TTC Trust Technology Corporation

、滝ウ 棗ケ 簿ウエ - 梵 カ宙(5in. 擽葺) - ク。 - カ/エーークークー

棗ケ乱 エ復 ャク攪株 ゥ肥攵 尖株 剩 +81-3-3344-5540 。 硫攷」シ亨クー ー罷檮笈共.

TTC ID 懍。ー羅イエ 菩享 宙ェ繝サぎ桝 硫享 俯汢 Product
* X1AutNi6DL38874 Nikon 6D Autocollimator Inq. 1
* X1AutNi6DL40844 Nikon 6D Autocollimator 1998 1
* X1AutPeACL38873 Pearl AC-140F Autocollimator Inq. 1
* X1DefDKRUR36242 DKL RU-700 Defect Review Unit 1995 1
* X1DenKEDAG36520 KEM DA-130N Density Hydrometer Inq. 1
* X1FlaACFlA41005 ACTIVE Flat Master Flatness testing equipment 2011 1
* X1FlaTrFlA41006 Tropel Flat Master Flatness meter 2011 1
* X1GasGO81A35883 GOW-MAC 816 Gas Analysis Inq. 1
* X1HarMaMMC39301 Matsuzawa MMT-X7A Hardness Tester Inq. 1
* X1LifSEWTR37174 SEMILAB WT-85 Life time measuring Inq. 1
* X1NonDiGPW38994 Digitec GPC-510ZXY Non-contact 3D Measurement Inq. 1 Measuring instrument
* X1parHiANR36706 High-Voltage Enginiaring AN-2500 particle accelerator Inq. 1 Analyzer of thin-film composition
* X1SouAAHUG36704 AACHEN HUS-3 Sound pressure meter Inq. 1
* X1SpePeAAC38952 PerkinElmer AANALYST 200 Spectrometer Inq. 1
* X1SpeScECY38996 Scinco ECO1000-S Spectrometer/FT-IR 1998 1
* X1SurTSE-A35534 TSK E-MD-S75A Surface Texture and Contour Analysis 1990 1
* X1SurTSSuA35533 TSK Surfcom 590A Surface texture and Contour Analysis 1996 1
* X1TemCHAHG36703 CHINO AH-3725-N00 Temperature Logger Inq. 1
* X1TinNiOEW38993 Nippon Denshoku OE Tiny Surface Colorimeter Inq. 1 Measuring instrument
* X1visBrLVA35881 BrooKfield LVDV-II+ viscosity analysis Inq. 1
* X1WafInLTQ36193 Inq. LTA-330A Wafer Lifetime Measuring/5in. Inq. 1 Bipolar IC / transistor / diode
* X1WafKLCSA40998 KLA-Tencor CS20R Wafer Insp./Surface 2009 1
* X1XRFSeSEC38951 Seiko SEA1000A XRF Inq. 1
* X1X-rHoEMR36243 Horiba EMAX-5770 X-ray Microanalyxer 1995 1
* Y1ComKLCIW39309 KLA-Tencor CI-T830 Component Inspectors 2016 1