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､滝ｳ 棗ｹ 簿ｳｴ - 梵 ｶ宙(5in. 擽葺) - ｸ｡ - ｶ/ｴｰｰｸｰｸｰ
棗ｹ乱 ｴ復 ｬｸ攪株 ｩ肥攵 尖株 剩 +81-3-3344-5540 ｡ 硫攷｣ｼ亨ｸｰ ｰ罷檮笈共.
| TTC ID | 懍｡ｰ羅ｲｴ | 菩享 | 宙ｪ繝ｻぎ桝 | 硫享 | 俯汢 | Product | |
| 5ELEanrA9025 | Anritsu | MT9810A | Elec: Optical Test Set | Inq. | 1 | ||
| 5ELEanrA9026 | Anritsu | MT9810A | Elec: Optical Test Set | Inq. | 1 | ||
| 5ELEhpA9027 | HP | 8594E | Elec: Spectrum Analyzer | Inq. | 1 | ||
| * | 5ELEhpL495 | HP | 87510A | Elec: Grain phase analyzer | Inq. | 1 | |
| * | 5ELEperC808 | PerkinElmer | AANALYST 200 | Elec: Spectrometer | Inq. | 1 | |
| * | 5ELEperA2904 | Perkin Elmer | SIMAA6000 | Elec:Atomic absorption spectrometer | Inq. | 1 | |
| 5INSadvK11985 | Advantest | R3132 | Ins: Spectrum Analyzer | 2001 | 1 | ||
| 5INSagiQ12676 | Agilent | 7500 series | insp: ICP-MS | Inq. | 1 | ||
| 5INScamH12802 | Camtek | Falcon 620plus | Inspection: Wafer AOI | 2008 | 1 | ||
| 5INScmiG12720 | CMIt | SAPPAS -V5-plus | Insp: PSS AOI | 2016 | 2 | ||
| 5INScmiG12721 | CMIt | SAPPAS-V7 | Insp: PSS AOI | 2018 | 1 | ||
| 5INSdinN8274 | Ding Jing | VM-200 | Inspection/Precision two-dimensional visual | Inq. | 2 | ||
| * | 5INSdklR168 | DKL | RU-700 | Inspection: Review/Defect | 1995 | 1 | |
| 5INSeikQ8309 | EIKO007/909 | L0011Lamp.115V.PTC | Insp: EpimetU lamp/125V 250W | Inq. | 20 | ||
| * | 5INSeldC526 | ELDIM S.A. | XL88 | Ins: Contrast Machine | 2006 | 1 | |
| * | 5INShamE4962 | Hamamatsu | C9334-01etc | Ins: FFP measurement unit | Inq. | 1 | |
| 5INShitQ12835 | Hitachi | LS-6030 | Inspection: Wafer Surface Inspection System | Inq. | 1 | ||
| 5INShitQ6855 | Hitachi | U-2000 | Insp: spectrophotometer | Inq. | 1 | ||
| 5INShitQ6856 | Hitachi | U-2010 | Insp: spectrophotometer | Inq. | 1 | ||
| 5INShitQ6852 | Hitachi | Z-5310 | Insp: spectrophotometer/flame | Inq. | 1 | ||
| 5INShitQ6853 | Hitachi | Z-5010 | Insp: spectrophotometer/Zeeman | Inq. | 1 | ||
| * | 5INShorR169 | Horiba | EMAX-5770 | Inspection: X-ray Microanalyxer | 1995 | 1 | |
| 5INSjaiQ8597 | JAI | JHS-100 | Insp.: Purge & Trap Sampler | Inq. | 1 | ||
| * | 5INSjdsP5183 | JDSU | RM3750 | Ins: Optical Back Reflection Meter | Inq. | 1 | |
| 5INSkeyQ7586 | Keyence | CV-X290A | Insp: vision sensor | 2018 | 2 | ||
| 5INSklaP6171 | KLA / TENCOR | eS32 | Inspection: Electron-beam/ Wafer | 2007 | 1 | ||
| 5INSklaA6671 | KLA-Tencor | SFS 7700 | insp: Particle inspection system | 1994-1996 | 4 | ||
| 5INSklaG12723 | KLA | ZETA-300 | Insp: Optical profiler/3D | 2016 | 1 | ||
| 5INSklaG12724 | KLA | ZETA-200 | Insp: Optical profiler/3D | 2010 | 1 | ||
| * | 5INSkonS4414 | Konica Minolta | CS-2000A | Insp: Spectroradiometer | 2014 | 1 | |
| 5INSmicM12844 | Microvision | 998i | Inspection: Scanning system | Inq. | 1 | ||
| * | 5INSnewP5186 | Newport | 708 8-Channel | Ins: Butterfly Fixture | Inq. | 2 | |
| 5INSnikP12754 | Nikon | NWL-860 | Inspection: wafer | Inq. | 1 | ||
| 5INSnikA6257 | NIKON | OPTISTATION-3A | Inspection: Wafer | Inq. | 4 | ||
| 5INSnikA12607 | NIKON | OST-3-2F | Inspection: wafer | Inq. | 2 | ||
| * | 5INSoxfA4595 | oxford | Aztec X-Max 80T | Insp: EDS for TEM | 2016 | 1 | |
| 5INSparG11826 | PARMI | 3D-XCEED | Inspection: AOI | Inq. | 1 | ||
| * | 5INSperP5176 | Perkin Elmer | Lambda 900 | Ins: Spectrometer | Inq. | 1 | |
| 5INSperP12620 | PerkinElmer | PinAAcle 900F | Insp: Spectrometer/Atomic absorption | Inq. | 1 | ||
| 5INSqesG6416 | QES | DIS-8000 | Inspection: Optical | 2010 | 1 | ||
| 5INSrsvP9029 | RSVI Inspection | WS-3800 | Inspection: wafer | 2008 | 1 | ||
| 5INSrudA9992 | Rudolph | NSX320 | INS:AOI | 2017 | 1 | ||
| 5INSsecG7721 | SEC | X-EYE 3000A | Inspection machine | 2007 | 1 | ||
| * | 5INSseiC807 | Seiko | SEA1000A | Inspection: XRF | Inq. | 1 | |
| 5INSshiQ8842 | Shimazu | EDX-800HS2 | Inspection: EDX | Inq. | 1 | ||
| 5INSshiE7667 | SHIMAZU | SMX-100 | Inspection: X-ray | 2001 | 1 | ||
| 5INSshiQ9883 | Shimadzu | UV-2400 | INS:spectrophotometer | inq | 2 | ||
| 5INSsurL12808 | SURUGA SEIKI | YS-1100 | Insp: YAG Welding Alignment System | Inq. | 1 | ||
| * | 5INStosS4405 | Toshiba itc | TOSMICRON 6130FP | Inspection:X-ray | Inq. | 1 | |
| 5INSwerL6625 | Werth Messtechnik | Scope Check 200 3D CNC | Insp: 3D-CNC multisensor CMM | 2002 | 1 | ||
| 5INSyokQ7519 | Yokogawa | AQ2105 | Ins: Multi meter | 1988 | 1 | ||
| * | 5OTHinqQ155 | Inq. | LTA-330A | Other: Wafer Lifetime Measuring/5in. | Inq. | 1 | |
| * | 5OTHmatC909 | Matsuzawa | MMT-X7A | Other: Hardness Tester | Inq. | 1 | |
| * | 5OTHnikL779 | Nikon | 6D | Other: Autocollimator | Inq. | 2 | |
| * | 5OTHpeaL778 | Pearl | AC-140F | Other: Autocollimator | Inq. | 1 | |
| * | 5OTHsemR338 | SEMILAB | WT-85 | Other: Life time measuring | Inq. | 1 | |
| * | 7OTHintS2011 | Inter Action | IA-OPT026W | Other: Light source for image sensor test | Inq. | 1 |
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