|
|
| FOR SALE TOOLS --- Semiconductor Fabrication |
- Lithography, Photoresist, Dry Etching
- Diffusion/Oxidation/Thermal(RTP/RTA,Traditional Furnace),CVD , PVD(Sputter), Evaporation
- Wet Process(Cleaning, Wet etching)
- Ion Implantation, CMP, Reticle/Photomask, Clean Roometc...
|
Wafer Fab: Photolitho
| TTC ID |
MAKER |
MODEL |
DESCRIPTION |
VIN. |
QTY |
INQ. |
| 20081004f2N008 | TEL | MARK 8 | (8")PIQ develop | Inq. | 1 |  |
| 20081004f2N007 | TEL | MARK 8 | (8")Developer | Inq. | 1 |  |
| 20081004f2N006 | TEL | MARK 8 | (8")Developer | Inq. | 1 |  |
| 20080926f4T004 | Canon | FPA-3000iW | Stepper | 1996 | 1 |  |
| 20080605f2E05 | NIKON | S308F | Scanner (W/F=200mm) | Inq. | 1 |  |
| 20080605f2E06 | NIKON | SF-100 | 4X SF Stepper (W/F=200mm) | Inq. | 1 |  |
| 20080605f2E07 | NIKON | SF-100 | Stepper (W/F=200mm) | Inq. | 1 |  |
| 20080605f2E08 | TEL | Act-8 | Track,Coat/Develop (W/F=200mm) | Inq. | 1 |  |
| 20080605f2E09 | Canon | AS4 | Arf Scanner (W/F=200mm) | Inq. | 1 |  |
| 20080605f2E10 | JEOL | JBX-3030MV | Electron Beam Lithography (W/F=200mm) | Inq. | 1 |  |
Wafer Fab: Etch/Ash
| TTC ID |
MAKER |
MODEL |
DESCRIPTION |
VIN. |
QTY |
INQ. |
| 20081028f1N001 | FSI | EXCALIBUR | (8")Vapor HF etcher-Single | Inq. | 1 |  |
| 20081008f1N001 | AMAT | Centura DPS | D/Etch,Metal | 1998 | 1 |  |
| 20081004f2N005 | HITACHI | UA-5200A | (8")Ozone Asher | Inq. | 1 |  |
| 20081004f2N004 | HITACHI | UA-5200A | (8")Ozone Asher | Inq. | 1 |  |
| 20080903f1J004 | HITACHI | U-722 | (12")Dry Etch, Oxide | 2002 | 1 |  |
| 20080903f1J003 | HITACHI | U-722 | (12")Dry Etch, Oxide | 2004 | 1 |  |
| 20080903f1J002 | HITACHI | U-722 | (12")Dry Etch, Oxide | 2003 | 1 |  |
| 20080903f1J001 | HITACHI | U-722 | (12")Dry Etch, Oxide | 2005 | 1 |  |
| 20080826f1O004 | 3M | JS3000-4609-6 | (8")Insulator support etcher | 2005 | 1 |  |
| 20080825f1O005 | HITACHI | M-511A | (8")Dry Etch, Si | 2005 | 1 |  |
| 20080801f9L02 | ULVAC | RH-200 | Dry Etching System | 1990 | 1 |  |
| 20080613f1Y05 | Canon | GIR-261R | Dry Etch(GIR-3) | 1998 | 1 |  |
| 20080613f1Y04 | ALCATEL | AMS-200 | Deep RIE(D-RIE) | 2005 | 1 |  |
| 20080507f6Y01 | ALCATEL | MS200 I-Productivity | Deep RIE | 2005 | 1 |  |
Wafer Fab: Diff, T/F, Implant
| TTC ID |
MAKER |
MODEL |
DESCRIPTION |
VIN. |
QTY |
INQ. |
| 20081120f1N005 | TEL | Alpha-808SC | (8")LPCVD,D-Poly | 1996 | 1 |  |
| 20081120f1N004 | TEL | Alpha-8S-Z | (8")LPCVD,ND Poly | 1997 | 1 |  |
| 20081120f1N003 | TEL | Alpha-8S-Z | (8")LPCVD,TEOS | 1998 | 2 |  |
| 20081120f1N002 | TEL | Alpha-8S-Z | (8")LPCVD,TEOS | 1997 | 1 |  |
| 20081120f1N001 | TEL | Alpha-808SC | (8")LPCVD,TEOS | 1996 | 3 |  |
| 20081030f2N014 | Mattson | Atmos | RTA Tool | Inq. | 1 |  |
| 20081030f2N013 | Mattson | AST3000 | RTA Tool | Inq. | 3 |  |
| 20081030f2N012 | Mattson | Helios | RTA Tool | Inq. | 7 |  |
| 20081030f2N011 | AMAT | HTF Centura | H/Temp, T/Film Dep. | Inq. | 2 |  |
| 20081030f2N010 | Aviza | Celsior | ALD(T/Film Dep) | Inq. | 2 |  |
| 20081004f2N010 | VARIAN | VISta80HP | (8")H/C Implanter | Inq. | 1 |  |
| 20081030f2N009 | Axcelis | Imax | Implant, H/Curr. | Inq. | 1 |  |
| 20081030f2N008 | Axcelis | OHD | Implant, H/Curr. | Inq. | 1 |  |
| 20081030f2N007 | Axcelis | HC3 | Implant, H/Curr. | Inq. | 1 |  |
| 20081030f2N006 | Varian | VIISta HCP | Implant, H/Curr. | Inq. | 1 |  |
| 20080916f1A002 | EEJA | Inq. | CUP-PLATER semi-auto type | 1995 ? | 1 |  |
| 20080903f1J014 | Canon Anelva | I-2300SRE | (12")Surface Reaction Epitaxy | 2002 | 1 |  |
| 20080903f1J013 | TEL | Trias | (12")CVD, Ta2O5 | 2004 | 1 |  |
| 20080903f1J012 | TEL | Trias | (12")CVD, Ta2O5 | 2004 | 1 |  |
| 20080903f1J011 | TEL | Trias | (12")CVD, Ta2O5 | 2003 | 1 |  |
| 20080903f1J010 | Torrex | Flexstar | (12")LPCVD, As-poly | 2003 | 1 |  |
| 20080903f1J009 | ASM | A412 | (12")LPCVD, SiN | 2002 | 1 |  |
| 20080903f1J008 | TEL | Alpha-303i | (12")Furnace, PH3 Anl. | 2002 | 1 |  |
| 20080903f1J007 | TEL | Alpha-303i | (12")Furnace, PH3 Anl. | 2002 | 1 |  |
| 20080903f1J006 | TEL | Alpha-303i | (12") Furnace, Sinter | 2004 | 1 |  |
| 20080903f1J005 | AMAT | Radiance | (12")RTP, SiN | 2005 | 1 |  |
| 20080825f1O002 | ANELVA | I-1052 | (8")Sputter | 1989 | 1 |  |
| 20080801p2L01 | ULVAC | MLH-2308RE | (5")Sputter | 1988 | 1 |  |
| 20080801f9L06 | Shinko Seiki | Inq. | Plasma reflow system | 2006 | 1 |  |
| 20080801f9L05 | EBARA | UFP-200/300 | Bump plating machine | 2005 | 1 |  |
| 20080801f9L04 | EBARA | UFP-200/300 | Plating machine -low temperature- | 2006 | 1 |  |
| 20080801f9L03 | EEJA | CP2001-02-0059 | CUP-PLATER semi-auto type | 2001 | 1 |  |
| 20080711f2L03 | ULVAC | MLH-2308RE | Sputter(5") | 1988 | 1 |  |
Wafer Fab: Wafer Cleaning
| TTC ID |
MAKER |
MODEL |
DESCRIPTION |
VIN. |
QTY |
INQ. |
| 20081004f2N009 | FSI | FS-820L | (8")Wet Bench | Inq. | 1 |  |
| 20080929f1D005 | DNS | FC-821L | (8")Cleaning tool | 2001 | 1 |  |
| 20080711f4L02 | Chemical Art Technology | Inq. | Draft Chamber(8") | 1995 | 1 |  |
| 20080711f4L01 | Puretron | MM-1-W-SC-A | Ozone water systems(8") | 1995 | 1 |  |
| 20080702f2H04 | DNS | FL-820L | Clean Tool | 1997 | 1 |  |
| 20080605f2E13 | DNS | FS-820L | Wet Bench (Clean Tool) (W/F=200mm) | Inq. | 1 |  |
| FOR SALE TOOLS --- Semiconductor Metrology / Inspection/Other |
- Analysis Tools
- Microscope
- Measurement Tool, etc.
|
Wafer Fab: Metrology
| TTC ID |
MAKER |
MODEL |
DESCRIPTION |
VIN. |
QTY |
INQ. |
| 20081119f2N004 | Negevtech | 3100 | Redefined Wafer Inspection | Inq. | 1 |  |
| 20081117f2T047 | SHIMADZU | PARC2408 | Wafer Particle Characterizer  | 1999 | 1 |  |
| 20081104f1A005 | THERMONICS | T-2420BV | Temperature Forcing System | 2000 | 1 |  |
| 20081104f1A004 | JEOL | JSM-6301F | SEM | 1998 | 1 |  |
| 20081104f1A003 | EV Group | EVG40 | Microscope(Dual side) | 2005 | 1 |  |
| 20081104f1A002 | Rigaku | ZSX100e | X-ray fluorescence analyzer | 2000 | 1 |  |
| 20081104f1A001 | TOPCON | WM3-2 | Surface Inspection | 1998 | 1 |  |
| 20081020f1K001 | Rigaku | FXA3620 | (8") Wafer Surface Insp. | 1992 | 1 |  |
| 20081004f2N003 | NIKON | 0PT-3A | (8")Microscope | Inq. | 1 |  |
| 20081004f2N002 | HITACHI | S-8820 | (8")CDSEM | Inq. | 1 |  |
| 20080929f1D011 | HORIBA | DEGILEM 550 | Film Thick Meas. | 2004 | 1 |  |
| 20080929f1D010 | SONY | ILS-10 | Wafer Surface Insp. | 2000 | 1 |  |
| 20080929f1D009 | HITACHI | S-4160 | FE-SEM | 1994 | 1 |  |
| 20080925f4K012 | HITACHI | IS-2500 | Wafer Inspection System | Inq. | 1 |  |
| 20080912f1D001 | SII | SEA-5220 | XRF Analyzer | 1996 | 1 |  |
| 20080903f1J015 | KLA-Tencor | ev300 | (12")Review SEM | Inq. | 1 |  |
| 20080902f1D001 | HITACHI | S-4160 | FE-SEM | 1994 | 1 |  |
| 20080826f1O003 | HITACHI | S-3600N | (8")SEM | 2005 | 1 |  |
| 20080826f1O002 | HITACHI Kenki Finetech | FS300i | (8")Scanning Accoustic Tomograph | 2005 | 1 |  |
| 20080801f9L01 | Veeco | Wyko NT1100 | (8")Measurement System | 2005 | 1 |  |
| 20080801f2L06 | HORIBA | DEGILEM 550 | Film Thick Meas. | 2004 | 1 |  |
| 20080801f2L05 | SONY | ILS-10 | Wafer Surface Insp. | 2000 | 1 |  |
| 20081001a2C031 | ICOS | CI-9250 | Macro Inspection | 2004 | 1 |  |
| 20080613f1Y03 | EV Group | EVG40 | Microscope(Dual side) | 2005 | 1 |  |
| 20080613f1Y02 | Rigaku | ZSX100e | X-ray Fluorescence Spectrometer | 2000 | 1 |  |
| 20080613f1Y01 | TOPCON | WM3-2 | Surface Inspection | 1998 | 1 |  |
| 20080605f2E15 | HITACHI | S-8820 | CD SEM (W/F=200mm) | Inq. | 1 |  |
| 20080605f2E16 | AMAT | SEM vision CX | INSPECT SEM (W/F=200mm) | Inq. | 1 |  |
| 20080605f2E17 | AMAT | SEM vision CX | INSPECT SEM (W/F=200mm) | Inq. | 1 |  |
| 20080605f2E18 | AMAT | SEM vision CX | INSPECT SEM (W/F=200mm) | Inq. | 1 |  |
| 20080605f2E19 | NIKON | OPT-3A | Microscope (W/F=200mm) | Inq. | 1 |  |
| 20080605f2E20 | LEICA | INS2000 | Review Station (W/F=200mm) | Inq. | 1 |  |
Wafer Fab: Others
| TTC ID |
MAKER |
MODEL |
DESCRIPTION |
VIN. |
QTY |
INQ. |
| 20081119c1E003 | BECKER | VT4.40 | Vac Pump | Inq. | 16 |  |
| 20081119c1E002 | BUSCH | SV1040 C000 10XX | Vac Pump | Inq. | 1 |  |
| 20081119c1E001 | ULVAC | DSB-601 | Vac Pump | Inq. | 2 |  |
| 20081118f1N001 | Ipec Westech | AVANTI 472 | (6")CMP (Polisher) | 1995 1996 | 2 |  |
| 20081002c2A025 | Tokyo Rika | CA-3300 | Chiller | 1996 | 3 |  |
| 20081002c2A024 | Tokyo Rika | CA-3300 | Chiller | 1998 | 5 |  |
| 20081002c2A023 | Tokyo Rika | CA-3300 | Chiller | 1999 | 1 |  |
| 20081002c2A022 | Tokyo Rika | CA-3300 | Chiller | 2000 | 1 |  |
| 20081004f2N011 | JEOL | JBX-3030MV | (8")EB Lithography | Inq. | 1 |  |
| 20081002a2A010 | Fuji Advance | Inq. | Spin Dryer | 1986 | 1 |  |
| 20081002a2A009 | Yamato | BE-200 | Immersion Cooler | 1977 | 1 |  |
| 20081002a2A008 | Foxboro | Inq. | Resistivity Check | 1973 | 1 |  |
| 20080929f1D007 | Dan-Takuma | SCHQR2504BS-TS | Drying Chamber | 1996 | 1 |  |
| 20080929f1D006 | Dan-Takuma | SCH-1802C-RS-M | Reticle Stocker | 1990 | 1 |  |
| 20080929f1D005 | SHOWA DENKO | HAD30 | "AL-RIE adsorption cylinder box" | 1996 | 1 |  |
| 20080929f1D004 | AIR TECH | AML-1500S | Draft Chamber | Inq. | 1 |  |
| 20080929f1D003 | AIR TECH | AHO-100-56M | Clean air oven | Inq. | 1 |  |
| 20080929f1D002 | EBARA | ET1600WS | Turbo Molecular Pump | 2006 | 2 |  |
| 20080827f1L002 | Litel Instruments | Litel Reticle | Interferometer | 2000 | 1 |  |
| 20080929f1D002 | EBARA | ET1600WS | Turbo Molecular Pump | 2006 | 2 |  |
| 20080826f1O007 | Chuo Riken | CT-50UDP (2 Bath) | (8")Clean Oven | 2005 | 1 |  |
| 20080825f1O004 | DNS | AS2000 | (8")Post CMP Clean | 2005 | 1 |  |
| 20080825f1O003 | TSK | ChaMP-232 | (8")CMP, Cu | 2005 | 1 |  |
| 20080801f9L10 | Chamical Art | Inq. | draft chamber | 1995 | 1 |  |
| 20080801f9L09 | Puretron | MM-1-W-SC-A | ozone water systems | 1995 | 1 |  |
| 20080801f9L08 | HITACHI | PCV-843BN | Clean bench | 1991 | 1 |  |
| 20080801f9L07 | Air Tech | ACB-521CFS | Clean both | 1991 | 1 |  |
| 20080929f1D006 | Dan-Takuma | SCH-1802C-RS-M | Reticle Stocker | 1990 | 1 |  |
| 20080711f3L02 | HITACHI | PCV-843BN | Clean Bench | 1991 | 3 |  |
| 20080711f3L01 | Air Tech | ACB-521FS | Clean Booth | 1991 | 1 |  |
| 20080613f1Y12 | Inq. | LZ-2100GFW12 | Leak Test | Inq. | 1 |  |
| 20080613f1Y11 | Fukuda | MS-5085 | Leak Test | 2004 | 1 |  |
| 20080613f1Y10 | Fukuda | MS-5085 | Leak Test | 2004 | 1 |  |
| 20080613f1Y09 | Fukuda | MS-5085 | Leak Test | 2004 | 1 |  |
| 20080613f1Y08 | Cosmo | LZ-2100G- 03FW89 | Leak Test | Inq. | 1 |  |
| 20080613f1Y07 | Cosmo | LZ-2100G- 03FW89 | Leak Test | Inq. | 1 |  |
| 20080613f1Y06 | Inq. | NR030-2945 | Peeling Tool | 2004 | 1 |  |
| FOR SALE TOOLS --- Semiconductor Assembly |
- Grinding
- Die/Wire Bonding
- Molding/Packaging
- SMT Related, etc...
|
ASSY: B/G, Dicing
| TTC ID |
MAKER |
MODEL |
DESCRIPTION |
VIN. |
QTY |
INQ. |
| 20081113a2T012 | Disco | DFG840 | (8")Dicer | 1996 | 1 |  |
| 20081002a2A006 | KAIJO | 1200-28F | Dicing Frame Clean | 1999 | 1 |  |
| 20081002a2A005 | Nomura Micro | NB-III | CO2 Bubbler | 1996 | 1 |  |
| 20081002a2A004 | Nomura Micro | NB-II | CO2 Bubbler | 1996 | 1 |  |
| 20081002a2A003 | Eyegraphics | ECS-301 | (5")UV Cure | 1992 | 1 |  |
| 20081002a2A002 | Takatori | ATM-8100 | (5")Wafer Mounter | 1996 | 1 |  |
| 20080904a1L003 | Disco | DFD6361 | Dicing Saw,Fully Automatic | Inq. | 1 |  |
| 20080904a1L002 | Disco | DFD6361 | Dicing Saw,Fully Automatic | 2006 | 1 |  |
| 20080904a1L001 | Disco | DFD6361 | Dicing Saw,Fully Automatic | 2006 | 1 |  |
| 20080825f1O001 | EMTEC | CVP-220 | (8")W/F Beveling | 2005 | 1 |  |
| 20080801a6L01 | SHINKAWA | SBB-310 | Bump bonder | 2001 | 1 |  |
| 20080616f2B19 | Okamoto | VG201 | Automatic Grinding Tool (WF=150mm) | 2002 | 1 |  |
| 20080602a2B02 | OPTO Sys. | OSH-80TP | SCRIBER | 2001 | 1 |  |
| 20080602a2B01 | OPTO Sys. | OSH-90TP | BREAKER | 2001 | 1 |  |
ASSY: (Die/Wire)Bonder
| TTC ID |
MAKER |
MODEL |
DESCRIPTION |
VIN. |
QTY |
INQ. |
| 20081106a3E045 | ASM | AD809 | Die Bonder | 1978 | 1 |  |
| 20081106a3E044 | ASM | AD809 | Die Bonder | 1988 | 3 |  |
| 20081106a3E043 | ASM | AD809 | Die Bonder | 1986 | 3 |  |
| 20081106a3E042 | ASM | AD809 | Die Bonder | 1984 | 1 |  |
| 20081106a3E041 | ASM | AD809 | Die Bonder | 1982 | 1 |  |
| 20081106a3E040 | Disco | DSM060 | Wafer Mount | 1984 | 1 |  |
| 20081106a3E039 | Lonh Hill | LH-830 | Wafer Mount | 1988 | 1 |  |
| 20081104a1A012 | Panasonic | DM-60M-H | Die Bonder | 1998 | 1 |  |
| 20081104a1A011 | Panasonic | DM-60M-H | Die Bonder | 1999 | 1 |  |
| 20081104a1A010 | Panasonic | DM-60M | Die Bonder | 2000 | 1 |  |
| 20081104a1A009 | Panasonic | DM-60M | Die Bonder | 2000 | 1 |  |
| 20081030a3E015 | K&S | 1488 Turbo | Wire Bonder | Inq. | 10 |  |
| 20081021a2D002 | Shinkawa | UTC-400BI | Wire Bonder, Gold | 2004 | 2 |  |
| 20081021a1D001 | Shinkawa | UTC-400BI | Wire Bonder, Gold | 2003 | 4 |  |
| 20081006a1E001 | K&S | 8060 | Wire Bonder | Inq. | 1 |  |
| 20081004a1T001 | K&S | 8060 | Wire Bonder (Automatic Wedge Bonder) | 1998 | 2 |  |
| 20081002a2A012 | Shinkawa | UTC-380BI | Wire Bonder | 2000 | 3 |  |
| 20081002a2A011 | Shinkawa | UTC-380BI | Wire Bonder | 2001 | 2 |  |
| 20081002a2A007 | Canon Machinery | Inq. | (5")Die Bonder | 2000 | 1 |  |
| 20080926a3I003 | KAIJO | FB-131 | Wire Bonder | 1998 | 1 |  |
| 20080922a3L030 | SHINKAWA | SBB-410 | STUD BUMP BONDER | 2003 | 1 |  |
| 20080922a3L030 | SHINKAWA | SBB-410 | STUD BUMP BONDER | 2003 | 1 |  |
| 20080910a2E007 | ASM Pacific | AD819-12 | Die Bonder | 2002 | 1 |  |
| 20080905a1E008 | K&S | 1488 Tourbo | Wire bonder | Inq. | 1 |  |
| 20080905a1E007 | K&S | 1488 Tubo-L | Wire bonder | Inq. | 2 |  |
| 20080905a1E006 | ESEC | 3006 F/XX | Wire bonder | Inq. | 1 |  |
| 20080905a1E005 | Panasonic | HW26U-B | Wire bonder | Inq. | 1 |  |
| 20080822a5O023 | Westbond | 7327A | Die Bonder | 1999 | 1 |  |
| 20080822a5O022 | Westbond | 7327C-79 | Die Bonder | 2001 | 1 |  |
| 20080822a5O021 | Westbond | 7327C-79 | Die Bonder | 2001 | 1 |  |
| 20080710a2W02 | K&S | 1488 Turbo | Wire Bonder | Inq. | 1 |  |
| 20080710a2W01 | K&S | 1488 Turbo | Wire Bonder | Inq. | 1 |  |
| 20080613a2Y10 | Panasonic | DM-60M-H | Die Bonder | 1998 | 1 |  |
| 20080613a2Y09 | Panasonic | DM-60M-H | Die Bonder | 1999 | 1 |  |
| 20080613a2Y08 | Panasonic | DM-60M | Die Bonder | 2000 | 1 |  |
| 20080613a2Y07 | Panasonic | DM-60M | Die Bonder | 2000 | 1 |  |
| 20080603a1N01 | HITACHI | WB-500A | Wire Bonder | 1998 | 9 |  |
| 20080603a1N02 | KAIJO | FB-128 | Wire Bonder | 1997 | 16 |  |
| 20080603a1N03 | KAIJO | FB-131 | Wire Bonder | 1997 | 69 |  |
| 20080602a1B60 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B59 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B58 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B57 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B56 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B55 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B54 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B53 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B52 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B51 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B50 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B49 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B48 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B47 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B46 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B45 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B44 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B43 | Shinkawa | UTC-50 | Wire Bonder | 1988 | 1 |  |
| 20080602a1B42 | Shinkawa | UTC-200 | Wire Bonder | 1995 | 1 |  |
| 20080602a1B41 | Shinkawa | UTC-200 | Wire Bonder | 1995 | 1 |  |
| 20080602a1B40 | Shinkawa | UTC-200 | Wire Bonder | 1995 | 1 |  |
| 20080602a1B39 | Shinkawa | UTC-200 | Wire Bonder | 1995 | 1 |  |
| 20080602a1B38 | Shinkawa | UTC-200 | Wire Bonder | 1995 | 1 |  |
| 20080602a1B37 | Shinkawa | UTC-200 | Wire Bonder | 1995 | 1 |  |
| 20080602a1B36 | Shinkawa | UTC-200 | Wire Bonder | 1995 | 1 |  |
| 20080602a1B35 | Shinkawa | UTC-200 | Wire Bonder | 1995 | 1 |  |
| 20080602a1B34 | Shinkawa | UTC-200 | Wire Bonder | 1995 | 1 |  |
| 20080602a1B33 | Shinkawa | UTC-200 | Wire Bonder | 1995 | 1 |  |
| 20080602a1B32 | Shinkawa | UTC-100 | Wire Bonder | 1993 | 1 |  |
| 20080602a1B31 | Shinkawa | UTC-100 | Wire Bonder | 1993 | 1 |  |
| 20080602a1B30 | Shinkawa | UTC-100 | Wire Bonder | 1993 | 1 |  |
| 20080602a1B29 | Shinkawa | UTC-100 | Wire Bonder | 1993 | 1 |  |
| 20080602a1B28 | Shinkawa | UTC-100 | Wire Bonder | 1993 | 1 |  |
| 20080602a1B27 | Shinkawa | UTC-100 | Wire Bonder | 1993 | 1 |  |
| 20080602a1B26 | Shinkawa | UTC-100 | Wire Bonder | 1993 | 1 |  |
| 20080602a1B25 | Shinkawa | UTC-100 | Wire Bonder | 1993 | 1 |  |
| 20080602a1B24 | Shinkawa | UTC-100 | Wire Bonder | 1993 | 1 |  |
| 20080602a1B23 | Shinkawa | UTC-100 | Wire Bonder | 1993 | 1 |  |
| 20080602a1B22 | Shinkawa | UTC-100 | Wire Bonder | 1993 | 1 |  |
| 20080602a1B21 | SONICS | URB-412 | Wire Bonder | 1996 | 1 |  |
| 20080602a1B20 | SONICS | URB-412 | Wire Bonder | 1996 | 1 |  |
| 20080602a1B19 | SONICS | URB-412 | Wire Bonder | 1996 | 1 |  |
| 20080602a1B18 | SONICS | URB-412 | Wire Bonder | 1996 | 1 |  |
| 20080602a1B17 | SONICS | URB-412 | Wire Bonder | 1996 | 1 |  |
| 20080602a1B16 | SONICS | URB-412 | Wire Bonder | 1996 | 1 |  |
| 20080602a1B15 | KAIJO | FB118A | Wire Bonder | 1993 | 1 |  |
| 20080602a1B14 | KAIJO | FB118A | Wire Bonder | 1993 | 1 |  |
| 20080602a1B13 | KAIJO | FB118A | Wire Bonder | 1993 | 1 |  |
| 20080602a1B12 | KAIJO | FB118A | Wire Bonder | 1993 | 1 |  |
| 20080602a1B11 | KAIJO | FB118A | Wire Bonder | 1993 | 1 |  |
| 20080602a1B10 | KAIJO | FB118A | Wire Bonder | 1993 | 1 |  |
| 20080602a1B09 | KAIJO | FB118A | Wire Bonder | 1993 | 1 |  |
| 20080602a1B08 | KAIJO | FB118A | Wire Bonder | 1993 | 1 |  |
| 20080602a1B07 | KAIJO | FB118A | Wire Bonder | 1993 | 1 |  |
| 20080602a1B06 | KAIJO | FB118A | Wire Bonder | 1993 | 1 |  |
| 20080602a1B05 | KAIJO | FB118A | Wire Bonder | 1993 | 1 |  |
| 20080602a1B04 | KAIJO | FB118A | Wire Bonder | 1993 | 1 |  |
| 20080602a1B03 | KAIJO | FB118A | Wire Bonder | 1993 | 1 |  |
| 20080602a1B02 | KAIJO | FB118A | Wire Bonder | 1993 | 1 |  |
| 20080602a1B01 | KAIJO | FB118A | Wire Bonder | 1993 | 1 |  |
| 20080528a1W01 | Shinkawa | ILT-110 | Inner Lead Bonder | Inq. | 1 |  |
| 20080317a1W01 | Panasonic | DM60H | Die Bonder | 1998 | 1 |  |
ASSY: Other
| TTC ID |
MAKER |
MODEL |
DESCRIPTION |
VIN. |
QTY |
INQ. |
| 20081106a4E051 | Branson | 5510 | Ultrosonic cleaner | Inq. | 1 |  |
| 20081106a4E050 | Yamato | DKN400 | Concevtion oven | Inq. | 6 |  |
| 20081106a4E049 | VWR Scientific Inc. | VWR1410 | Vacuum oven | Inq. | 1 |  |
| 20081106a4E048 | Lindberg/Blue M | GO1310A | Convection Oven | Inq. | 1 |  |
| 20081106a4E047 | ENR | PR-602W | Pad Printer | 1989 | 1 |  |
| 20081106a4E046 | ENR | PR-602W | Pad Printer | 1988 | 3 |  |
| 20081106a3E036 | Gpline | GUC-184M | UV Dryer | 2003 | 2 |  |
| 20081106a3E035 | MBK | TR-1500SX | Wafer Sorter | 2001 | 1 |  |
| 20081106a3E034 | MIT | TTR80 | Tape & Reel | Inq. | 1 |  |
| 20081106a3E033 | STI | LM-6023 | Laser Marker | Inq. | 1 |  |
| 20081106a3E032 | GS | View880-200 | Scannning Tool | 1998 | 3 |  |
| 20081104a1A008 | SUNX | LP-F10 | FIBER LASER MARKER | 2004 | 1 |  |
| 20081104a1A007 | Inq. | NR030-2945 | Peeling Tool | 2004 | 1 |  |
| 20081104a1A006 | DAGE | MODEL 4000 | Wire bond pull tester | 2000 | 1 |  |
| 20081002a2A019 | MATSUO | Inq. | Laser Marker | 2000 | 1 |  |
| 20081002a2A018 | MATSUO | Inq. | Laser Marker | 1995 | 1 |  |
| 20081002a2A017 | NEC | Inq. | L/Mark Handler | 2001 | 2 |  |
| 20081002a2A016 | MIYACHI | ML-2050A | Laser Spot Welder | 2002 | 2 |  |
| 20081002a2A015 | NEC? | CAMS-1 | Mold Press | 2001 | 1 |  |
| 20081002a2A014 | Apic Yamada | MS-7050F | Mold Press | 1997 | 1 |  |
| 20081002a2A013 | NEC | SL-432G2 | Laser Trimer | 1997 | 1 |  |
| 20081001a2C031 | ICOS | CI-9250 | Macro Inspection | 2004 | 1 |  |
| 20080926a1L001 | ICOS | CI-9250 | COMPONENT INSPECTION Tool | Inq. | 1 |  |
| 20080916f1A003 | Yamato Scientific | DT62 | Oven | Inq. | 1 |  |
| 20080827c1L003 | FUJIIMPULSE | FV-600-NG-10W | Vacuum and gas flush sealer | 2000 | 1 |  |
| 20080714a2W14 | SHINKAWA | SPA-210 | DIE ATTACHER | 2000 | 1 |  |
| 20080714a2W13 | SHINKAWA | SPA-200 | DIE ATTACHER | 2000 | 1 |  |
| 20080714a2W12 | SHINKAWA | SPA-210 | DIE ATTACHER | 2001 | 1 |  |
| 20080714a2W11 | SHINKAWA | SPA-210 | DIE ATTACHER | 2001 | 1 |  |
| 20080714a2W10 | SHINKAWA | SPA-210 | DIE ATTACHER | 2001 | 1 |  |
| 20080714a2W09 | OSUNG LST | 01021142110-1 | VACUUM CHAME | 2001 | 1 |  |
| 20080714a2W08 | OSUNG LST | OS4-120AVC | CURE OVEN | 1999 | 1 |  |
| 20080714a2W07 | June Tech | JTS2000W | MBT SORTER | 1998 | 1 |  |
| 20080714a2W06 | June Tech | JTS2000W | MBT SORTER | 1997 | 1 |  |
| 20080714a2W05 | June Tech | JTS2000W | MBT SORTER | 1998 | 1 |  |
| 20080714a2W04 | June Tech | JTS2000W | MBT SORTER | 1997 | 1 |  |
| 20080714a2W03 | SECRON | UTS-2001 | STACK-TACK | 2001 | 1 |  |
| 20080714a2W02 | GENERAL SCANNING | LM6000 | MARKER | 1997 | 1 |  |
| 20080714a2W01 | GENERAL SCANNING | LM6000 | MARKER | 1996 | 1 |  |
| 20080708a1E02 | A.E Advanced | MWM-850 | Wafer mounting | Inq. | 1 |  |
| 20080708a1E01 | KEYENCE | ML-9100 | Laser mark | Inq. | 2 |  |
| 20080616a2B02 | DYNATEX | GST-150 | Scribeer Breaker | 2002 | 1 |  |
| 20080613a2Y06 | DAGE | MODEL 14000 | BUMP Share Tester | 2000 | 1 |  |
| 20080603a1N05 | KIGIANT | 200 tons | Mold Press | 1997 | 11 |  |
| 20080603a1N06 | GPD | BGA | molding machine | 1998 | 1 |  |
| 20080603a1N07 | INQ | UPH 22000 | Wafer molding machine | 1998 | 1 |  |
| 20080603a1N08 | ASM | Inq. | BGA margin cutter | 1998 | 1 |  |
| 20080603a1N09 | YF-02 | BGA | BGA washer | 1998 | 1 |  |
| 20080603a1N10 | KINEGY | AFL-CH2-04S | INQ | 1997 | 15 |  |
| 20080603a1N12 | DEMIN | SIZE 40-58mm | preheater | 1998 | 2 |  |
| 20080603a1N13 | DEMIN | SSOP48L | preheater | 1998 | 1 |  |
| 20080603a1N14 | GTA | ZX-CO-106 | laser printer CO2 | 1998 | 1 |  |
| 20080603a1N16 | GPM | SOJ42 SSOP48 | shaper | 1998 | 2 |  |
| 20080603a1N17 | YAMADA | SOJ 24/26 | auto shaper | 1997 | 1 |  |
| 20080603a1N18 | ASM | SOJ 24/26 | shaper-2 | 1997 | 1 |  |
| 20080603a1N19 | EVER TECH | FOR TRAY QFP TSOP FP-550 | lead scan | 1998 | 1 |  |
| 20080603a1N20 | EVER TECH | SSOP-48/56L | semi-auto lead scan | 1998 | 2 |  |
| 20080603a1N21 | EVER TECH | SPJ 300/400MIL SSR-300A | lead scan | 1998 | 1 |  |
| 20080603a1N22 | Motec | BIBU100 | unloader | 1997 | 1 |  |
| 20080603a1N23 | Motec | BIBL100 | loader | 1997 | 1 |  |
| 20080603a1N24 | Motec | BIBL100 | unloader/loader | 1998 | 1 |  |
| 20080603a1N25 | Motec | PPLU 100 | unloader/loader | 1998 | 1 |  |
| 20080603a1N26 | GTA electronic | ZX-LU-101 | laser marker | 1997 | 1 |  |
| 20080603a1N27 | YAG | Inq | laser marker | 1997 | 1 |  |
| 20080603a1N28 | E&R engineering | PR2000 | ink marker | 2000 | 1 |  |
| 20080603a1N29 | MISUZU | BA-1100 | INQ | 1998 | 1 |  |
| 20080602a2B07 | OPTO Sys. | LPAM7000V16-T | Chip Sorter | 2001 | 1 |  |
| 20080602a2B06 | ASM | MS896 | Chip Sorter | 2001 | 1 |  |
| 20080602a2B05 | OPTO Sys. | WPOH-105AS-T | CHIP TEST | 2001 | 1 |  |
| 20080602a2B04 | JT | JCS-6300 | Chip Sorter | 2001 | 1 |  |
| 20080602a2B03 | JT | JCP-1000 | CHIP TEST | 2001 | 1 |  |
| 20080418a1P26 | MATSUO | Inq. | Laser Marker | 2000 | 1 |  |
| 20080418a1P25 | MATSUO | Inq. | Laser Marker | 1995 | 1 |  |
| 20080418a1P24 | NEC | Inq. | L/Mark Handler | 2001 | 2 |  |
| 20080418a1P23 | SUNX | LP-F10 | Laser Marker | 2000 | 1 |  |
| 20080418a1P22 | MIYACHI | ML-2050A | Laser Spot Welder | 2002 | 2 |  |
| 20080418a1P21 | MIYACHI | ML-2050A | Laser Spot Welder | 2001 | 1 |  |
| 20080418a1P20 | NEC? | CAMS-1 | Mold Press | 2001 | 1 |  |
| 20080418a1P19 | Apic Yamada | MS-7050F | Mold Press | 1997 | 1 |  |
| 20080418a1P18 | NEC | SL-432G2 | Laser Trimer | 2000 | 2 |  |
| 20080418a1P17 | NEC | SL-432G2 | Laser Trimer | 1998 | 1 |  |
| 20080418a1P16 | NEC | SL-432G2 | Laser Trimer | 1997 | 3 |  |
| FOR SALE TOOLS --- Semiconductor Test Systems |
- Test System
- (Wafer) Prober
- (Die) Handler, etc...
|
TEST: Tester
| TTC ID |
MAKER |
MODEL |
DESCRIPTION |
VIN. |
QTY |
INQ. |
| 20081106t1E024 | Shibasoku | WL93a | Tester | 1999 | 1 |  |
| 20081106t1E023 | KVD | Inq. | Tester, CMOS | Inq. | 14 |  |
| 20081106t1E022 | KVD | Inq. | Tester, CMOS | 2000 | 4 |  |
| 20081106t1E021 | (LTX-)Credence | Kalos | Tester, Memory | Inq. | 5 |  |
| 20081106t1E019 | VERIGY(Agilent) | 93000 | Tester | 1993 | 1 |  |
| 20081106t1E018 | VERIGY(Agilent) | 93000 | Tester | 1994 | 1 |  |
| 20081104t2E017 | TERADYNE | FLEX-RF | Tester | Inq. | 5 |  |
| 20081023t2E003 | VERIGY(Agilent) | Versa 3304 | Tester | Inq. | 4 |  |
| 20081017t2L004 | ASIA | T7164J | Tester? | 1997 | 15 |  |
| 20081017t2L003 | ADVANTEST | T3335P | Tester,Memory | 1992 | 3 |  |
| 20081017t2L002 | ADVANTEST | T5371 | Tester,Memory | 2000 | 2 |  |
| 20081015t1E003 | ANDO | AL-6082 | Tester,Memory | Inq. | 1 |  |
| 20081015t1E002 | ADVANTEST | T5362 | Tester,Memory | Inq. | 2 |  |
| 20081015t1E001 | ADVANTEST | T5363 | Tester,Memory | Inq. | 3 |  |
| 20081010t1L001 | LTX-Credence | LTX-77 | Tester | 1985 | 1 |  |
| 20081006t2L003 | ADVANTEST | T5581P | Tester | 2003 | 2 |  |
| 20081001t3C032 | TERADYNE | Catalyst | Test System, Mixed-signal/SOC digital | Inq. | 1 |  |
| 20080929t1L014 | ADVANTEST | T6672 | Tester/Logic | 2000 | 2 |  |
| 20080929t1L013 | YOKOGAWA | TS6000 | Tester | 2000 | 6 |  |
| 2008092421L004 | ADVANTEST | T6575 | PDP Driver Test System | 2003 | 1 |  |
| 2008092421L002 | ADVANTEST | T6271 | PDP Driver Test System | 2005 | 1 |  |
| 2008092421L003 | ADVANTEST | T3347 | Tester, Logic/Analog | 1998 | 3 |  |
| 20080922t3L026 | ADVANTEST | T5371 | Tester, Memory | 2001 | 1 |  |
| 20080926t2L002 | TSK | UF200SA | Automatic Wafer Prober | 2004 | 1 |  |
| 2008092421L008 | TSK | UF200 | Automatic Wafer Prober | 2000 | 1 |  |
| 2008092421L007 | TSK | UF200 | Automatic Wafer Prober | 1999 | 1 |  |
| 2008092421L006 | TSK | UF200 | Automatic Wafer Prober | 1996 | 2 |  |
| 2008092421L005 | TSK | UF200 | Automatic Wafer Prober | 1998 | 1 |  |
| 20080924t1L001 | Opto System | WPFR4200 | Semi Automatic Backside Prober for LED | 2008? | 1 |  |
| 20080922t3L026 | ADVANTEST | T5371 | Tester, Memory | 2001 | 1 |  |
| 20080918t2E002 | ADVANTEST | T5593 | Tester, Memory | 2005 | 1 |  |
| 20080917t3L005 | TERADYNE | IP750 | Tester, Image Sensor | 2003 | 1 |  |
| 20080917t1B001 | Shibasoku | S230 | Tester, PDP Driver ICs (Data, Scan) | 2005 | 2 |  |
| 20080908t1L004 | ADVANTEST | T6573 | Tester/SoC | 2004 | 1 |  |
| 20080905t3L017 | ADVANTEST | T6672 | Tester/Logic | 2000 | 2 |  |
| 20080905t3L016 | YOKOGAWA | TS6000 | Tester | 2000 | 6 |  |
| 20080822t4L020 | YOKOGAWA | TS6700 | Tester | 2000 | 1 |  |
| 20080821t2L005 | YOKOGAWA | ST6730 | Test System, FPD Driver | 2006 | 1 |  |
| 20080801t7L01 | YOKOGAWA | TS6000 | Tester | 2000 | 7 |  |
| 20080801t4L02 | YOKOGAWA | TS6000 | Tester | 2000 | 7 |  |
| 20080801t4L01 | YOKOGAWA | TS6000 | Tester | 2000 | 4 |  |
| 20080801t0L03 | ADVANTEST | T5335P | Tester | 1998 | 1 |  |
| 20080801t0L02 | ADVANTEST | T5335P | Tester | 1998 | 1 |  |
| 20080801t0L01 | ADVANTEST | T5335P | Tester | 1997 | 1 |  |
| 20080714t1W08 | ADVANTEST | T5365 | Tester/Memory | 1994 | 1 |  |
| 20080714t1W07 | ADVANTEST | T5365 | Tester/Memory | 1995 | 1 |  |
| 20080714t1W06 | ADVANTEST | T5365 | Tester/Memory | 1996 | 1 |  |
| 20080714t1W05 | ADVANTEST | T5365 | Tester/Memory | 1995 | 1 |  |
| 20080714t1W04 | ADVANTEST | T5365A | Tester/Memory | 1996 | 1 |  |
| 20080714t1W03 | ADVANTEST | T5365A | Tester/Memory | 1996 | 1 |  |
| 20080714t1W02 | ADVANTEST | T5365 | Tester/Memory | 1996 | 1 |  |
| 20080714t1W01 | ADVANTEST | T5365 | Tester/Memory | 1994 | 1 |  |
| 20080711t2L01 | YOKOGAWA | TS6000 | Tester | 2000 | 4 |  |
| 20080711t1L01 | ADVANTEST | T5581 | Tester/Memory | 1996 | 1 |  |
| 20080707t2E15 | Advantest | T3347 | Tester | Inq. | 1 |  |
| 20080707t2E14 | Advantest | T6673 | Tester | Inq. | 1 |  |
| 20080707t2E13 | VERIGY | 83000 | Tester | Inq. | 7 |  |
| 20080707t2E12 | LTX | Trillium | Tester | Inq. | 3 |  |
| 20080707t2E11 | LTX | DELTA-STE | Tester | |