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中古装置情報・TTCグループ(半導体製造装置・液晶製造装置・工作機械等)    ( Go to ---> MENU , FAB , ASSY , TEST , Metrology , LCD etc. )
FOR SALE TOOLS --- Semiconductor Fabrication
  • Lithography, Photoresist, Dry Etching
  • Diffusion/Oxidation/Thermal(RTP/RTA,Traditional Furnace),CVD , PVD(Sputter), Evaporation
  • Wet Process(Cleaning, Wet etching)
  • Ion Implantation, CMP, Reticle/Photomask, Clean Roometc...
Wafer Fab: Photolitho
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20080723f3K01CanonMPA600FAMask Aligner (W/F Size= 6")19851
20080717f1K14TOKTR8171UD-TM(8")SOG CoatInq.1
20080605f2E05NIKONS308FScanner (W/F=200mm)Inq.1
20080605f2E06NIKONSF-1004X SF Stepper (W/F=200mm)Inq.1
20080605f2E07NIKONSF-100Stepper (W/F=200mm)Inq.1
20080605f2E08TELAct-8Track,Coat/Develop (W/F=200mm)Inq.1
20080605f2E09CanonAS4Arf Scanner (W/F=200mm)Inq.1
20080605f2E10JEOLJBX-3030MVElectron Beam Lithography (W/F=200mm)Inq.1


Wafer Fab: Etch/Ash
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20080826f1O0043MJS3000-4609-6(8")Insulator support etcher20051
20080825f1O005HITACHIM-511A(8")Dry Etch, Si20051
20080801f9L02ULVACRH-200Dry Etching System19901
20080717f1K11HITACHIM531A(8")W-Interconnection EtchInq.1
20080717f1K10HITACHIM612(8")Poly Silicon EtchInq.1
20080717f1K09TOKTEC 3822(8")Plasma Etch/2 chamberInq.2
20080717f1K08TELUNITY85DD(8")Oxide Etch/2 chamber Inq.1
20080717f1K07TELUNITY85DD(8")Oxide Etch (BS SAC)Inq.1
20080613f1Y05Canon GIR-261R Dry Etch(GIR-3) 1998 1
20080613f1Y04ALCATEL AMS-200 Deep RIE(D-RIE) 2005 1
20080507f6Y01AlcatelMS200
I-Productivity
Deep RIE20051


Wafer Fab: Diff, T/F, Implant
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20080825f1O002ANELVAI-1052(8")Sputter19891
20080801p2L01ULVACMLH-2308RE(5")Sputter19881
20080801f9L06Shinko Seiki Inq.Plasma reflow system 20061
20080801f9L05EBARAUFP-200/300Bump plating machine20051
20080801f9L04EBARAUFP-200/300Plating machine -low temperature-20061
20080801f9L03EEJACP2001-02-0059CUP-PLATER semi-auto type20011
20080729f1K04TELAlpha-8SE(8")Furnace-Vert.20011
20080729f1K03TELAlpha-8SE(8")Furnace-Vert.20041
20080729f1K02TELAlpha-8SE(8")Furnace-Vert.20041
20080729f1K01TELAlpha-8SE(8")Furnace-Vert.20011
20080717f1K01VARIANVIISION80 LE(8")Ion Implant / H/CurrentInq.1
20080717f1K05TELAlpha-808SC(8")Furnace-NP SiNInq.1
20080717f1K04TELAlpha-808SC(8")Furnace-NP PolyInq.3
20080717f1K03TELAlpha-808SC (8")Furnace-TEOSInq.3
20080717f1K02TELAlpha-808SC(8")Furnace-TEOSInq.3
20080717f1K13TELMB2(3CH)(8")CVD WSi depoInq.1
20080717f1K12DNSLA820(8")RTAInq.1
20080711f2L03ULVACMLH-2308RESputter(5")19881
20080710f0K01AMATP-5000PECVD(WCVD, 8")19921


Wafer Fab: Wafer Cleaning
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20080801f2L04DNSFC-821L(8")Cleaning tool20011
20080801f2L03DNSFL-820L(8")Clean Tool19971
20080730f1K05DNSWS-820L(8")Wet Etch Sys.Inq.1
20080730f1K04DNSWS-820L(8")Wet Etch Sys.Inq.1
20080730f1K03DNSWS-820L(8")Wet Etch Sys.Inq.1
20080730f1K02DNSWS-820L(8")Wet Etch Sys.Inq.1
20080717f1K06DNSFL-820LWet Station / Closed Type Light EtchInq.4
20080711f4L02Chemical Art
Technology
Inq.Draft Chamber(8")19951
20080711f4L01PuretronMM-1-W-SC-AOzone water systems(8")19951
20080702f2H04DNSFL-820LClean Tool19971
20080605f2E13DNSFS-820LWet Bench (Clean Tool) (W/F=200mm)Inq.1


Wafer Fab: Other
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20080827f1L002Litel
Instruments
Litel ReticleInterferometer20001
20080827f1L001EBARAET1600WSTurbo Molecular Pump20062
20080826f1O007Chuo RikenCT-50UDP
(2 Bath)
(8")Clean Oven20051
20080825f1O004DNSAS2000(8")Post CMP Clean20051
20080825f1O003TSKChaMP-232(8")CMP, Cu20051
20080801f9L10Chamical ArtInq.draft chamber19951
20080801f9L09PuretronMM-1-W-SC-Aozone water systems 19951
20080801f9L08HITACHIPCV-843BNClean bench19911
20080801f9L07Air TechACB-521CFSClean both19911
20080801f8L01Dan-TakumaSCH-1802C-RS-MReticle Stocker19901
20080711f3L02HITACHIPCV-843BNClean Bench19913
20080711f3L01Air TechACB-521FSClean Booth19911
20080613f1Y12 Inq. LZ-2100GFW12 Leak Test Inq. 1
20080613f1Y11 Fukuda MS-5085 Leak Test 2004 1
20080613f1Y10 Fukuda MS-5085 Leak Test 2004 1
20080613f1Y09 Fukuda MS-5085 Leak Test 2004 1
20080613f1Y08 Cosmo LZ-2100G-
03FW89
Leak Test Inq. 1
20080613f1Y07 Cosmo LZ-2100G-
03FW89
Leak Test Inq. 1
20080613f1Y06 Inq. NR030-2945 Peeling Tool 2004 1

( Go to ---> MENU , FAB , ASSY , TEST , Metrology , LCD etc. )


FOR SALE TOOLS --- Semiconductor Metrology / Inspection/Other
  • Analysis Tools
  • Microscope
  • Measurement Tool, etc.
Wafer Fab: Metrology
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20080826f1O003HITACHIS-3600N(8")SEM20051
20080826f1O002Hitachi
Kenki
Finetech
FS300i(8")Scanning Accoustic Tomograph20051
20080801f9L01VeecoWyko NT1100(8")Measurement System20051
20080801f2L06HORIBADEGILEM 550Film Thick Meas.20041
20080801f2L05SONYILS-10Wafer Surface Insp.20001
20080730f1K01LeicaINS3000(8")Review StationInq.1
20080723a2L01ICOSCI-9250Macro Inspection20041
20080613f1Y03EV Group EVG40 Microscope(Dual side) 2005 1
20080613f1Y02Rigaku ZSX100e X-ray Fluorescence Spectrometer 2000 1
20080613f1Y01TOPCON WM3-2 Surface Inspection 1998 1
20080605f2E15HITACHIS-8820CD SEM (W/F=200mm)Inq.1
20080605f2E16AMATSEM vision CXINSPECT SEM (W/F=200mm)Inq.1
20080605f2E17AMATSEM vision CXINSPECT SEM (W/F=200mm)Inq.1
20080605f2E18AMATSEM vision CXINSPECT SEM (W/F=200mm)Inq.1
20080605f2E19NIKONOPT-3AMicroscope (W/F=200mm)Inq.1
20080605f2E20LEICAINS2000Review Station (W/F=200mm)Inq.1

( Go to ---> MENU , FAB , ASSY , TEST , Metrology , LCD etc. )


FOR SALE TOOLS --- LCD Manuf. / Elec. Component / Machine Tools
  • Liquid Crystal Manufacturing Tools
  • Electronic Component
  • Machine Tools, etc.
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20080801c5L05Dan-TakumaSCHQR2504BS-TSDrying Chamber 19961
20080801c5L04SHOWA DENKOHAD30"AL-RIE adsorption cylinder box"19961
20080801c5L03AIR TECHAML-1500SDraft Chamber Inq.1
20080801c5L02AIR TECHAHO-100-56MClean air ovenInq.1
20080801c5L01TOYOTA3FB15ForkLift Truck19761
20080801c1L02Matsunaga
Mfg.
FCV-2637-3Power Freq. Exchanger20031
20080801c1L01HISAKA
Works
UX-315A-NH9-77Heat Exchanger20031
20080723p1W01LGPTMLMask Blanks Inspection20041
20080710p1B10ODPKLA6020Automatic Optical InspectionInq.1
20080710p1B09MECS308FK19900081AUTO LOADERInq.1
20080710p1B08ODPKLA6510Review StationInq.1
20080710p1B07DNSSRG_360_AAUTO DEVELOPERInq.1
20080710p1B06DEAYAUNHB300KSOLDERING SYSTEMInq.1
20080710p1B05SUNTECH WINSTW-K1-55KNIFE CLEANERInq.1
20080710p1B04SHINDOMAX7Before PI CleanInq.1
20080710p1B03OSUNGLSTOS-OVN11CURE OVENInq.1
20080710p1B02HitachInq.CD MeterInq.1
20080710p1B01TorayTRT920TitlerInq.1
20080616m2B01OkamotoPL500Polishing Tool20021
20080421p3B07Inq.Inq.Hot Plate (110'C) (Size=1400x1600)Inq.1
20080421p3B06LGPMI1100Surface Insp? (Size=1100mm)Inq.1
20080421p3B05DNSDSCH1500Cleaning Tool (Size=1400mm)Inq.1
20080421p3B04LFTSL465D2W/B Defect Repair (Size=1100mm)Inq.1
20080421p3B03Lasertec1LM1120CD Meas. (Size=1120mm)Inq.1
20080421p3B02JUNSANJMP2006Dev/Etch/Strip (Size=1220x1400)Inq.1
20080421p3B01HIMTMW1100Exposure Tool (Kr+ Laser) (Size=1100mm)Inq.1

( Go to ---> MENU , FAB , ASSY , TEST , Metrology , LCD etc. )


FOR SALE TOOLS --- Semiconductor Assembly and SMT
  • Grinding
  • Die/Wire Bonding
  • Molding/Packaging
  • SMT Related, etc...
ASSY: B/G, Dicing
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20080825f1O001EMTECCVP-220(8")W/F Beveling20051
20080801a6L01SHINKAWASBB-310Bump bonder20011
20080616f2B19OkamotoVG201Automatic Grinding Tool (WF=150mm)20021
20080602a2B02OPTO Sys.OSH-80TPSCRIBER20011
20080602a2B01OPTO Sys.OSH-90TPBREAKER20011


ASSY: (Die/Wire)Bonder
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20080822a5O023Westbond7327ADie Bonder19991
20080822a5O022Westbond7327C-79Die Bonder20011
20080822a5O021Westbond7327C-79Die Bonder20011
20080710a2W02K&S1488 TurboWire BonderInq.1
20080710a2W01K&S1488 TurboWire BonderInq.1
20080613a2Y10 Panasonic DM-60M-H Die Bonder 1998 1
20080613a2Y09 Panasonic DM-60M-H Die Bonder 1999 1
20080613a2Y08 Panasonic DM-60M Die Bonder 2000 1
20080613a2Y07 Panasonic DM-60M Die Bonder 2000 1
20080603a1N01HITACHIWB-500AWire Bonder 19989
20080603a1N02KAIJOFB-128Wire Bonder 199716
20080603a1N03KAIJOFB-131Wire Bonder 199769
20080602a1B60ShinkawaUTC-50Wire Bonder19881
20080602a1B59ShinkawaUTC-50Wire Bonder19881
20080602a1B58ShinkawaUTC-50Wire Bonder19881
20080602a1B57ShinkawaUTC-50Wire Bonder19881
20080602a1B56ShinkawaUTC-50Wire Bonder19881
20080602a1B55ShinkawaUTC-50Wire Bonder19881
20080602a1B54ShinkawaUTC-50Wire Bonder19881
20080602a1B53ShinkawaUTC-50Wire Bonder19881
20080602a1B52ShinkawaUTC-50Wire Bonder19881
20080602a1B51ShinkawaUTC-50Wire Bonder19881
20080602a1B50ShinkawaUTC-50Wire Bonder19881
20080602a1B49ShinkawaUTC-50Wire Bonder19881
20080602a1B48ShinkawaUTC-50Wire Bonder19881
20080602a1B47ShinkawaUTC-50Wire Bonder19881
20080602a1B46ShinkawaUTC-50Wire Bonder19881
20080602a1B45ShinkawaUTC-50Wire Bonder19881
20080602a1B44ShinkawaUTC-50Wire Bonder19881
20080602a1B43ShinkawaUTC-50Wire Bonder19881
20080602a1B42ShinkawaUTC-200Wire Bonder19951
20080602a1B41ShinkawaUTC-200Wire Bonder19951
20080602a1B40ShinkawaUTC-200Wire Bonder19951
20080602a1B39ShinkawaUTC-200Wire Bonder19951
20080602a1B38ShinkawaUTC-200Wire Bonder19951
20080602a1B37ShinkawaUTC-200Wire Bonder19951
20080602a1B36ShinkawaUTC-200Wire Bonder19951
20080602a1B35ShinkawaUTC-200Wire Bonder19951
20080602a1B34ShinkawaUTC-200Wire Bonder19951
20080602a1B33ShinkawaUTC-200Wire Bonder19951
20080602a1B32ShinkawaUTC-100Wire Bonder19931
20080602a1B31ShinkawaUTC-100Wire Bonder19931
20080602a1B30ShinkawaUTC-100Wire Bonder19931
20080602a1B29ShinkawaUTC-100Wire Bonder19931
20080602a1B28ShinkawaUTC-100Wire Bonder19931
20080602a1B27ShinkawaUTC-100Wire Bonder19931
20080602a1B26ShinkawaUTC-100Wire Bonder19931
20080602a1B25ShinkawaUTC-100Wire Bonder19931
20080602a1B24ShinkawaUTC-100Wire Bonder19931
20080602a1B23ShinkawaUTC-100Wire Bonder19931
20080602a1B22ShinkawaUTC-100Wire Bonder19931
20080602a1B21SONICSURB-412Wire Bonder19961
20080602a1B20SONICSURB-412Wire Bonder19961
20080602a1B19SONICSURB-412Wire Bonder19961
20080602a1B18SONICSURB-412Wire Bonder19961
20080602a1B17SONICSURB-412Wire Bonder19961
20080602a1B16SONICSURB-412Wire Bonder19961
20080602a1B15KAIJOFB118AWire Bonder19931
20080602a1B14KAIJOFB118AWire Bonder19931
20080602a1B13KAIJOFB118AWire Bonder19931
20080602a1B12KAIJOFB118AWire Bonder19931
20080602a1B11KAIJOFB118AWire Bonder19931
20080602a1B10KAIJOFB118AWire Bonder19931
20080602a1B09KAIJOFB118AWire Bonder19931
20080602a1B08KAIJOFB118AWire Bonder19931
20080602a1B07KAIJOFB118AWire Bonder19931
20080602a1B06KAIJOFB118AWire Bonder19931
20080602a1B05KAIJOFB118AWire Bonder19931
20080602a1B04KAIJOFB118AWire Bonder19931
20080602a1B03KAIJOFB118AWire Bonder19931
20080602a1B02KAIJOFB118AWire Bonder19931
20080602a1B01KAIJOFB118AWire Bonder19931
20080528a1W01ShinkawaILT-110Inner Lead BonderInq.1
20080317a1W01PanasonicDM60HDie Bonder19981


ASSY: Other
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20080827c1L003FUJIIMPULSEFV-600-NG-10WVacuum and gas flush sealer20001
20080714a2W14SHINKAWASPA-210DIE ATTACHER20001
20080714a2W13SHINKAWASPA-200DIE ATTACHER20001
20080714a2W12SHINKAWASPA-210DIE ATTACHER20011
20080714a2W11SHINKAWASPA-210DIE ATTACHER20011
20080714a2W10SHINKAWASPA-210DIE ATTACHER20011
20080714a2W09OSUNG LST01021142110-1VACUUM CHAME20011
20080714a2W08OSUNG LSTOS4-120AVCCURE OVEN19991
20080714a2W07June TechJTS2000WMBT SORTER19981
20080714a2W06June TechJTS2000WMBT SORTER19971
20080714a2W05June TechJTS2000WMBT SORTER19981
20080714a2W04June TechJTS2000WMBT SORTER19971
20080714a2W03SECRONUTS-2001STACK-TACK20011
20080714a2W02GENERAL
SCANNING
LM6000MARKER19971
20080714a2W01GENERAL
SCANNING
LM6000MARKER19961
20080708a1E02A.E AdvancedMWM-850Wafer mountingInq.1
20080708a1E01KEYENCEML-9100Laser markInq.2
20080616a2B02DYNATEXGST-150Scribeer Breaker20021
20080613a2Y06 DAGE MODEL 14000 BUMP Share Tester 2000 1
20080603a1N05KIGIANT200 tonsMold Press199711
20080603a1N06GPDBGAmolding machine19981
20080603a1N07INQUPH 22000Wafer molding machine19981
20080603a1N08ASMInq.BGA margin cutter19981
20080603a1N09YF-02BGABGA washer19981
20080603a1N10KINEGYAFL-CH2-04SINQ199715
20080603a1N12DEMINSIZE40~58mmpreheater19982
20080603a1N13DEMINSSOP48Lpreheater19981
20080603a1N14GTAZX-CO-106laser printer CO219981
20080603a1N16GPMSOJ42 SSOP48shaper19982
20080603a1N17YAMADASOJ 24/26auto shaper19971
20080603a1N18ASMSOJ 24/26shaper-219971
20080603a1N19EVER TECHFOR TRAY QFP
TSOP FP-550
lead scan19981
20080603a1N20EVER TECHSSOP-48/56Lsemi-auto lead scan19982
20080603a1N21EVER TECHSPJ 300/400MIL
SSR-300A
lead scan19981
20080603a1N22MotecBIBU100unloader19971
20080603a1N23MotecBIBL100loader19971
20080603a1N24MotecBIBL100unloader/loader19981
20080603a1N25MotecPPLU 100unloader/loader19981
20080603a1N26GTA
electronic
ZX-LU-101laser marker19971
20080603a1N27YAGInqlaser marker19971
20080603a1N28E&R
engineering
PR2000ink marker20001
20080603a1N29MISUZUBA-1100INQ19981
20080602a2B07OPTO Sys.LPAM7000V16-TChip Sorter20011
20080602a2B06ASMMS896Chip Sorter20011
20080602a2B05OPTO Sys.WPOH-105AS-TCHIP TEST20011
20080602a2B04JTJCS-6300Chip Sorter20011
20080602a2B03JTJCP-1000CHIP TEST20011
20080418a1P26MATSUOInq.Laser Marker20001
20080418a1P25MATSUOInq.Laser Marker19951
20080418a1P24NECInq.L/Mark Handler20012
20080418a1P23SUNXLP-F10Laser Marker20001
20080418a1P22MIYACHIML-2050ALaser Spot Welder20022
20080418a1P21MIYACHIML-2050ALaser Spot Welder20011
20080418a1P20NEC?CAMS-1Mold Press20011
20080418a1P19Apic YamadaMS-7050FMold Press19971
20080418a1P18NECSL-432G2Laser Trimer20002
20080418a1P17NECSL-432G2Laser Trimer19981
20080418a1P16NECSL-432G2Laser Trimer19973


SMT
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20080801s3L02Yasukawa SangyoY600Reflow Oven20021
20080801s3L01shibuyaSBM-100Ball Attachemnet Tool19981
20080711s2L02Yasukawa SangyoY600Reflow Oven20021
20080630s1M02OMRONVT-WIN-LSolder Inspection19971
20080630s1M01OMRONVT-WIN-LHSolder Inspection (With Numbering tool)20001

( Go to ---> MENU , FAB , ASSY , TEST , Metrology , LCD etc. )


FOR SALE TOOLS --- Semiconductor Test Systems
  • Test System
  • (Wafer) Prober
  • (Die) Handler, etc...
TEST: Tester
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20080828t1L001TERADYNECatalystTest System,
Mixed-signal/SOC digital
Inq.1
20080822t4L020YOKOGAWATS6700Tester20001
20080821t2L005YOKOGAWAST6730Test System, FPD Driver 20061
20080801t7L01YOKOGAWATS6000Tester20007
20080801t4L02YOKOGAWATS6000Tester20007
20080801t4L01YOKOGAWATS6000Tester20004
20080801t0L03ADVANTESTT5335PTester19981
20080801t0L02ADVANTESTT5335PTester19981
20080801t0L01ADVANTESTT5335PTester19971
20080725t1K01Agilent83000Tester - SoC19951
20080724t2E01CredenceKalos 2Tester - MemoryInq.1
20080724t1K01Agilent(HP)4062UXTester (Parametric)19951
20080723t4K01CredenceSAPPHIRE NPTester - Logic20061
20080722t2K01AgilentV3304TESTER/Memory199720
20080722t1K01YOKOGAWATS1000TESTER/M-signal20042
20080714t1W08ADVANTESTT5365Tester/Memory19941
20080714t1W07ADVANTESTT5365Tester/Memory19951
20080714t1W06ADVANTESTT5365Tester/Memory19961
20080714t1W05ADVANTESTT5365Tester/Memory19951
20080714t1W04ADVANTESTT5365ATester/Memory19961
20080714t1W03ADVANTESTT5365ATester/Memory19961
20080714t1W02ADVANTESTT5365Tester/Memory19961
20080714t1W01ADVANTESTT5365Tester/Memory19941
20080711t2L01YOKOGAWATS6000Tester20004
20080711t1L01ADVANTESTT5581Tester/Memory19961
20080707t2E15AdvantestT3347TesterInq.1
20080707t2E14AdvantestT6673TesterInq.1
20080707t2E13VERIGY83000TesterInq.7
20080707t2E12LTXTrilliumTesterInq.3
20080707t2E11LTXDELTA-STETesterInq.9
20080707t2E10LTXFusion CXTesterInq.2
20080707t2E09CredenceOctetTesterInq.3
20080707t2E08CredenceQuartetTesterInq.6
20080707t2E07CredenceMT1101TesterInq.5
20080707t2E06CredenceSC212TesterInq.1
20080707t2E05CredenceDuo/SXTesterInq.10
20080707t2E04TeradyneJ971SPTesterInq.5
20080707t2E03TeradyneA585TesterInq.2
20080707t2E02TeradyneA575TesterInq.5
20080707t2E01TeradyneTigerTesterInq.3
20080627t1W01LTXE100Tester19941
20080620t2K02ADVANTESTT5581CTester/MemoryInq.1
20080620t2K01ADVANTESTT5581DTester/MemoryInq.1
20080616t1E01ADVANTESTT5771Tester20032
20080603t2N02SchlumbergerS21Tester19982
20080603t3N01HITACHIHA5060Tester19986
20080603t3N02ADVANTESTT5365Tester19974
20080603t3N05MULTITESTSOP28F.T TESTER HANDLER19971
20080605t1E03TERADYNEJ996FATesterInq.2
20080605t1E04ADVANTESTT5335PTesterInq.3
20080415t1B01ShibasokuS230Tester20034
20080414t3H01YokogawaTS670Tester20051
20080227t3W03CredenceKalosTester
(for NAND/NOR/NVM etc.)
20051
20080227t3W02CredenceKalosTester
(for NAND/NOR/NVM etc.)
20041
20080227t3W01CredenceKalosTester
(for NAND/NOR/NVM etc.)
20021


TEST: Prober
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20080822t1L006TSKUF200SProber20021
20080822t1L005TSKUF200Prober20001
20080822t1L004TSKUF200Prober20001
20080822t1L003TSKUF200Prober19981
20080822t1L002TSKUF200Prober20001
20080822t1L001TSKUF200Prober20001
20080801t0L05TSKA-PM-90AProber19982
20080801t0L04TELP-8Prober19972
20080616t1E02TSKUF200AProber20034
20080613t2Y02 Electroglas 2001XA Prober 1996 1
20080605t1E01TELP-8 XLProberInq.4
20080605t1E02TSKA-PMK-90AProberInq.6


TEST: Handler
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20080714t1W13ADVANTESTM6841HANDLER19951
20080714t1W12ADVANTESTM6841HANDLER19951
20080714t1W11ADVANTESTM6841HANDLER19931
20080714t1W10ADVANTESTM6841HANDLER19961
20080714t1W09ADVANTESTM6841HANDLER19951
20080711t1L03ADVANTESTM6741AHandler19971
20080711t1L02ADVANTESTM6741AHandler19971
20080704t2W03ADVANTESTM3841AHandlerInq.1
20080704t2W02MiraeMR5400HandlerInq.1
20080618t1K01ADVANTESTM7521AHandlerInq.1
20080613t2Y03K&S Inq. Handler 1991 1
20080603t2N01E&R eng.301Handler19971
20080603t3N03ADVANTESTM6862DHandler M6862D20051
20080603t3N04SEMIJESSInq.HANDLER 19991
20080603t3N06MULTITESTMT8589HANDLER SOP450 SS19981
20080603t3N07MULTITESTInq.MT8589 DUALSIT HANDLER19991


TEST: Other
TTC ID MAKER MODEL DESCRIPTION VIN. QTY INQ.
20080828t2K002Tektronix370Curve TracerInq.1
20080813t1D04cosmicInq.Panel's monoclome
color evaluation tool
20051
20080813t1D03HP(Agilent)437BPower Meter19971
20080813t1D02Rohde
& Schwarz
SMHU58Signal GeneratorInq.1
20080813t1D01Leader
Electronics
LG 3801DVB-T SIGNAL GENERATOR20041
20080801t4L03RVSIGS-7100BGA Inspection system20002
20080711t5L06Acqiris732901Measurement System20031
20080711t5L05Sun Micro.Ultra 60Work Station19981
20080711t5L04WAVETEKMODEL193Signal Generator19851
20080711t5L03TektronixTEK2465BDVOsciloscope19911
20080711t5L02Toyo Corp.SMB200Smart-Bit system20011
20080711t5L01HP16500BLogic Anlyzer19961
20080619t1H01Agilent(HP)54120AOsciloscope19891
20080619t1H02Agilent(HP)54120BOsciloscope19891
20080619t1H03RVSIGS-7100BGA Inspection system20001
20080613t2Y05Agilent(HP) 8753E Network Analyzer 2002 1
20080613t2Y04Agilent(HP) 8753E Network Analyzer 1999 1
20080613t2Y01Plumfive 2001CXT TEG Probe 1998 1
20080603t2N03Top Forward
service
TFS2700laser scan19972
20080603t2N04Top Forward
service
TFS2700laser scan19981
20080603t2N05Top Forward
service
TFS-200lead scan19971
20080603t2N06SEMIJESSST-200RTape&reel19991
20080603t2N07SEMIJESSST-200RTape&reel20011
20080603t2N08JEC1600CBurn-in Oven19971
20080603t2N09ADEC7056DCBurn-in Oven19973
20080603t3N08JS-400RSOJ40OPEN/SHORT loader19981
20080603t3N09MULTITEST8704Iloader-MULTITEST19982
20080605t1E05ESI9350Laser RepairInq.1
20080605t1E06AEHRMTX-30000PBurn-in and TestInq.1
20080605t1E07KEITHLEYS300Paranmetric TestInq.2
20080418t1P39KATOSP-61NX-A-STemp-cycle Tester19992
20080418t1P38MACOInq.RF Handler20001
20080418t1P37Venture KogyoR2123MRF Handler19982
20080418t1P36Inq.Inq.RF Tester19961
20080418t1P35ADVANTESTUniversal MPXPre Amplifier19991

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