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､滝ｳ 棗ｹ 簿ｳｴ - ｰ俯巡ｲｴ 6in. - ｸ｡ - ｶ/ｴｰｰｸｰｸｰ
棗ｹ乱 ｴ復 ｬｸ攪株 ｩ肥攵 尖株 剩 +81-3-3344-5540 ｡ 硫攷｣ｼ亨ｸｰ ｰ罷檮笈共.
| TTC ID | 懍｡ｰ羅ｲｴ | 菩享 | 宙ｪ繝ｻぎ桝 | 硫享 | 俯汢 | Product | |
| 5 INnikA12669 | Nikon | OPTISTATION | Inspection: Wafer/5in | Inq. | 1 | ||
| 5INSasmA12159 | ASML | eScan310 | Inspection: Wafer | 2008 | 1 | ||
| 5INSge L12819 | GE PHOENIX | NANOMEX 160 | Insp: X-Ray Inspection System | Inq. | 1 | ||
| 5INShitA12136 | Hitachi | IS3000 | Inspection: Dark field | 2006 | 1 | ||
| 5INShitA12160 | Hitachi | LS6800 | Inspection: Wafer surface | 2008 | 1 | ||
| 5INShitK8040 | Hitachi | PD-2000 | Inspection: Reticle Surfscan | 1989 | 1 | ||
| * | 5INShitQ156 | HITACHI | WI-890 | Inspection/Wafer Visual /6in. | 1997 | 1 | |
| 5INShmiA12130 | HMI | eScan310 | Inspection: Wafer | 2008 | 1 | ||
| 5INShpA5559 | HP | 4062UX | Insp: Parametric Tester | Inq. | 1 | ||
| 5INSinqQ11838 | Inq. | Inq. | Inspection: Wafer/4in. | Inq. | 1 | ||
| 5INSklaA11141 | KLA | 7500 | Inspection: Surfscan | Inq. | 1 | ||
| 5INSklaA6256 | KLA-TENCOR | 7600 | Inspection: Surfscan | Inq. | 2 | ||
| 5INSklaA10318 | KLA | Candela CS10R | Inspection equipment | inq | 1 | ||
| 5INSklaA12864 | KLA Tencor | Candela8720 | Inspection: Surface Defect/4-6in | 2017 | 1 | ||
| 5INSklaG12093 | KLA Tencor | Candela CS10R | Inspection/Defect | Inq. | 1 | ||
| 5INSklaA10210 | KLA Tencor | CS920 | Inspection device | 2015 | 1 | ||
| 5INSklaG12514 | KLA Tencor | KLA2135 | Inspection/Defect | Inq. | 1 | ||
| 5INSklaP10886 | KLA Tencor | KLA-HRP-P350 | INS:Profile meter | 2009 | 1 | ||
| 5INSklaA5552 | KLA | SURFSCAN 7700 | Inspection: Particle Analyzer | Inq. | 1 | ||
| 5INSmitE11165 | Mitutoyo | M-Plan Apo 5X | INS:microscope objective lens | inq. | 1 | ||
| 5INSmitE11166 | Mitutoyo | M-Plan Apo 10X | INS:microscope objective lens | inq. | 1 | ||
| 5INSmitE11167 | Mitutoyo | M-Plan Apo 20X | INS:microscope objective lens | inq. | 1 | ||
| 5INSmitE11168 | Mitutoyo | M-Plan Apo SL50X | INS:microscope objective lens | inq. | 1 | ||
| 5INSnorM12398 | Nordson | X2.5 | Insp: Auto X-Ray Inspection System | Inq. | 1 | ||
| 5INSnorM12396 | Nordson | XNC-S600 | Insp: Auto X-Ray Inspection System | Inq. | 1 | ||
| 5INSnorM12397 | Nordson | XNC-V600 | Insp: Auto X-Ray Inspection System | Inq. | 1 | ||
| 5INSnorM12451 | Nordson | YTX-X2 | Insp: Auto X-Ray Inspection System | Inq. | 1 | ||
| 5INSosiA5561 | OSI | METRA 2100m | Inspection: Overlay/6" | Inq. | 1 | ||
| 5INSosiA5562 | OSI | METRA II | Inspection: Overlay/6" | Inq. | 1 | ||
| 5INSrudG12510 | RUDOLPH | NSX100 | Inspection/Defect/6in | Inq. | 1 | ||
| 5INSrudL12820 | Rudolph / August | NSX-85 | Insp: Automated Defect Inspection System | Inq. | 1 | ||
| 5INSsofL11359 | SOFTEX | SFX-90 | Inspection:X-RAY | 2018 | 1 | ||
| 5INSvj L12430 | VJ Electronix | Vertex II Model V90 | Inspection system: X-Ray | 2017 | 1 | ||
| 5INSyxlP11694 | Yxlon | Cheetah | Inspection:X-RAY | 2005 | 1 | ||
| 5INSzeiM11014 | ZEISS | A300 | INS:Optical Equipment | inq. | 1 |
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