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Trust Technology Corporation |
､滝ｳ 棗ｹ 簿ｳｴ - 梵 ｶ宙(5in. 擽葺) - ｸ｡ - (ｸｰ侠从 導) ｸ｡ 棗ｹ
棗ｹ乱 ｴ復 ｬｸ攪株 ｩ肥攵 尖株 剩 +81-3-3344-5540 ｡ 硫攷｣ｼ亨ｸｰ ｰ罷檮笈共.
| TTC ID | 懍｡ｰ羅ｲｴ | 菩享 | 宙ｪ繝ｻぎ桝 | 硫享 | 俯汢 | Product | |
| 5DIGfluQ7418 | Fluke | 85 SERIESV | Digital multimeter | Inq. | 1 | ||
| 5DIGkeyQ7419 | Keysight | 974A | Digital multimeter | Inq. | 1 | ||
| 5EELcasP11692 | Cascade | REL-4800 | eel: Bump resistance | 2005 | 1 | ||
| 5ELEadcQ7455 | ADC | R6144 | Ele: Programmable DC voltage current generator | Inq. | 2 | ||
| 5ELEadcQ7533 | ADC | R6144 | Ele: Programmable DC voltage current generator | 1996 | 1 | ||
| 5ELEadcQ7534 | ADC | R6144 | Ele: Programmable DC voltage current generator | 2004 | 2 | ||
| 5ELEadcQ7535 | ADC | R6243 | Ele: DC voltage generator | 2000 | 1 | ||
| 5ELEadcQ7495 | ADC | R6452A | Ele: Multi meter | Inq. | 1 | ||
| 5ELEadcQ7497 | ADC | TR6141 | Ele: Programmable DC voltage current generator | Inq. | 1 | ||
| 5ELEadcQ7498 | ADC | TR6143 | Ele: DC voltage generator | Inq. | 1 | ||
| 5ELEadcQ7539 | ADC | TR6143 | Ele: DC voltage generator | 1994 | 2 | ||
| 5ELEadcQ7540 | ADC | TR6150 | Ele: DC voltage generator | 1983 | 1 | ||
| 5ELEadcQ7541 | ADC | TR6150 | Ele: DC voltage generator | 1982 | 1 | ||
| * | 5ELEadvL476 | ADVANTEST | R5361A | Elec: Freq. Counter | Inq. | 1 | |
| 5ELEadvQ7350 | Advantest | R6144 32V/160 A | Ele: Voltage current generator | 1997 | 2 | ||
| * | 5ELEadvL426 | ADVANTEST | TR5821 | Elec: Universal Counter | Inq. | 1 | |
| 5ELEadvQ7460 | Advantest | TR6824 | Ele: Multi meter | Inq. | 1 | ||
| * | 5ELEagiP2673 | Agilent | 89605B | Elec: Module(VXI) | Inq. | 1 | |
| * | 5ELEagiP2672 | Agilent | E1439C | Elec: Module(VXI) | Inq. | 1 | |
| * | 5ELEagiP2671 | Agilent | E8491B | Elec: Module(VXI) | Inq. | 1 | |
| 5ELEaneK8698 | ANELVA | MIG-921 | ele: Ion gauge | Inq. | 4 | ||
| 5ELEanrQ7437 | Anritsu | M-215C | Ele: Attenuator | Inq. | 1 | ||
| 5ELEanrQ6589 | Anritsu | MF1604A | elec: Frequency counter | Inq. | 1 | ||
| * | 5ELEanrL466 | Anritsu | MG545B | Elec: ynthesizer | Inq. | 1 | |
| * | 5ELEanrP1309 | Anritsu | ML2438A | Elec: Power Meter | Inq. | 17 | |
| * | 5ELEanrL430 | Anritsu | ML69A | Elec. Voltmeter | Inq. | 2 | |
| * | 5ELEanrL496 | Anritsu | MS420B | Elec: Network Analyzer | Inq. | 1 | |
| 5ELEcatQ7461 | CATC | USB TRAFFIC GENERETOR | Ele: USB TRAFFIC GENERETOR | Inq. | 1 | ||
| 5ELEeniA9219 | ENI | OEM Series | Ele: RFgenerator | Inq. | 10 | ||
| 5ELEfluQ7415 | Fluke | 83 SERIESV | Ele: Multi meter | Inq. | 1 | ||
| 5ELEfujQ7366 | Fujita | APE904U | Ele: Diode DC energizer | 2008 | 1 | ||
| 5ELEgigQ7478 | GIGA TRONICS | 80301A | Ele: Power sensor | Inq. | 1 | ||
| 5ELEgigQ7515 | GIGA TRONICS | 8542B | elec: Power meter/dual | 2003 | 1 | ||
| * | 5ELEhitP855 | HITACHI | VC-6023 | Elec: Oscilloscope | Inq. | 1 | |
| * | 5ELEhpL427 | HP | 437B | Elec: Power Meter | Inq. | 1 | |
| * | 5ELEhpL465 | HP | 8405A | Elec: Voltmeter | Inq. | 1 | |
| * | 5ELEhpL449 | HP | 8508A | Elec: Vector Voltmeter | Inq. | 1 | |
| 5ELEhpQ8855 | HP | 8752C | Ele: Network analyzer | Inq. | 1 | ||
| 5ELEhpQ8856 | HP | E4425B | Ele: signal generator | Inq. | 1 | ||
| 5ELEinqK8418 | Inq. | AE043-01 | Elec: Resistance Measurement | 2004 | 1 | ||
| 5ELEinqQ7378 | Inq. | Inq. | Ele: Socket resistance meter | 2006 | 1 | ||
| * | 5ELEiwaL443 | Iwatsu | FC-8841 | Elec: Freq. Counter | Inq. | 1 | |
| * | 5ELEiwaL436 | IWATSU | SS-7821 | Elec: Oscilloscope | Inq. | 1 | |
| 5ELEiwaQ7463 | Iwatsu | VOAC7513 | Ele: Multi meter | Inq. | 1 | ||
| 5ELEiwaQ7464 | Iwatsu | VOAC83 | Ele: Multi meter | Inq. | 2 | ||
| 5ELEkenW5826 | Kenwood | G8D-380HB | Elec: Signal generator | Inq. | 1 | ||
| 5ELEkeyQ7518 | Keysight | 89441A | ele: Vector signal analyzer | 1997 | 1 | ||
| 5ELEkeyQ7429 | Keysight | E2373A | Ele: Multi meter | Inq. | 1 | ||
| 5ELEkeyQ7430 | Keysight | E2378A | Ele: Multi meter | Inq. | 1 | ||
| 5ELEkeyQ7528 | Keysight | N5302A/N5343A | ele: DigRF Exerciser | 2010 | 4 | ||
| 5ELEkikQ7427 | Kikusui | DME1500 | Ele: Multi meter | Inq. | 1 | ||
| 5ELEkikQ9132 | Kikusui | TOS8700(10kV[AC/DC]) | ele: Hipot Tester | Inq. | 1 | ||
| 5ELEkyoE12517 | Kyowa riken | K-705RS | elec: Four-probe measuring instrument | 2018 | 1 | ||
| * | 5ELEleaL431 | LEAD | 1MHz | Elec: Freq. Reference | Inq. | 1 | |
| * | 5ELEleaL425 | Leader | LDC-822A | Elec: Freq. Counter | Inq. | 6 | |
| * | 5ELElecP2667 | Lecroy | 9344C | Elec: Oscilloscope | Inq. | 1 | |
| * | 5ELElucR174 | LUCAS LABS | IB420 | Elec: Mass Spectrum Analyzer | 1996 | 1 | |
| * | 5ELElucR175 | LUCAS LABS | IB420 | Elec: Mass Spectrum Analyzer | 1996 | 1 | |
| * | 5ELEmatL446 | Matsunaga | TA-1010 | Elec: Constant-voltage Power Supply | Inq. | 2 | |
| 5ELEmicQ7527 | Micronix | MSA338 | Elec: Spectrum Analyzer | 2005 | 1 | ||
| 5ELEnapK11494 | Napson | RG-80 | Ele: resistance meter | 2002 | 1 | ||
| 5ELEnecQ7368 | NEC | NK-1 | Ele: Static electricity measurement | 2005 | 1 | ||
| 5ELEnecQ7453 | NEC | QB-78F1026-ZZZ | Ele: In-circuit emulator | Inq. | 1 | ||
| * | 5ELEnewP5185 | Newport | 2832C | Ele: Power Meter | Inq. | 2 | |
| 5ELEnidQ8255 | Nidec | R-5520ix | Elec: Insulation inspection | Inq. | 1 | ||
| * | 5ELEnodV3944 | NODAX | AM-342 | Elec: Voltmeter | Inq. | 16 | |
| 5ELEnoiQ7355 | Noiseken | ESS-603003 18KG | Ele: ESD tester | 1984 | 1 | ||
| 5ELEpanK11984 | Panasonic | VP-7725B | Elec: Audio Analyzer | 2001 | 1 | ||
| 5ELEpanK11986 | Panasonic | VP-8311A | Ele: signal generator | 2001 | 1 | ||
| * | 5ELEsanL432 | Sanders | 140A | Elec: CI Meter | Inq. | 3 | |
| * | 5ELEsanL433 | Sanders | 150C | Elec: CI Meter | Inq. | 2 | |
| * | 5ELEsanL459 | Sanders | 200VHF | Elec: CI Meter | Inq. | 1 | |
| * | 5ELEsanL417 | Sansei | AD-8405B | Elec: Phase Meter Adapter | Inq. | 3 | |
| 5ELEsanQ7422 | Sanwa | CD110 | Ele: Multi meter | Inq. | 1 | ||
| 5ELEsanQ7423 | Sanwa | CD770 | Ele: Multi meter | Inq. | 1 | ||
| 5ELEsanQ7444 | Sanwa | PC510 | Ele: Multi meter | Inq. | 3 | ||
| * | 5ELEsanL415 | Sansei | SF-87B | Elec: Freq. Counter | Inq. | 1 | |
| * | 5ELEsanL455 | Sansei | SF-65LA | Elec: Freq. Counter | Inq. | 4 | |
| * | 5ELEspiP2677 | Spirent | For SMA-2000 Parts | Elec: Parts | Inq. | 1 | |
| * | 5ELEspiP2678 | Spirent | For SMB-2000 Parts | Elec: Module-For ML7710 | Inq. | 1 | |
| * | 5ELEspiP2679 | Spirent | For SMB-2000 Parts | Elec: Module-For ML7710 | Inq. | 1 | |
| * | 5ELEspiP2680 | Spirent | For SMB-2000 Parts | Elec: Module-For GX1421A | Inq. | 1 | |
| * | 5ELEtakL441 | Takeda | TR-5142 | Elec: Freq. Counter | Inq. | 1 | |
| * | 5ELEtakL454 | Takeda | TR-5142SN | Elec: Freq. Counter | Inq. | 2 | |
| * | 5ELEtekV3933 | Tektronix | DS3012B | Elec: Oscilloscope | Inq. | 1 | |
| 5ELEtekE11169 | Tektronix | P7225 | ELE:active probe | inq. | 1 | ||
| 5ELEtekQ12822 | Tektronix | TDS1002 | Ele: oscilloscope | Inq. | 1 | ||
| * | 5ELEtekV3934 | Tektronix | TDS 3014B | Elec: Oscilloscope | Inq. | 3 | |
| * | 5ELEtekV3935 | Tektronix | TDS3014 | Elec: Oscilloscope | Inq. | 1 | |
| 5ELEtexQ7425 | Texio | DL-2050 | Ele: Multi meter | Inq. | 5 | ||
| 5ELEtexQ7426 | Texio | DL-2051 | Ele: Multi meter | Inq. | 1 | ||
| 5ELEtexW5831 | Texio | LSG-1050 | Electronic load device | Inq. | 1 | ||
| * | 5ELEtoaL448 | TOA Elec. | FS-1131 | Elec: Synthesizer | Inq. | 2 | |
| * | 5ELEtosL438 | TOSHIBA | SK-110 | Elec: Voltage Regulator | Inq. | 2 | |
| 5ELEwavQ7391 | WaveCrest | SIA-3000 | Ele: Signal Integrity Analyzer | Inq. | 1 | ||
| 5ELEyewL494 | YEW | Inq. | Elec: Voltmeter(DC) | Inq. | 1 | ||
| * | 5ELEyewL445 | YEW | PV-13 | Elec: Vacuumtube Voltmeter | Inq. | 1 | |
| 5ELEyokQ7364 | Yokogawa | 706012-1-D | Ele: FG120 Function Generator | 2005 | 2 | ||
| 5ELEyokQ7477 | Yokogawa | 7544 01 | Ele: Multi meter | Inq. | 2 | ||
| 5ELEyokQ7384 | Yokogawa | AX100 | Ele: Memory Stick Protocol Analyzer | Inq. | 1 | ||
| 5ELEyokQ7387 | Yokogawa | AX220 | Ele: SD card protocol analyzer | Inq. | 1 | ||
| 5OTHadiA11513 | Adixen | ASM182TD | other: 4Helium Leak Detector/4in | Inq. | 1 | ||
| 5OTHadiG10182 | Adixen | ASM GRAPH D+ | OTH:Leak Detector | inq | 2 | ||
| 5OTHamaG10183 | AMAT(Varian) | VSBD302 | OTH:Leak Detector | inq | 1 | ||
| * | 5OTHanrL467 | Anritsu | MG545A | Other: Synthesizer | Inq. | 1 | |
| 5OTHasiL10559 | ASIC | EL-A | OTH: ELECTROLUMINESCENCE TESTER | inq | 2 | ||
| 5OTHasiL11105 | ASIC SHANGHAI | SCSS-EL02 Plus | OTH:EL Tester | inq. | 1 | ||
| 5OTHasmF12354 | ASM | ASM Calibration kit | other: Tester Calibration Kit | Inq. | 1 | ||
| 5OTHb&wQ9958 | B&W TEK inc + Sigma | BWR-20E/55869 | OTH:1064 nm laser | inq | 1 | ||
| 5OTHbroQ8666 | Brookfield | LVDV-2+PRO-CP | other: Viscometer | 2005 | 1 | ||
| 5OTHbscQ7536 | BSC Filters | SH4457 | oth: High pass filter | 2007 | 1 | ||
| 5OTHbscQ7537 | BSC Filters | SH4458 | oth: High pass filter | 2007 | 1 | ||
| 5OTHbscQ7543 | BSC Filters | XN4455 | oth: Notch filter | 2007 | 1 | ||
| 5OTHbscQ7544 | BSC Filters | XN4456 | oth: Notch filter | 2007 | 1 | ||
| 5OTHcanQ7353 | Canon | 850670H-0312 | Other: LABVIEWUPGRADE | 2000 | 1 | ||
| 5OTHcatQ7420 | CATC | Advisor | Oth: USB 2.0 Bus & Protocol Analyzer | Inq. | 1 | ||
| 5OTHcbcQ8667 | CBC | VM-10A-M | other: Viscometer | Inq. | 1 | ||
| 5OTHchoQ6509 | Cho-onpa | UJ-246-1C | other: Wire pulltester | 1991 | 1 | ||
| 5OTHchrA10535 | ChromTech | JA-5103N | OTH:Electronic Balance | 1997 | 1 | ||
| 5OTHcomQ7386 | COMPUTEX | 32M41 | Oth: In-circuit debugger | Inq. | 1 | ||
| 5OTHdagC11018 | DAGE | 2400A | OTH:WIRE PULL TEST MACHINE | 2006 | 1 | ||
| 5OTHdagM11701 | DAGE | 3000 | oth: Wire pull Tester | Inq. | 1 | ||
| 5OTHdagE12518 | Dage/Nordson | SERIES 4000 | Other: Bond tester | 2009 | 1 | ||
| * | 5OTHdatA1714 | Data Systems | ALP-7012LA | Other: LD DRIVER | Inq. | 1 | |
| 5OTHditK6336 | Ditect | RDF-D3 | Other: Hi-speed camera | 2010 | 1 | ||
| 5OTHecoQ11274 | Ecomott | サーモロイドPro Ver１ | OTH:Body temperature screening solution Thermoroid pro | 2020 | 20 | ||
| 5OTHespE11289 | ESPEC | TSA-71H-W | OTH:Thermal Shock Testing | 2008 | 1 | ||
| 5OTHespE11290 | ESPEC | TSA-201S-W | OTH:Thermal Shock Testing | 2006 | 1 | ||
| 5OTHespE7102 | Espec | TSA-71H-W | other: Thermal shock tester | 2001 | 1 | ||
| 5OTHespL12812 | ESPEC | TSA-70L-A | other: Thermal Shock Chamber | Inq. | 1 | ||
| 5OTHetaR5462 | ETAC | NT2031W | Other: Temperature Cycle Chamber | Inq. | 1 | ||
| 5OTHftdF12338 | FTD | 0.8*0.8 TR test socket and socket board | other: PCB Components and Test Station Socket | Inq. | 1 | ||
| 5OTHfujQ9489 | fujita | APE-PWIGBT | OTH:Bias tester | 2010 | 1 | ||
| 5OTHfujQ7342 | Fujita | FTH-100 | other: Tharmalfet tester | 2000 | 1 | ||
| 5OTHhacK9970 | HACH | 2100P | OTH:Turbidimeter | inq | 1 | ||
| 5OTHhayK6048 | Hayashi-Repic | LAA-150UE | other: Light Source | Inq. | 1 | ||
| 5OTHhayK6047 | Hayashi-Repic | Luminar Ace | other: Light Source | Inq. | 1 | ||
| 5OTHhioQ7401 | Hioki | 3127 | Other: Clamp on tester | Inq. | 1 | ||
| 5OTHhioQ10400 | HIOKI | 3158 | OTH:Voltage HiTester | 2007/2010/2013/2015 | 5 | ||
| 5OTHhioQ7501 | Hioki | 3805 | other: High Tester | 2005 | 1 | ||
| 5OTHhioQ9687 | HIOKI | LR8431 | OTH:Memory High Logger | inq. | 1 | ||
| 5OTHhirQ6508 | Hirayama | PC-204RV | other: Pressurecooker | 1990 | 1 | ||
| 5OTHhitQ9488 | Hitachi | EC-45MHPS | OTH:temperature and humidity Testing Chamber | 2010 | 1 | ||
| 5OTHhitQ6481 | Hitachi | ES-76LH | other: Thermal shock tester | 2007 | 1 | ||
| 5OTHhitE9405 | Hitachi Power Solutions | mi-scopeMI-25 | OTH:Ultrasonic imaging equipment | 1997 | 1 | ||
| 5OTHimaE11059 | IMADA | SVF-500NA-SL | OTH:Tensile and Compression Testing | 2004 | 1 | ||
| 5OTHinfA11512 | INFICON | UL1000 | other: 4Helium Leak Detector/4in | Inq. | 1 | ||
| 5OTHinqL11107 | inq. | EL140 | OTH:EL Tester | inq. | 1 | ||
| 5OTHinqK6044 | Inq. | Inq. | other: Depth Gauge | Inq. | 1 | ||
| 5OTHiteQ9490 | iTEC | AP-20-3S-OP/AP-20-3S-BT | OTH:OP tester | 2004 | 2 | ||
| 5OTHjtkF12329 | JTK | JTK-DIG32 | other: Leakage tester | 2015 | 1 | ||
| 5OTHjtkF12330 | JTK | JTK-DIG32 | other: Leakage tester | 2016 | 1 | ||
| 5OTHjtkF12331 | JTK | JTK-DIG32 | other: Leakage tester | 2017 | 1 | ||
| 5OTHjtkF12332 | JTK | JTK-DIG32 | other: Leakage tester | 2017 | 1 | ||
| 5OTHjtkF12333 | JTK | JTK-DIG32 | other: Leakage tester | 2018 | 1 | ||
| 5OTHjtkF12334 | JTK | JTK-DIG32 | other: Leakage tester | 2016 | 1 | ||
| 5OTHjtkF12335 | JTK | JTK-DIG32 | other: Leakage tester | 2016 | 1 | ||
| 5OTHkeyE10774 | Keyence | LC-2101 | OTH:laser displacement meter | inq | 1 | ||
| 5OTHkeyE10775 | Keyence | LC-2210 | OTH:laser displacement meter | inq | 1 | ||
| 5OTHkohQ10897 | Kohzu | K2-200 | OTH:Flatness measuring | inq. | 1 | ||
| 5OTHkokK11685 | Kokusai electric | CX1204 | oth: Exhaust Controller | 1994 | 1 | ||
| 5OTHkurQ8282 | Kurashiki kako | MICRO-ｇ | Other: surface plate | 1991 | 1 | ||
| 5OTHmauQ7505 | MAURY MICROWAVE | 1819B | Oth: Stub tuner | 2005 | 1 | ||
| 5OTHmauQ7395 | MAURY MICROWAVE | 8045C | Oth: Slide screw tuner | Inq. | 2 | ||
| 5OTHmicE7100 | Michinokumachinery | Inq. | Other: strength tester | 2008 | 1 | ||
| 5OTHmicQ7524 | Micronix | MMD850 | oth: Microwave detector | 2005 | 1 | ||
| 5OTHmicQ10038 | Microtrac | MT3100II/SDC | OTH:Particle size distribution analyzer | 2016 | 1 | ||
| 5OTHminQ7399 | MINI-CIRCUITS | ZHL-4240 | Oth: High frequency amplifier | Inq. | 1 | ||
| 5OTHmisQ10787 | MISUMI | MSND2.3-30 | OTH:Temperature Sensor | inq | 1 | ||
| 5OTHmisQ10790 | MISUMI | MSND2.3-30 | OTH:Temperature Sensor | inq | 1 | ||
| 5OTHmitE10777 | Mitutoyo | CD-45C | OTH:vernier calipers | inq | 1 | ||
| * | 5OTHmitR172 | MITUTOYO | ID-C112C | Other: Digimatic Indicator | Inq. | 1 | |
| 5OTHmitM9533 | MITUTOYO | inq. | OTH:CNC VISION MEASURING SYSTEM | inq. | 1 | ||
| 5OTHmitQ12053 | Mitutoyo | LEGEX574 | Other: CNC Image measurement /3D | 2007 | 1 | ||
| 5OTHmolA12614 | Molecular Analytics | 2427052-8 | other: Multiopoint Sampling System | Inq. | 1 | ||
| 5OTHmt/Q7356 | MT/Hitachi-hitech | Inq. | Other: EEPROM meas. board | 2010 | 1 | ||
| 5OTHmulF12361 | Multitest | BGA1.6*1.6 test kit | Other: Kit | Inq. | 1 | ||
| 5OTHmulF12347 | Multitest | TEST KIT for 0.8*0.8 | Other: Kit | Inq. | 1 | ||
| 5OTHmurQ9884 | Murakamishikisaigijutsu | HM-150 | OTH:haze meter | inq | 2 | ||
| 5OTHnarQ7500 | NARDA | 3752 | Oth: PHASE SHIFTER | 2005 | 1 | ||
| 5OTHnfQ7499 | NF | 1650 | Oth: Pattarn synthesizer | 1994 | 1 | ||
| 5OTHnfQ7382 | NF | CK1620 | Oth: Clock synthesizer | Inq. | 2 | ||
| 5OTHnfQ7424 | NF | CK1615 | Oth: Clock synthesizer | Inq. | 2 | ||
| 5OTHnfQ7393 | NF | ES2000B | Oth: Power environment simulator | Inq. | 1 | ||
| 5OTHnfQ7394 | NF | ES2000S | Oth: Power environment simulator | Inq. | 1 | ||
| 5OTHnikK10431 | Nikon | V-12 | OTH:projector | 1985 | 1 | ||
| 5OTHnikN8278 | Nikon | V-128 | other: Profile projector | Inq. | 1 | ||
| 5OTHnikP12630 | Nikon | VMR-H3030 | Other: CNC measurement | 2008 | 1 | ||
| 5OTHnikM11704 | Nikon | VMZ-R3020 | Other: CNC Image measurement /QV | Inq. | 1 | ||
| 5OTHnikM12856 | Nikon Metrology | VMZ-K6555 | Other: Confocal Video Measuring System | Inq. | 1 | ||
| 5OTHnorF10933 | Nordson | DAGE4000 | OTH:BOND TESTER | inq. | 2 | ||
| 5OTHnskP6424 | NSK | HM-90 | other: Micron Depth Tester | Inq. | 1 | ||
| 5OTHogaQ9442 | Ogasawara Precision | GRT-04 | OTH:Gear Meshing Tester | inq. | 1 | ||
| 5OTHohaQ8488 | OHAUS | EX2202G | oth: Electronic scale | Inq. | 2 | ||
| 5OTHorsQ10044 | ORSA | AOS303-445-30 | OTH:Single-mode fiber blue light source | 2016 | 1 | ||
| 5OTHorsQ10045 | ORSA | HPB455-3 | OTH:Multimode Fiber Blue Light Source | 2016 | 1 | ||
| 5OTHotsQ10039 | Otsuka | QE2100 | OTH:Quantum Effect Measurement System | 2016 | 1 | ||
| 5OTHotsN8279 | Otsuka | RETS-1100ML | other: GAP measuring machine | Inq. | 1 | ||
| 5OTHoyoE10059 | OYO | AITOS | OTH:Light Source | inq | 3 | ||
| 5OTHoyoE10078 | OYO | AW1050 | OTH:light source | inq | 1 | ||
| 5OTHoyoK6195 | OYO | AW1050 | other: Light Source | Inq. | 1 | ||
| 5OTHpanB8176 | Panasonic | Panadac944A-210 | Other: Coplanarity check system | Inq. | 1 | ||
| 5OTHpeiL11110 | Peide | EL-1.4MD-AS | OTH:EL Tester | inq. | 1 | ||
| 5OTHproQ7365 | Production Technology Center Kyushu | Inq. | Other: Substrate strength tester | 2008 | 1 | ||
| 5OTHproQ9540 | PROTEC | MTG-08A | OTH:Metal mask tension gauge | inq. | 1 | ||
| 5OTHquiL11111 | Quicksun | 820A | OTH:Power Simulation Test | inq. | 1 | ||
| 5OTHrheE9815 | RHESCA | PTR-10 | OTH:Bond tester | 1996 | 1 | ||
| 5OTHrheL12805 | Rhesca | PTR-1000 | Other: Bonding tester | Inq. | 1 | ||
| 5OTHrheQ12072 | Rhesca | PTR-1000 | oth: Bonding tester | 2001 | 1 | ||
| 5OTHrohQ7398 | Rohde & Schwarz | Inq. | Oth: Radio tester | Inq. | 1 | ||
| 5OTHsanQ10742 | SANYU | SC-701C | Other: Carbon Coater | Inq. | 1 | ||
| * | 5OTHsanL416 | Sansei | SDC-1040 | Other: Digital comparator | Inq. | 5 | |
| * | 5OTHsanL477 | Sansei | SS-868E | Other: Universal Crossing Counter | Inq. | 3 | |
| 5OTHsarK9969 | Sartorius | CP224S | OTH:electronic balance | inq | 1 | ||
| 5OTHsemQ12788 | Semiconductor Diagnostics Inc | FAaST 230-SPV | other: SPV measuring | 2008 | 1 | ||
| 5OTHshiQ12823 | SHIMADZU | AUY200 | other: Analytical Balance | Inq. | 1 | ||
| 5OTHshiE7281 | Shimazu | EHF-FB10KN-10LA | Other: Servo Parsa | 2000 | 1 | ||
| 5OTHshiA5427 | SHIMADZU | MST-I | other: Micro Autograph | Inq. | 1 | ||
| 5OTHshiQ10756 | SHIMADZU | SMX-1000 | Other: X-Ray system | Inq. | 1 | ||
| 5OTHshiE10780 | SHINDAIGO | UV225 | OTH:vacuum packaging machine | inq | 1 | ||
| 5OTHsigQ10043 | SIGMA KOKI | inq | OTH:Auto-rotating stages and controllers | 2021 | 1 | ||
| 5OTHsigQ9959 | Sigma Koki | SGSP20-20+SHOT202 | OTH:Autostage+ stage controller | inq | 3 | ||
| 5OTHsonQ7531 | SONY | Inq. | oth: DD digital photo camera | 1994 | 1 | ||
| * | 5OTHtakL437 | Takeda | TR4120 | Other: Tracking Scope | Inq. | 1 | |
| 5OTHtekP12637 | TEKSCAN | I-Scan System | other: Pressure Mapping System | 2016 | 1 | ||
| 5OTHtekQ7352 | Tektronix | STC399X-99158-7 | Other: GPIB controller | 2000 | 1 | ||
| 5OTHtheA12137 | Thermo Fisher | DX600 | Other: Metrology system | 2002 | 1 | ||
| 5OTHtroA10317 | Tropel | FM200 | OTH:Flatness measuring | inq | 1 | ||
| 5OTHtskQ5883 | TSK | EM-21 | other: Tester | 2000 | 1 | ||
| 5OTHxyzP10206 | XYZTEC | CONDOR 70 | OTH:Wire pull Tester | inq | 1 | ||
| 5OTHxyzP10207 | XYZTEC | CONDOR 100 | OTH:Wire pull Tester | inq | 1 | ||
| 5OTHyokQ7407 | Yokogawa | 4177-100-11 | Oth: μR100 RBI recorder | Inq. | 1 | ||
| 5OTHyokQ7421 | Yokogawa | AX220 | Oth: SD card protocol analyzer | Inq. | 1 | ||
| 5OTHyokA12598 | YOKOGAWA | UR100 | other: Chart Recorder | Inq. | 1 | ||
| 5OTHz.cG12092 | Z.C. AUTO | TC-485 | other: Ceramic disc appearance inspection | Inq. | 1 |
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