSFS-820LWet Bench (Clean Tool) (W/F=200mm)Inq.1


FOR SALE TOOLS --- Semiconductor Metrology / Inspection/Other
  • Analysis Tools
  • Microscope
  • Measurement Tool, etc.
Wafer Fab: Metrology
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20081119f2N004Negevtech3100Redefined Wafer Inspection新着中古装置情報_New_Release_2008Inq.1TTC半導体中古装置_2008
20081117f2T047SHIMADZUPARC2408Wafer Particle Characterizer 新着中古装置情報_New_Release_200819991TTC半導体中古装置_2008
20081104f1A005THERMONICST-2420BVTemperature Forcing System新着中古装置情報_New_Release_200820001TTC半導体中古装置_2008
20081104f1A004JEOLJSM-6301FSEM新着中古装置情報_New_Release_200819981TTC半導体中古装置_2008
20081104f1A003EV GroupEVG40Microscope(Dual side)新着中古装置情報_New_Release_200820051TTC半導体中古装置_2008
20081104f1A002RigakuZSX100eX-ray fluorescence analyzer新着中古装置情報_New_Release_200820001TTC半導体中古装置_2008
20081104f1A001TOPCONWM3-2Surface Inspection19981TTC半導体中古装置_2008
20081020f1K001RigakuFXA3620(8") Wafer Surface Insp.19921TTC半導体中古装置_2008
20081004f2N003NIKON0PT-3A(8")MicroscopeInq.1TTC半導体中古装置_2008
20081004f2N002HITACHIS-8820(8")CDSEMInq.1TTC半導体中古装置_2008
20080929f1D011HORIBADEGILEM 550Film Thick Meas.20041TTC中古装置情報問合せ
20080929f1D010SONYILS-10Wafer Surface Insp.20001TTC中古装置情報問合せ
20080929f1D009HITACHIS-4160FE-SEM19941TTC中古装置情報問合せ
20080925f4K012HITACHIIS-2500Wafer Inspection SystemInq.1TTC中古装置_20080916f1A002
20080912f1D001SIISEA-5220XRF Analyzer19961
20080903f1J015KLA-Tencorev300(12")Review SEMInq.1
20080902f1D001HITACHIS-4160FE-SEM19941
20080826f1O003HITACHIS-3600N(8")SEM20051
20080826f1O002HITACHI
Kenki
Finetech
FS300i(8")Scanning Accoustic Tomograph20051
20080801f9L01VeecoWyko NT1100(8")Measurement System20051
20080801f2L06HORIBADEGILEM 550Film Thick Meas.20041
20080801f2L05SONYILS-10Wafer Surface Insp.20001
20081001a2C031ICOSCI-9250Macro Inspection20041
20080613f1Y03EV Group EVG40 Microscope(Dual side) 2005 1
20080613f1Y02Rigaku ZSX100e X-ray Fluorescence Spectrometer 2000 1
20080613f1Y01TOPCON WM3-2 Surface Inspection 1998 1
20080605f2E15HITACHIS-8820CD SEM (W/F=200mm)Inq.1
20080605f2E16AMATSEM vision CXINSPECT SEM (W/F=200mm)Inq.1
20080605f2E17AMATSEM vision CXINSPECT SEM (W/F=200mm)Inq.1
20080605f2E18AMATSEM vision CXINSPECT SEM (W/F=200mm)Inq.1
20080605f2E19NIKONOPT-3AMicroscope (W/F=200mm)Inq.1
20080605f2E20LEICAINS2000Review Station (W/F=200mm)Inq.1


Wafer Fab: Others
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20081119c1E003BECKERVT4.40Vac Pump新着中古装置情報_New_Release_2008Inq.16TTC半導体中古装置_2008
20081119c1E002BUSCHSV1040 C000 10XXVac Pump新着中古装置情報_New_Release_2008Inq.1TTC半導体中古装置_2008
20081119c1E001ULVACDSB-601Vac Pump新着中古装置情報_New_Release_2008Inq.2TTC半導体中古装置_2008
20081118f1N001Ipec WestechAVANTI 472(6")CMP (Polisher)新着中古装置情報_New_Release_20081995
1996
2TTC半導体中古装置_2008
20081002c2A025Tokyo RikaCA-3300Chiller19963TTC半導体中古装置_2008
20081002c2A024Tokyo RikaCA-3300Chiller19985TTC半導体中古装置_2008
20081002c2A023Tokyo RikaCA-3300Chiller19991TTC半導体中古装置_2008
20081002c2A022Tokyo RikaCA-3300Chiller20001TTC半導体中古装置_2008
20081004f2N011JEOLJBX-3030MV(8")EB LithographyInq.1TTC半導体中古装置_2008
20081002a2A010Fuji AdvanceInq.Spin Dryer19861TTC半導体中古装置_2008
20081002a2A009YamatoBE-200Immersion Cooler19771TTC半導体中古装置_2008
20081002a2A008FoxboroInq.Resistivity Check19731TTC半導体中古装置_2008
20080929f1D007Dan-TakumaSCHQR2504BS-TSDrying Chamber 19961TTC中古装置情報問合せ
20080929f1D006Dan-TakumaSCH-1802C-RS-MReticle Stocker19901TTC中古装置情報問合せ
20080929f1D005SHOWA DENKOHAD30"AL-RIE adsorption cylinder box"19961TTC中古装置情報問合せ
20080929f1D004AIR TECHAML-1500SDraft Chamber Inq.1TTC中古装置情報問合せ
20080929f1D003AIR TECHAHO-100-56MClean air ovenInq.1TTC中古装置情報問合せ
20080929f1D002EBARAET1600WSTurbo Molecular Pump20062TTC中古装置情報問合せ
20080827f1L002Litel
Instruments
Litel ReticleInterferometer20001
20080929f1D002EBARAET1600WSTurbo Molecular Pump20062
20080826f1O007Chuo RikenCT-50UDP
(2 Bath)
(8")Clean Oven20051
20080825f1O004DNSAS2000(8")Post CMP Clean20051
20080825f1O003TSKChaMP-232(8")CMP, Cu20051
20080801f9L10Chamical ArtInq.draft chamber19951
20080801f9L09PuretronMM-1-W-SC-Aozone water systems 19951
20080801f9L08HITACHIPCV-843BNClean bench19911
20080801f9L07Air TechACB-521CFSClean both19911
20080929f1D006Dan-TakumaSCH-1802C-RS-MReticle Stocker19901
20080711f3L02HITACHIPCV-843BNClean Bench19913
20080711f3L01Air TechACB-521FSClean Booth19911
20080613f1Y12 Inq. LZ-2100GFW12 Leak Test Inq. 1
20080613f1Y11 Fukuda MS-5085 Leak Test 2004 1
20080613f1Y10 Fukuda MS-5085 Leak Test 2004 1
20080613f1Y09 Fukuda MS-5085 Leak Test 2004 1
20080613f1Y08 Cosmo LZ-2100G-
03FW89
Leak Test Inq. 1
20080613f1Y07 Cosmo LZ-2100G-
03FW89
Leak Test Inq. 1
20080613f1Y06 Inq. NR030-2945 Peeling Tool 2004 1


FOR SALE TOOLS --- Semiconductor Assembly
  • Grinding
  • Die/Wire Bonding
  • Molding/Packaging
  • SMT Related, etc...
ASSY: B/G, Dicing
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20081113a2T012DiscoDFG840(8")Dicer新着中古装置情報_New_Release_200819961TTC半導体中古装置_2008
20081002a2A006KAIJO1200-28FDicing Frame Clean19991TTC半導体中古装置_2008
20081002a2A005Nomura MicroNB-IIICO2 Bubbler19961TTC半導体中古装置_2008
20081002a2A004Nomura MicroNB-IICO2 Bubbler19961TTC半導体中古装置_2008
20081002a2A003EyegraphicsECS-301(5")UV Cure19921TTC半導体中古装置_2008
20081002a2A002TakatoriATM-8100(5")Wafer Mounter19961TTC半導体中古装置_2008
20080904a1L003DiscoDFD6361Dicing Saw,Fully AutomaticInq.1
20080904a1L002DiscoDFD6361Dicing Saw,Fully Automatic20061
20080904a1L001DiscoDFD6361Dicing Saw,Fully Automatic20061
20080825f1O001EMTECCVP-220(8")W/F Beveling20051
20080801a6L01SHINKAWASBB-310Bump bonder20011
20080616f2B19OkamotoVG201Automatic Grinding Tool (WF=150mm)20021
20080602a2B02OPTO Sys.OSH-80TPSCRIBER20011
20080602a2B01OPTO Sys.OSH-90TPBREAKER20011


ASSY: (Die/Wire)Bonder
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20081106a3E045ASMAD809Die Bonder新着中古装置情報_New_Release_200819781TTC半導体中古装置_2008
20081106a3E044ASMAD809Die Bonder新着中古装置情報_New_Release_200819883TTC半導体中古装置_2008
20081106a3E043ASMAD809Die Bonder新着中古装置情報_New_Release_200819863TTC半導体中古装置_2008
20081106a3E042ASMAD809Die Bonder新着中古装置情報_New_Release_200819841TTC半導体中古装置_2008
20081106a3E041ASMAD809Die Bonder新着中古装置情報_New_Release_200819821TTC半導体中古装置_2008
20081106a3E040DiscoDSM060Wafer Mount新着中古装置情報_New_Release_200819841TTC半導体中古装置_2008
20081106a3E039Lonh HillLH-830Wafer Mount新着中古装置情報_New_Release_200819881TTC半導体中古装置_2008
20081104a1A012PanasonicDM-60M-HDie Bonder新着中古装置情報_New_Release_200819981TTC半導体中古装置_2008
20081104a1A011PanasonicDM-60M-HDie Bonder新着中古装置情報_New_Release_200819991TTC半導体中古装置_2008
20081104a1A010PanasonicDM-60MDie Bonder新着中古装置情報_New_Release_200820001TTC半導体中古装置_2008
20081104a1A009PanasonicDM-60MDie Bonder新着中古装置情報_New_Release_200820001TTC半導体中古装置_2008
20081030a3E015K&S1488 TurboWire Bonder新着中古装置情報_New_Release_2008Inq.10TTC半導体中古装置_2008
20081021a2D002ShinkawaUTC-400BIWire Bonder, Gold新着中古装置情報_New_Release_200820042TTC半導体中古装置_2008
20081021a1D001ShinkawaUTC-400BIWire Bonder, Gold20034TTC半導体中古装置_2008
20081006a1E001K&S8060Wire BonderInq.1TTC半導体中古装置_2008
20081004a1T001K&S8060Wire Bonder (Automatic Wedge Bonder)19982TTC半導体中古装置_2008
20081002a2A012ShinkawaUTC-380BIWire Bonder20003TTC半導体中古装置_2008
20081002a2A011ShinkawaUTC-380BIWire Bonder20012TTC半導体中古装置_2008
20081002a2A007Canon MachineryInq.(5")Die Bonder20001TTC半導体中古装置_2008
20080926a3I003KAIJOFB-131Wire Bonder 19981TTC中古装置_20080916f1A002
20080922a3L030SHINKAWASBB-410STUD BUMP BONDER20031TTC中古装置_20080916f1A002
20080922a3L030SHINKAWASBB-410STUD BUMP BONDER20031中古半導体装置 20080922a3L030
20080910a2E007ASM PacificAD819-12Die Bonder20021
20080905a1E008K&S 1488 TourboWire bonderInq.1
20080905a1E007K&S 1488 Tubo-LWire bonderInq.2
20080905a1E006ESEC 3006 F/XXWire bonderInq.1
20080905a1E005Panasonic HW26U-B Wire bonderInq.1
20080822a5O023Westbond7327ADie Bonder19991
20080822a5O022Westbond7327C-79Die Bonder20011
20080822a5O021Westbond7327C-79Die Bonder20011
20080710a2W02K&S1488 TurboWire BonderInq.1
20080710a2W01K&S1488 TurboWire BonderInq.1
20080613a2Y10 Panasonic DM-60M-H Die Bonder 1998 1
20080613a2Y09 Panasonic DM-60M-H Die Bonder 1999 1
20080613a2Y08 Panasonic DM-60M Die Bonder 2000 1
20080613a2Y07 Panasonic DM-60M Die Bonder 2000 1
20080603a1N01HITACHIWB-500AWire Bonder 19989
20080603a1N02KAIJOFB-128Wire Bonder 199716
20080603a1N03KAIJOFB-131Wire Bonder 199769
20080602a1B60ShinkawaUTC-50Wire Bonder19881
20080602a1B59ShinkawaUTC-50Wire Bonder19881
20080602a1B58ShinkawaUTC-50Wire Bonder19881
20080602a1B57ShinkawaUTC-50Wire Bonder19881
20080602a1B56ShinkawaUTC-50Wire Bonder19881
20080602a1B55ShinkawaUTC-50Wire Bonder19881
20080602a1B54ShinkawaUTC-50Wire Bonder19881
20080602a1B53ShinkawaUTC-50Wire Bonder19881
20080602a1B52ShinkawaUTC-50Wire Bonder19881
20080602a1B51ShinkawaUTC-50Wire Bonder19881
20080602a1B50ShinkawaUTC-50Wire Bonder19881
20080602a1B49ShinkawaUTC-50Wire Bonder19881
20080602a1B48ShinkawaUTC-50Wire Bonder19881
20080602a1B47ShinkawaUTC-50Wire Bonder19881
20080602a1B46ShinkawaUTC-50Wire Bonder19881
20080602a1B45ShinkawaUTC-50Wire Bonder19881
20080602a1B44ShinkawaUTC-50Wire Bonder19881
20080602a1B43ShinkawaUTC-50Wire Bonder19881
20080602a1B42ShinkawaUTC-200Wire Bonder19951
20080602a1B41ShinkawaUTC-200Wire Bonder19951
20080602a1B40ShinkawaUTC-200Wire Bonder19951
20080602a1B39ShinkawaUTC-200Wire Bonder19951
20080602a1B38ShinkawaUTC-200Wire Bonder19951
20080602a1B37ShinkawaUTC-200Wire Bonder19951
20080602a1B36ShinkawaUTC-200Wire Bonder19951
20080602a1B35ShinkawaUTC-200Wire Bonder19951
20080602a1B34ShinkawaUTC-200Wire Bonder19951
20080602a1B33ShinkawaUTC-200Wire Bonder19951
20080602a1B32ShinkawaUTC-100Wire Bonder19931
20080602a1B31ShinkawaUTC-100Wire Bonder19931
20080602a1B30ShinkawaUTC-100Wire Bonder19931
20080602a1B29ShinkawaUTC-100Wire Bonder19931
20080602a1B28ShinkawaUTC-100Wire Bonder19931
20080602a1B27ShinkawaUTC-100Wire Bonder19931
20080602a1B26ShinkawaUTC-100Wire Bonder19931
20080602a1B25ShinkawaUTC-100Wire Bonder19931
20080602a1B24ShinkawaUTC-100Wire Bonder19931
20080602a1B23ShinkawaUTC-100Wire Bonder19931
20080602a1B22ShinkawaUTC-100Wire Bonder19931
20080602a1B21SONICSURB-412Wire Bonder19961
20080602a1B20SONICSURB-412Wire Bonder19961
20080602a1B19SONICSURB-412Wire Bonder19961
20080602a1B18SONICSURB-412Wire Bonder19961
20080602a1B17SONICSURB-412Wire Bonder19961
20080602a1B16SONICSURB-412Wire Bonder19961
20080602a1B15KAIJOFB118AWire Bonder19931
20080602a1B14KAIJOFB118AWire Bonder19931
20080602a1B13KAIJOFB118AWire Bonder19931
20080602a1B12KAIJOFB118AWire Bonder19931
20080602a1B11KAIJOFB118AWire Bonder19931
20080602a1B10KAIJOFB118AWire Bonder19931
20080602a1B09KAIJOFB118AWire Bonder19931
20080602a1B08KAIJOFB118AWire Bonder19931
20080602a1B07KAIJOFB118AWire Bonder19931
20080602a1B06KAIJOFB118AWire Bonder19931
20080602a1B05KAIJOFB118AWire Bonder19931
20080602a1B04KAIJOFB118AWire Bonder19931
20080602a1B03KAIJOFB118AWire Bonder19931
20080602a1B02KAIJOFB118AWire Bonder19931
20080602a1B01KAIJOFB118AWire Bonder19931
20080528a1W01ShinkawaILT-110Inner Lead BonderInq.1
20080317a1W01PanasonicDM60HDie Bonder19981


ASSY: Other
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20081106a4E051Branson5510Ultrosonic cleaner新着中古装置情報_New_Release_2008Inq.1TTC半導体中古装置_2008
20081106a4E050YamatoDKN400Concevtion oven新着中古装置情報_New_Release_2008Inq.6TTC半導体中古装置_2008
20081106a4E049VWR Scientific Inc.VWR1410Vacuum oven新着中古装置情報_New_Release_2008Inq.1TTC半導体中古装置_2008
20081106a4E048Lindberg/Blue MGO1310AConvection Oven新着中古装置情報_New_Release_2008Inq.1TTC半導体中古装置_2008
20081106a4E047ENRPR-602WPad Printer新着中古装置情報_New_Release_200819891TTC半導体中古装置_2008
20081106a4E046ENRPR-602WPad Printer新着中古装置情報_New_Release_200819883TTC半導体中古装置_2008
20081106a3E036GplineGUC-184MUV Dryer新着中古装置情報_New_Release_200820032TTC半導体中古装置_2008
20081106a3E035MBKTR-1500SXWafer Sorter新着中古装置情報_New_Release_200820011TTC半導体中古装置_2008
20081106a3E034MITTTR80Tape & Reel新着中古装置情報_New_Release_2008Inq.1TTC半導体中古装置_2008
20081106a3E033STILM-6023Laser Marker新着中古装置情報_New_Release_2008Inq.1TTC半導体中古装置_2008
20081106a3E032GSView880-200Scannning Tool新着中古装置情報_New_Release_200819983TTC半導体中古装置_2008
20081104a1A008SUNXLP-F10FIBER LASER MARKER新着中古装置情報_New_Release_200820041TTC半導体中古装置_2008
20081104a1A007Inq.NR030-2945Peeling Tool新着中古装置情報_New_Release_200820041TTC半導体中古装置_2008
20081104a1A006DAGEMODEL 4000Wire bond pull tester新着中古装置情報_New_Release_200820001TTC半導体中古装置_2008
20081002a2A019MATSUOInq.Laser Marker20001TTC半導体中古装置_2008
20081002a2A018MATSUOInq.Laser Marker19951TTC半導体中古装置_2008
20081002a2A017NECInq.L/Mark Handler20012TTC半導体中古装置_2008
20081002a2A016MIYACHIML-2050ALaser Spot Welder20022TTC半導体中古装置_2008
20081002a2A015NEC?CAMS-1Mold Press20011TTC半導体中古装置_2008
20081002a2A014Apic YamadaMS-7050FMold Press19971TTC半導体中古装置_2008
20081002a2A013NECSL-432G2Laser Trimer19971TTC半導体中古装置_2008
20081001a2C031ICOSCI-9250Macro Inspection20041TTC中古装置情報問合せ
20080926a1L001ICOSCI-9250COMPONENT INSPECTION ToolInq.1TTC中古装置_20080916f1A002
20080916f1A003Yamato ScientificDT62OvenInq.1TTC中古装置_20080916f1A003
20080827c1L003FUJIIMPULSEFV-600-NG-10WVacuum and gas flush sealer20001
20080714a2W14SHINKAWASPA-210DIE ATTACHER20001
20080714a2W13SHINKAWASPA-200DIE ATTACHER20001
20080714a2W12SHINKAWASPA-210DIE ATTACHER20011
20080714a2W11SHINKAWASPA-210DIE ATTACHER20011
20080714a2W10SHINKAWASPA-210DIE ATTACHER20011
20080714a2W09OSUNG LST01021142110-1VACUUM CHAME20011
20080714a2W08OSUNG LSTOS4-120AVCCURE OVEN19991
20080714a2W07June TechJTS2000WMBT SORTER19981
20080714a2W06June TechJTS2000WMBT SORTER19971
20080714a2W05June TechJTS2000WMBT SORTER19981
20080714a2W04June TechJTS2000WMBT SORTER19971
20080714a2W03SECRONUTS-2001STACK-TACK20011
20080714a2W02GENERAL
SCANNING
LM6000MARKER19971
20080714a2W01GENERAL
SCANNING
LM6000MARKER19961
20080708a1E02A.E AdvancedMWM-850Wafer mountingInq.1
20080708a1E01KEYENCEML-9100Laser markInq.2
20080616a2B02DYNATEXGST-150Scribeer Breaker20021
20080613a2Y06 DAGE MODEL 14000 BUMP Share Tester 2000 1
20080603a1N05KIGIANT200 tonsMold Press199711
20080603a1N06GPDBGAmolding machine19981
20080603a1N07INQUPH 22000Wafer molding machine19981
20080603a1N08ASMInq.BGA margin cutter19981
20080603a1N09YF-02BGABGA washer19981
20080603a1N10KINEGYAFL-CH2-04SINQ199715
20080603a1N12DEMINSIZE 40-58mmpreheater19982
20080603a1N13DEMINSSOP48Lpreheater19981
20080603a1N14GTAZX-CO-106laser printer CO219981
20080603a1N16GPMSOJ42 SSOP48shaper19982
20080603a1N17YAMADASOJ 24/26auto shaper19971
20080603a1N18ASMSOJ 24/26shaper-219971
20080603a1N19EVER TECHFOR TRAY QFP
TSOP FP-550
lead scan19981
20080603a1N20EVER TECHSSOP-48/56Lsemi-auto lead scan19982
20080603a1N21EVER TECHSPJ 300/400MIL
SSR-300A
lead scan19981
20080603a1N22MotecBIBU100unloader19971
20080603a1N23MotecBIBL100loader19971
20080603a1N24MotecBIBL100unloader/loader19981
20080603a1N25MotecPPLU 100unloader/loader19981
20080603a1N26GTA
electronic
ZX-LU-101laser marker19971
20080603a1N27YAGInqlaser marker19971
20080603a1N28E&R
engineering
PR2000ink marker20001
20080603a1N29MISUZUBA-1100INQ19981
20080602a2B07OPTO Sys.LPAM7000V16-TChip Sorter20011
20080602a2B06ASMMS896Chip Sorter20011
20080602a2B05OPTO Sys.WPOH-105AS-TCHIP TEST20011
20080602a2B04JTJCS-6300Chip Sorter20011
20080602a2B03JTJCP-1000CHIP TEST20011
20080418a1P26MATSUOInq.Laser Marker20001
20080418a1P25MATSUOInq.Laser Marker19951
20080418a1P24NECInq.L/Mark Handler20012
20080418a1P23SUNXLP-F10Laser Marker20001
20080418a1P22MIYACHIML-2050ALaser Spot Welder20022
20080418a1P21MIYACHIML-2050ALaser Spot Welder20011
20080418a1P20NEC?CAMS-1Mold Press20011
20080418a1P19Apic YamadaMS-7050FMold Press19971
20080418a1P18NECSL-432G2Laser Trimer20002
20080418a1P17NECSL-432G2Laser Trimer19981
20080418a1P16NECSL-432G2Laser Trimer19973


FOR SALE TOOLS --- Semiconductor Test Systems
  • Test System
  • (Wafer) Prober
  • (Die) Handler, etc...
TEST: Tester
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20081106t1E024ShibasokuWL93aTester新着中古装置情報_New_Release_200819991TTC半導体中古装置_2008
20081106t1E023KVDInq.Tester, CMOS新着中古装置情報_New_Release_2008Inq.14TTC半導体中古装置_2008
20081106t1E022KVDInq.Tester, CMOS新着中古装置情報_New_Release_200820004TTC半導体中古装置_2008
20081106t1E021(LTX-)CredenceKalosTester, Memory新着中古装置情報_New_Release_2008Inq.5TTC半導体中古装置_2008
20081106t1E019VERIGY(Agilent)93000Tester新着中古装置情報_New_Release_200819931TTC半導体中古装置_2008
20081106t1E018VERIGY(Agilent)93000Tester新着中古装置情報_New_Release_200819941TTC半導体中古装置_2008
20081104t2E017TERADYNEFLEX-RFTester新着中古装置情報_New_Release_2008Inq.5TTC半導体中古装置_2008
20081023t2E003VERIGY(Agilent)Versa 3304TesterInq.4TTC半導体中古装置_2008
20081017t2L004ASIAT7164JTester?199715TTC半導体中古装置_2008
20081017t2L003ADVANTESTT3335PTester,Memory19923TTC半導体中古装置_2008
20081017t2L002ADVANTESTT5371Tester,Memory20002TTC半導体中古装置_2008
20081015t1E003ANDO AL-6082Tester,MemoryInq.1TTC半導体中古装置_2008
20081015t1E002ADVANTESTT5362Tester,MemoryInq.2TTC半導体中古装置_2008
20081015t1E001ADVANTESTT5363Tester,MemoryInq.3TTC半導体中古装置_2008
20081010t1L001LTX-CredenceLTX-77Tester19851TTC半導体中古装置_2008
20081006t2L003ADVANTESTT5581PTester20032TTC半導体中古装置_2008
20081001t3C032TERADYNECatalystTest System, Mixed-signal/SOC digital Inq.1TTC中古装置情報問合せ
20080929t1L014ADVANTESTT6672Tester/Logic20002TTC中古装置情報問合せ
20080929t1L013YOKOGAWATS6000Tester20006TTC中古装置情報問合せ
2008092421L004ADVANTESTT6575PDP Driver Test System20031TTC中古装置_20080916f1A002
2008092421L002ADVANTESTT6271PDP Driver Test System20051TTC中古装置_20080916f1A002
2008092421L003ADVANTESTT3347Tester, Logic/Analog19983TTC中古装置_20080916f1A002
20080922t3L026ADVANTESTT5371Tester, Memory20011TTC中古装置_20080916f1A002
20080926t2L002TSKUF200SAAutomatic Wafer Prober20041TTC中古装置_20080916f1A002
2008092421L008TSKUF200Automatic Wafer Prober20001TTC中古装置_20080916f1A002
2008092421L007TSKUF200Automatic Wafer Prober19991TTC中古装置_20080916f1A002
2008092421L006TSKUF200Automatic Wafer Prober19962TTC中古装置_20080916f1A002
2008092421L005TSKUF200Automatic Wafer Prober19981TTC中古装置_20080916f1A002
20080924t1L001Opto SystemWPFR4200Semi Automatic Backside Prober for LED2008?1TTC中古装置_20080916f1A002
20080922t3L026ADVANTESTT5371Tester, Memory20011中古半導体装置 20080922t3L026
20080918t2E002ADVANTESTT5593Tester, Memory20051TTC中古装置_20080918t2E002
20080917t3L005TERADYNEIP750Tester, Image Sensor20031TTC中古装置_20080917t3L005
20080917t1B001ShibasokuS230Tester, PDP Driver ICs (Data, Scan)20052TTC中古装置_20080917t1B001
20080908t1L004ADVANTESTT6573Tester/SoC20041
20080905t3L017ADVANTESTT6672Tester/Logic20002
20080905t3L016YOKOGAWATS6000Tester20006
20080822t4L020YOKOGAWATS6700Tester20001
20080821t2L005YOKOGAWAST6730Test System, FPD Driver 20061
20080801t7L01YOKOGAWATS6000Tester20007
20080801t4L02YOKOGAWATS6000Tester20007
20080801t4L01YOKOGAWATS6000Tester20004
20080801t0L03ADVANTESTT5335PTester19981
20080801t0L02ADVANTESTT5335PTester19981
20080801t0L01ADVANTESTT5335PTester19971
20080714t1W08ADVANTESTT5365Tester/Memory19941
20080714t1W07ADVANTESTT5365Tester/Memory19951
20080714t1W06ADVANTESTT5365Tester/Memory19961
20080714t1W05ADVANTESTT5365Tester/Memory19951
20080714t1W04ADVANTESTT5365ATester/Memory19961
20080714t1W03ADVANTESTT5365ATester/Memory19961
20080714t1W02ADVANTESTT5365Tester/Memory19961
20080714t1W01ADVANTESTT5365Tester/Memory19941
20080711t2L01YOKOGAWATS6000Tester20004
20080711t1L01ADVANTESTT5581Tester/Memory19961
20080707t2E15AdvantestT3347TesterInq.1
20080707t2E14AdvantestT6673TesterInq.1
20080707t2E13VERIGY83000TesterInq.7
20080707t2E12LTXTrilliumTesterInq.3
20080707t2E11LTXDELTA-STETester