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棗ｹ乱 ｴ復 ｬｸ攪株 ｩ肥攵 尖株 剩 +81-3-3344-5540 ｡ 硫攷｣ｼ亨ｸｰ ｰ罷檮笈共.
| TTC ID | 懍｡ｰ羅ｲｴ | 菩享 | 宙ｪ繝ｻぎ桝 | 硫享 | 俯汢 | Product | |
| 1ASSphiM8807 | PHILIPS | Parallel configuration | assy: Controlled OL / TF Life Test | 2004 | 1 | ||
| 1ASSweiM8806 | WEISS TECHNIK | TS 130 | assy: Temperature Test Chamber | 2004 | 1 | ||
| * | 2INSsofR1455 | Softex | SFX-100 | Inspection/X-ray | 2006 | 1 | |
| * | 2SOLmulC897 | MULTICORE | MUST SYSTEM II | Soldering test | Inq. | 1 | |
| * | 5EDSoxfP2730 | Oxford | 7421 | EDS | Inq. | 1 | |
| * | 5ELEadvV3927 | ADVANTEST | R6441A | Elec: Digital meter | Inq. | 1 | |
| * | 5ELEadvV3942 | ADVANTEST | TR-6845 | Elec: Digital meter | Inq. | 1 | |
| * | 5ELEagiP2668 | Agilent | 1671G | Elec: Logic Analysis | Inq. | 1 | |
| * | 5ELEagiP2669 | Agilent | 16702B | Elec: Logic Analysis | Inq. | 1 | |
| * | 5ELEagiP2674 | Agilent | 1670G | Elec: Logic Analysis | Inq. | 1 | |
| * | 5ELEagiP2670 | Agilent | E8408A VXI mainframe 4slot | Elec: Signal Analysis | Inq. | 1 | |
| * | 5ELEagiP2682 | Agilent | N4220 | Elec: Analysis Prober | Inq. | 1 | |
| * | 5ELEagiA1713 | Agilent | N8973A | Elec: Noize Anaiyzer | Inq. | 1 | |
| * | 5ELEamaV3909 | AMA Optoelectronics | SLM-75T | Ele: Integrating sphere | 2014 | 1 | |
| * | 5ELEanrL470 | Anritsu | MG44A | Elec: Oscillator | Inq. | 1 | |
| * | 5ELEanrP1308 | Anritsu | MS2691A | Elec: Spectrum Analyzer | Inq. | 17 | |
| * | 5ELEastV3922 | ASTRO | VG-828D | Elec:Signal Generator | Inq. | 1 | |
| * | 5ELEastV3923 | ASTRO | VG-845 | Elec:Signal Generator | Inq. | 3 | |
| * | 5ELEgwV3929 | GW | GDM-8145 | Elec: Digital meter | Inq. | 2 | |
| * | 5ELEgwV3932 | GW | GDM-8145 | Elec: Digital meter | Inq. | 3 | |
| * | 5ELEgwV3939 | GW | GDM-8045 | Elec: Digital meter | Inq. | 1 | |
| * | 5ELEgwV3940 | GW | GDM-8145 | Elec: Digital meter | Inq. | 4 | |
| * | 5ELEhpV3914 | HP | 16500C | Elec: Logic Analyzer | Inq. | 1 | |
| * | 5ELEhpV3915 | HP | 3488A | Elec:Frame controller | Inq. | 1 | |
| * | 5ELElecP2676 | Lecroy | Bus doctor USB1.1 and 2.0 Adaptor USB BOX | Elec: Analyzer | Inq. | 1 | |
| * | 5ELElecP2675 | Lecroy | CATC3 Bus doctor DR−108−FIT−USB | Elec: Analyzer | Inq. | 1 | |
| * | 5ELEnfV3920 | NF | WF1946B | Elec:Signal Generator | Inq. | 1 | |
| * | 5ELErheC536 | Rheometric Scientific | RDA III | Elec: Dynamic Analyzer | 2001 | 1 | |
| * | 5ELEsanL450 | Sansei | SCI-308A | Elec: Oscillator | Inq. | 1 | |
| * | 5ELEsimV3926 | SIMCO | FMX-003 | Electrostatic tester | Inq. | 1 | |
| * | 5ELEtekP853 | Tektronix | TEK576 | Elec: Curve Tracer | Inq. | 1 | |
| * | 5ELEtekP854 | Tektronix | TEK176 | Elec: Curve Tracer | Inq. | 1 | |
| * | 5ELEtopV3943 | TOPWARD | 1330 | Elec: Digital meter | Inq. | 1 | |
| * | 5INSchrV3941 | Chroma | 19073 | Inspection: Pressure tester | Inq. | 1 | |
| 5INSchrV3937 | Chroma | Inq. | Inspection: Pressure tester | Inq. | 1 | ||
| * | 5MEAolyP3232 | Olympus | AR2060 | Measure: Line width/MCD | 2012 | 1 | |
| * | 5OTHas N249 | AS ONE | HS-50D | Other: Magnetic Stirrer | Inq. | 1 | |
| * | 5OTHespC537 | ESPEC | TSB-2 | Other: Thermal Shock Chamber | 1999 | 1 | |
| * | 5OTHfukL414 | FUKUDA | MSX-5086 | Other: Leak Detector | Inq. | 1 | |
| * | 5OTHhitP4814 | Hitachi | I-20 MI-SCOPE-120 | Other: Ultrasonic scan analyzer | Inq. | 1 | |
| 5OTHinqA924 | Inq. | Inq. | Other: RPT | 2013 | 1 | ||
| 5OTHinqA931 | Inq. | Inq. | Other: Storage facility | 2013 | 1 | ||
| * | 5OTHinqA922 | Inq. | JTXBJ-075 | Other: Inq. | 2010 | 1 | |
| * | 5OTHjadV3938 | JADEVER | LPWN-1530 | Other: Elec. Balance For Analysis | Inq. | 1 | |
| 5OTHmitL497 | Mitutoyo | Inq. | Other: Cage Block | Inq. | 1 | ||
| * | 5OTHmitL878 | Mitutoyo | PJ300 302-926 | Other: Projector | Inq. | 1 | |
| * | 5OTHnikT982 | Nikon | V-12 | Other: Projector | 1987 | 1 | |
| * | 5OTHr&kP1311 | R&K | AA160-RS | Other: RF Power Amplifier | Inq. | 16 | |
| * | 5OTHrobE5006 | ROBERT | RO-27 | Other: Aging machine | 2001 | 3 | |
| * | 5OTHshiK1419 | Shimadzu | MSE-4000 | Other: Leak Detector/He | 1998 | 1 | |
| * | 5OTHta V3566 | TA Instruments | DSC-Q20 | Other: Differential Scanning Calorimeter | Inq. | 1 | |
| * | 5OTHta V3567 | TA Instruments | DSC-Q10 | Other: Differential Scanning Calorimeter | Inq. | 1 | |
| * | 5OTHtekR3955 | Teknologue | ER8940A | Other: Tester | Inq. | 1 | |
| * | 5OTHulvL492 | ULVAC | GI-PRAY | Other: Vacuum Meter | Inq. | 1 | |
| * | 7OTHagiP1310 | Agilent | 11713A | Other: Switch Driver | Inq. | 17 | |
| * | 7OTHkatS911 | KATO | SP-41NX | Other: Thermal shock chamber | Inq. | 1 | |
| * | 7OTHtoaL440 | TOA Elec. | SM-21E | Other: Super Nego Hmmeter | Inq. | 1 | |
| * | 7SUB3i P3224 | 3i SYSTEMS | HS-45015 | Sub: AOI | 2012 | 1 | |
| * | 9BONrheS1902 | Rhesca | PTR-10 | Bond Tester | 1998 | 1 |
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