TTC Trust Technology Corporation

For Sale Equipment - Electrical parts(5in. or less) - Metrology - (Electric) Test, Measurement

Contact us via mail form or call +81-3-3344-5540 to place an order.

TTC ID Manufacturer Model Description Vintage QTY Product
* X3TooMITMP39134 MITUTOYO TM-250 Tool Microscope Inq. 1 tester
* X41MHHP42Y37291 HP 4280A 1MHZ C METER Inq. 1
* X4AirCoLSN39580 Cosmo LS-1813 Air Leak Tester 2013.10 1
* X4AirCoLSW39025 Cosmo LS-1860N Air Leak Tester 1996 2 Electronic parts/machine tools
X4AirPMInA35901 PMS Inq. AirSentry IMS NH3 Analyzer with OB Inq. 1
X4AirPMInA35902 PMS Inq. AirSentry IMS TCL Analyzer with OB Inq. 1
* X4AudHP89T38059 HP 8903B Audio Analyzer Inq. 3 Mobile phone board
* X4AudMaVPC38835 Matsushita VP-7720A Audio Analyzer Inq. 1
X4CagMiInL37500 Mitutoyo Inq. Cage Block Inq. 1 Electronic components/crystal device
* X4CapseSSY37267 seojin SSM5200 Capacitance Voltage Tester 1997 1
* X4CI Sa14L37413 Sanders 140A CI Meter Inq. 3 Electronic components/crystal device
* X4CI Sa15L37414 Sanders 150C CI Meter Inq. 2 Electronic components/crystal device
* X4CI Sa20L37440 Sanders 200VHF CI Meter Inq. 1 Electronic components/crystal device
* X4ConMaTAL37427 Matsunaga TA-1010 Constant-voltage Power Supply Inq. 2 Electronic components/crystal device
* X4CRYHPE4L38401 HP E4916A CRYSTAL IMPEDANCE /LCR Meter Inq. 1
* X4CurTeTCG36530 Tektronix TCP312 Current Probe/AC/DC Inq. 1
* X4CurTeTEP39145 Tektronix TEK576 Curve Tracer Inq. 1 tester
* X4CurTeTEP39146 Tektronix TEK176 Curve Tracer Inq. 1 tester
* X4CV Ke82A37670 Keithley 82-WIN Simultaneous C-V CV Meter Inq. 1
* X4DC ADR6T38054 ADVANTEST R6243 DC Generator Inq. 3 Mobile phone board
* X4DigADR6L37405 ADVANTEST R6441A Digital Multimeter Inq. 1 Electronic components/crystal device
* X4DigADTRL37410 ADVANTEST TR2114 Digi. Multi Thermometer Inq. 1 Electronic components/crystal device
* X4DigAg37C38616 Agilent 3784A Digital Transmission Anlyzer Inq. 1
* X4DigIwVOL37415 Iwatsu VOAC757 Digital Multimeter Inq. 1 Electronic components/crystal device
* X4DigMIIDR36246 MITUTOYO ID-C112C Digimatic Indicator Inq. 1 Electronic components/semiconductor machine tool
X4DigMiInW39484 Mitutoyo Inq. Digimatic Micrometer Inq. 1
* X4DigSaSDL37397 Sansei SDC-1040 Digital comparator Inq. 5 Electronic components/crystal device
* X4DigYOMYG36570 YOKOGAWA MY40-01 Digital Insulation Tester Inq. 1
* X4DouES24W37535 ESI 242D Double Bridge Inq. 1 Electronic component
* X4DynRhRDC37720 Rheometric Scientific RDA III Dynamic Analyzer 2001 1
* X4EleAnMLL37411 Anritsu ML69A Elec. Voltmeter Inq. 2 Electronic components/crystal device
* X4EleKE65C38953 KEITHLEY 6517A Electrometer Inq. 1
* X4FreADR5L37459 ADVANTEST R5361A Freq. Counter Inq. 1 Electronic components/crystal device
* X4FreAg53C38619 Agilent 5385A Frequency Counter Inq. 1
* X4FreAnMFL38378 Anritsu MF1601A Frequency Counter Inq. 1
* X4FreAnMFT38058 Anritsu MF1603A Frequency Counter Inq. 15 Mobile phone board
* X4FreIwFCL37424 Iwatsu FC-8841 Freq. Counter Inq. 1 Electronic components/crystal device
* X4FreLE1ML37412 LEAD 1MHz Freq. Reference Inq. 1 Electronic components/crystal device
* X4FreLeLDL37406 Leader LDC-822A Freq. Counter Inq. 6 Electronic components/crystal device
* X4FreSaSFL37396 Sansei SF-87B Freq. Counter Inq. 1 Electronic components/crystal device/glass products
* X4FreSaSFL37436 Sansei SF-65LA Freq. Counter Inq. 4 Electronic components/crystal device
* X4FreTaTRL37422 Takeda TR-5142 Freq. Counter Inq. 1 Electronic components/crystal device
* X4FreTaTRL37435 Takeda TR-5142SN Freq. Counter Inq. 2 Electronic components/crystal device
* X4FunAg33C38615 Agilent 3312A Function Generator Inq. 2
* X4FunGWGFC38820 GW GFG-813 Function Generator Inq. 1
* X4GauTOTMS34462 TOYOJIKI TMG-200 Gauss Meter Inq. 1
* X4GraHP87L37498 HP 87510A Grain phase analyzer Inq. 1 Electronic components/crystal device
* X4HigAvNRL37445 Avionics NRW-50 High-freq.Induction Heating Inq. 1 Electronic components/crystal device
* X4HigAvNRL37456 Avionics NRW100 High-freq. Induction Heating Inq. 2 Electronic components/crystal device
* X4HigNiRWL37453 Nihon Koshuha RW-1000E High-freq. Induction Heating Inq. 2 Electronic components/crystal device
* X4HigRiRUL37488 Rigaku RU-200 High-intensity X-ray generator 1983 1 Crystal Device
* X4ImpYH41W37534 YHP 4192A Impedance Analyzer/LF Inq. 1 Electronic components/quartz crystal device
* X4IntFUFIL37493 FUJINON FIX05N Interference Fringe Analysis Apparatus 1991 1 Crystal Device
* X4LasFUFIL37491 FUJINON FIX05N Laser Interferometer 1991 1 Crystal Device
* X4LasFUFIL37492 FUJINON FIX05N Laser Interferometer 2004 1 Crystal Device
* X4LCRAg42C38617 Agilent 4263A LCR Meter Inq. 1
* X4LCRHI35C38635 HIOKI 3520 LCR Tester Inq. 1
* X4LCRVoAtY37273 Voltech Ati LCR Meter Inq. 1
* X4MasLUIBR36248 LUCAS LABS IB420 Mass Spectrum Analyzer 1996 1 Electronic components/semiconductor
* X4MasLUIBR36249 LUCAS LABS IB420 Mass Spectrum Analyzer 1996 1 Electronic components/semiconductor
* X4ModAg53C38618 Agilent 53310A Modulation Domain Analyzer Inq. 1
* X4MulADR6T38055 ADVANTEST R6452A Multimeter Inq. 5 Mobile phone board
X4MulALInA35886 ALMEMO Inq. Multimeter Inq. 1
X4MulALInA35887 ALMEMO Inq. Multimeter Inq. 1
X4MulALInA35896 ALMEMO Inq. Multimeter Inq. 1
X4MulALInA35897 ALMEMO Inq. Multimeter Inq. 1
X4MulALInA35898 ALMEMO Inq. Multimeter Inq. 1
* X4MulFL17A35848 FLUKE 177 Multimeter/TRUE RMS Inq. 1
* X4MulFL17A35849 FLUKE 177 Multimeter/TRUE RMS Inq. 1
* X4MulFL17A35850 FLUKE 177 Multimeter/TRUE RMS Inq. 1
* X4NetADR3W39555 ADVANTEST R3753BH Network Analyzer Inq. 1
* X4NetAgE5C38632 Agilent E5062A Network Analyzer Inq. 1
* X4NetAnMSL37499 Anritsu MS420B Network Analyzer Inq. 1 Electronic components/crystal device
* X4NetHP87C38609 HP 8711A Network Analyzer Inq. 1
* X4NetHP87C38610 HP 8753C Network Analyzer Inq. 1
* X4NetHP87L38372 HP 8711A Network Analyzer 1997 1
* X4NetHP87L38389 HP 8751A Network Analyzer 1991 1
* X4NetHPE5W39529 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39530 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39531 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39532 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39533 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39534 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39535 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39536 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39537 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39538 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39539 HP E5100B Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39540 HP E5100B Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39541 HP E5100B Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39542 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39543 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39544 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39545 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39546 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39547 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39548 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39549 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39550 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39551 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39552 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39553 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetHPE5W39554 HP E5100A Network Analyzer / 10KHz-180MHz Inq. 1
* X4NetSRSRC38841 SRS SR770 Network Analyzer Inq. 1
* X4NF HP89C38611 HP 8970B NF Meter Inq. 1
* X4NOISIS3Y37286 SILVACO S3245A NOISE AMPLIFIER 2006 1
* X4OrgWa26A35879 Waters 2695/2996 Organic Compounds Analyzer Inq. 1
* X4OscAg10C38613 Agilent 10376A Oscilloscope Camera Inq. 1
* X4OscAg17C38614 Agilent 1741A Oscilloscope Inq. 1
* X4OscAg54C38620 Agilent 54600A Oscilloscope Inq. 1
* X4OscAnMGL37452 Anritsu MG44A Oscillator Inq. 1 Electronic components/crystal device
* X4OscATADC38817 ATTEN ADS710SAN Oscilloscope Inq. 1
* X4OscATADC38818 ATTEN ADS7102SAN Oscilloscope Inq. 1
* X4OscGWGDC38819 GW GDS-820C Oscilloscope Inq. 2
* X4OscGWGOC38821 GW GOS-6103C Oscilloscope Inq. 1
* X4OscGWGOC38822 GW GOS-6112 Oscilloscope Inq. 1
* X4OscGWGOC38823 GW GOS-620 Oscilloscope Inq. 8
* X4OscGWGOC38824 GW GOS-622G Oscilloscope Inq. 2
* X4OscHIV-C38844 HITACHI V-1565 Oscilloscope Inq. 1
* X4OscHIVCP39147 HITACHI VC-6023 Oscilloscope Inq. 1 memor
* X4OscHP54C38606 HP 54602A Oscilloscope Inq. 1
* X4OscIwDSS34459 Iwatsu DS-8621 Oscilloscope Inq. 1
* X4OscIwSSC38636 Iwatsu SS-5702A Oscilloscope Inq. 2
* X4OscIwSSC38637 Iwatsu SS-7602 Oscilloscope Inq. 1
* X4OscIWSSL37417 IWATSU SS-7821 Oscilloscope Inq. 1 Electronic components/crystal device
* X4OscIwSSL37494 Iwatsu SS-7825 Oscilloscope Inq. 1 Electronic components/crystal device
* X4OscIwSSS34456 Iwatsu SS-7804 Oscilloscope Inq. 1
* X4OscIwSSS34457 Iwatsu SS-7625 Oscilloscope Inq. 1
* X4OscKiCOC38843 Kikusui COR 5561U Oscilloscope Inq. 1
* X4OscLELBC38832 LEADER LBO-9C Oscilloscope Inq. 12
* X4OscLELTC38833 LECROY LT322 Oscilloscope Inq. 1
* X4OscPaVPC38836 Panasonic VP-383H Oscilloscope Inq. 2
* X4OscPaVPC38837 Panasonic VP-3830H Oscilloscope Inq. 3
* X4OscSaSCL37431 Sansei SCI-308A Oscillator Inq. 1 Electronic components/crystal device
* X4OscTe24S34458 Tektronix 2467B Oscilloscope Inq. 1
* X4OscTeTDC38639 Tektronix TDS1012 Oscilloscope Inq. 1
* X4OscTeTDC38640 Tektronix TDS220 Oscilloscope Inq. 3
* X4OscTeTDC38641 Tektronix TDS192 Oscilloscope Inq. 1
* X4OscTeTDC38707 Tektronix TDS3054B Oscilloscope Inq. 1
* X4OxiSAMIR36238 SANWA MI-476 Oxide Film Evaluation Tool Inq. 1 Analyzer for thin film composition
* X4ParHP41Y37290 HP 4145B Parameter Analyzer 2008 1
* X4ParMS21Y37297 MSP 2110 Particle Sampler Inq. 1
* X4PhaSaADL37398 Sansei AD-8405B Phase Meter Adapter Inq. 3 Electronic components/crystal device
* X4PicSI50A35900 SIR 5045 Picarro HF Analyzer with External OBC Inq. 1
* X4PowAg66T38060 Agilent(HP) 6633B Power Supply/DC Inq. 6 Mobile phone board
* X4PowCOIHW40868 CONDENSER MAGGER IHC-15140 Power Supply for Magnetizing Inq. 1
* X4PowCOIHW40869 CONDENSER MAGGER IHC-15140 Power Supply for Magnetizing 1990 1
* X4PowHP43L37408 HP 437B Power Meter Inq. 1 Electronic components/crystal device
* X4PowMaPCW40892 Magnetlabo PC-2510NS3 Power Supply for Magnetizing 2000 1
* X4PowMaPCW40894 Magnetlabo PC-2510NS3 Power Supply for Magnetizing 2000 1
* X4PowMaPCW40896 Magnetlabo PC-2510NS3 Power Supply for Magnetizing 2000 1
* X4PowMaPCW40897 Magnetlabo PC-2510S3 Power Supply for Magnetizing 1905 1
* X4PowNISRW40900 NIHON DENJI SOKKI SR-L1510 Power Supply for Magnetizing 2003 1
* X4PreFLPPG39022 FLUKE PPC4-ui A350Kp Pressure Controller/Calibrator 2015 1
* X4PreHiPCY37293 Hirayama PC-304R7 Pressure Cooker(HAST) 1998 1
* X4PreMEaqA35884 MEECO aquavolt+ Precision Moisture Analyzers Inq. 1
* X4ProTDGEW39272 TDK GEN8-400-D Programmable Power Supplies/DC Inq. 2 Measuring instrument
* X4PsyALFNA35890 ALMEMO FN A846 Psychrometer Inq. 1
* X4PsyALFNA35891 ALMEMO FN A846 Psychrometer Inq. 1
* X4RF R&A2L38406 R&K A250HP-R RF Power Amplifier 2007 1
* X4RotJF50C38831 JFW 50BR-016 Rotary Attenuator Inq. 1
* X4RotTATRC38842 TAMAGAWA TRA-801 Rotary Attenuator Inq. 3
* X4SigAg86C38627 Agilent 8640B Signal Generator Inq. 3
* X4SigAg86C38628 Agilent 8642B Signal Generator Inq. 1
* X4SigAg86C38633 Agilent 8646C Signal Generator Inq. 1
* X4S-PAg85C38621 Agilent 85046A S-PARAMETER TEST SET Inq. 1
* X4S-PATATL38399 ATN MICROWAVE ATN-4111A-1 S-PARAMETER TEST SET 1999 1
* X4SpeADR3C38503 ADVANTEST R3131A Spectrum Analyzer Inq. 4 LED
* X4SpeADR3C38504 ADVANTEST R3261A Spectrum Analyzer Inq. 2 LED
* X4SpeADR3C38505 ADVANTEST R3261B Spectrum Analyzer Inq. 2 LED
* X4SpeADR3C38506 ADVANTEST R3365A Spectrum Analyzer Inq. 1 LED
* X4SpeADR3T38056 ADVANTEST R3465 Spectrum Analyzer Inq. 2 Mobile phone board
* X4SpeADR3T38057 ADVANTEST R3265A Spectrum Analyzer Inq. 1 Mobile phone board
* X4SpeADR4C38507 ADVANTEST R4131D Spectrum Analyzer Inq. 1 LED
* X4SpeAg85C38622 Agilent 8590A Spectrum Analyzer Inq. 1
* X4SpeAg85C38623 Agilent 8591A Spectrum Analyzer Inq. 2
* X4SpeAg85C38624 Agilent 8591E Spectrum Analyzer Inq. 5
* X4SpeAg85C38625 Agilent 8594A Spectrum Analyzer Inq. 3
* X4SpeAg85C38626 Agilent 8594E Spectrum Analyzer Inq. 2
* X4SpeAgE4C38631 Agilent E4402B Spectrum Analyzer Inq. 3
* X4SpeHP85C38608 HP 8594E Spectrum Analyzer Inq. 2
* X4S-PHP85C38607 HP 85046A S-PARAMETER TEST SET Inq. 1
* X4S-PHP85L38395 HP 85046A S-PARAMETER TEST SET 1995 1
* X4S-PHP85L38396 HP 85046A S-PARAMETER TEST SET Inq. 1
* X4S-PHP85L38397 HP 85046A S-PARAMETER TEST SET 1990 1
* X4S-PHP87L38393 HP 87511A S-PARAMETER TEST SET 1991 1
* X4S-PHP87L38394 HP 87511A S-PARAMETER TEST SET Inq. 1
X4STDSaInL37501 Sansei Inq. STD Freq. Distributer Inq. 1 Electronic components/crystal device
* X4STDTOSRL37409 TOA Elec. SR-2 STD Resistor Inq. 1 Electronic components/crystal device
* X4strHIHSL37484 HITACHI ZOSEN HSS750 straightness measurement 2005 1 Crystal Device
* X4SurMeDEY37298 Met One DE712AF-5 Surface Particle Counter Inq. 1
* X4SwiEvKFP39141 Everfine KF-2 Switching Transistor Selector Inq. 1
* X4SwiEvKFP39142 Everfine KF-2 Switching Transistor Selector Inq. 1
* X4SynAg86C38629 Agilent 8657B Synthesized Signal Generator Inq. 1
* X4SynAnMGL37448 Anritsu MG545B Synthesizer Inq. 1 Electronic components/crystal device
* X4SynAnMGL37449 Anritsu MG545A Synthesizer Inq. 1 Electronic components/crystal device
* X4SynHP86L38400 HP 8644A Synthesize Signal Generator 2000 1
* X4SynTOFSL37429 TOA Elec. FS-1131 Synthesizer Inq. 2 Electronic components/crystal device
* X4SysHP60L38405 HP 6033A System Power Supply Inq. 1
* X4TDDSAInR37182 SANWA Inq. TDDB Probe Station 1996 1 Analyzer for thin film composition
* X4TemKIT2A35871 KIMPSION T2800 Temperature Forcing System Inq. 1
* X4TheALFVA35888 ALMEMO FVA645 Thermometer Inq. 1
* X4TheALFVA36760 ALMEMO FVA645 Thermometer Inq. 1
* X4TheIsVEL37428 Isothermal VENUS 125B Thermometer Calibrator Inq. 1 Electronic components/crystal device
* X4TheTETEA35904 TESTO TESTO400 Thermo-hygrometer Inq. 1
* X4UniADTRL37407 ADVANTEST TR5821 Universal Counter Inq. 1 Electronic components/crystal device
* X4UniSaSSL37460 Sansei SS-868E Universal Crossing Counter Inq. 3 Electronic components/crystal device
* X4UV SIS-A35899 SIR S-5001 UV Fluorescence SO2 Analyzer Inq. 1
* X4VacYEPVL37426 YEW PV-13 Vacuumtube Voltmeter Inq. 1 Electronic components/crystal device
* X4VecHP85L37430 HP 8508A Vector Voltmeter Inq. 1 Electronic components/crystal device
* X4VibBr28Y37299 Bruel & Kijael 2827-002 Vibration Meter Inq. 1
* X4VolASAPC38634 ASAHI AP-201A-13 Voltmeter Inq. 9
* X4VOLHI31W40854 HIOKI 3173-01 VOLTAGE HiTESTER 2006 1
* X4VolHP84L37447 HP 8405A Voltmeter Inq. 1 Electronic components/crystal device
* X4VolTOSKL37419 TOSHIBA SK-110 Voltage Regulator Inq. 2 Electronic components/crystal device
X4WidSaInL37502 Sansei Inq. Wide Band Amplifier Inq. 1 Electronic components/crystal device
* X4WitGWGPC38828 GW GPT-705 Withstand Voltage Tester Inq. 1
* X4WitGWGPC38829 GW GPT-715 Withstand Voltage Tester Inq. 1
* X4X-rIWWGL37490 IWAYA MACHINERY WG-220-SWA-VZR X-ray source cooling circulation system 1998 1 Crystal Device
* X4X-rRiU1L37486 Rigaku U10542 X-ray Goniometer 1972 1 Crystal Device
* X4X-rRiU1L37487 Rigaku U106310 X-ray Ratemeter 1972 1 Crystal Device