TTC Trust Technology Corporation

、滝ウ 棗ケ 簿ウエ - 梵 カ宙(5in. 擽葺) - ク。 - 護侃敢 棗ケ(寇ウオ)

棗ケ乱 エ復 ャク攪株 ゥ肥攵 尖株 剩 +81-3-3344-5540 。 硫攷」シ亨クー ー罷檮笈共.

TTC ID 懍。ー羅イエ 菩享 宙ェ繝サぎ桝 硫享 俯汢 Product
CleInInA39454 Inq. Inq. Cleaning device 2010 1
* E4De-FUKMS36686 FUTEK KMD-40C De-porcelain Inq. 1
* E4LeaFUMSL37395 FUKUDA MSX-5086 Leak Detector 2007-2008 4 Crystal Device/Electronic component
* E4LiqAEATS38950 AETEC ATSEL-720-2S Liquid Temperature Shock Tester Inq. 1
* E4MagASHSN36695 AS ONE HS-50D Magnetic Stirrer Inq. 1 Electronic component
* E4MEMSPC4W37564 SPEA C430MX EG100H +RTA336EG MEMS Tester with Rate Table 2013 1 Electronic components/6 inch/MEMS
* E4SluInDTA36687 Inq. DT1200 Slurry Particle Distribution Analysis Inq. 1
E4TapCNInL37496 CNC Inq. Tape Remove Inq. 1 Electronic components/crystal device
* E4TemSaSXL37392 Sanseidenshi SX-5187 Temperature Inspection/SMD Quartz Inq. 1 Crystal Device
* E4TheESTSC37721 ESPEC TSB-2 Thermal Shock Chamber 1999 1
* E4VacULGIL37495 ULVAC GI-PRAY Vacuum Meter Inq. 1 Electronic components/crystal device
E4VolYEInL37497 YEW Inq. Voltmeter(DC) Inq. 1 Electronic components/crystal device
* G0W39327 G0P10-30 2004 1
HigGiInA39453 Giant Force Instrument Enterprise Inq. High / low temperature test equipment 2012 1
* InJTA39444 Inq. JTXBJ-075 2010 1
* M9BGAMEMSW41122 MEISHO MS-9000GTIR BGA Rework Station 2011 1
PerInInG39502 Inq. Inq. Peroxide Inq. 1
RPTInInA39447 Inq. Inq. RPT 2013 1
StoInInA39455 Inq. Inq. Storage facility 2013 1
* X1ThiMI54G36508 MITUTOYO 543-391B Thickness Gauge Inq. 1