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For Sale Equipment: Testing
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| TTC ID | Manufacturer | Model | Description | Vintage | QTY | Product | |
| 5OTHadi-asm-A11513 | Adixen | ASM182TD | other: 4Helium Leak Detector/4in | Inq. | 1 | ||
| 5OTHadi-asm-G10182 | Adixen | ASM GRAPH D+ | OTH:Leak Detector | inq | 2 | ||
| 5OTHama-vsb-G10183 | AMAT(Varian) | VSBD302 | OTH:Leak Detector | inq | 1 | ||
| * | 5OTHanr-mg5-L0467 | Anritsu | MG545A | Other: Synthesizer | Inq. | 1 | |
| * | 5OTHas -hs--N0249 | AS ONE | HS-50D | Other: Magnetic Stirrer | Inq. | 1 | |
| 5OTHasi-el--L10559 | ASIC | EL-A | OTH: ELECTROLUMINESCENCE TESTER | inq | 2 | ||
| 5OTHasi-scs-L11105 | ASIC SHANGHAI | SCSS-EL02 Plus | OTH:EL Tester | inq. | 1 | ||
| 5OTHasm-asm-F12354 | ASM | ASM Calibration kit | other: Tester Calibration Kit | Inq. | 1 | ||
| * | 5OTHayu-es--L0876 | Ayumi | ES-30DL | Other: Vacuum Sealer | Inq. | 1 | |
| 5OTHb&w-bwr-Q9958 | B&W TEK inc + Sigma | BWR-20E/55869 | OTH:1064 nm laser | inq | 1 | ||
| 5OTHbro-lvd-Q8666 | Brookfield | LVDV-2+PRO-CP | other: Viscometer | 2005 | 1 | ||
| 5OTHbsc-sh4-Q7536 | BSC Filters | SH4457 | oth: High pass filter | 2007 | 1 | ||
| 5OTHbsc-sh4-Q7537 | BSC Filters | SH4458 | oth: High pass filter | 2007 | 1 | ||
| 5OTHbsc-xn4-Q7543 | BSC Filters | XN4455 | oth: Notch filter | 2007 | 1 | ||
| 5OTHbsc-xn4-Q7544 | BSC Filters | XN4456 | oth: Notch filter | 2007 | 1 | ||
| 5OTHcan-850-Q7353 | Canon | 850670H-0312 | Other: LABVIEWUPGRADE | 2000 | 1 | ||
| 5OTHcat-adv-Q7420 | CATC | Advisor | Oth: USB 2.0 Bus & Protocol Analyzer | Inq. | 1 | ||
| 5OTHcbc-vm--Q8667 | CBC | VM-10A-M | other: Viscometer | Inq. | 1 | ||
| 5OTHcho-uj--Q6509 | Cho-onpa | UJ-246-1C | other: Wire pulltester | 1991 | 1 | ||
| 5OTHchr-ja--A10535 | ChromTech | JA-5103N | OTH:Electronic Balance | 1997 | 1 | ||
| 5OTHcom-32m-Q7386 | COMPUTEX | 32M41 | Oth: In-circuit debugger | Inq. | 1 | ||
| 5OTHdag-240-C11018 | DAGE | 2400A | OTH:WIRE PULL TEST MACHINE | 2006 | 1 | ||
| 5OTHdag-300-M11701 | DAGE | 3000 | oth: Wire pull Tester | Inq. | 1 | ||
| * | 5OTHdag-bt--S4576 | DAGE | BT-24 | Other: Bond Tester | 1994 | 1 | |
| 5OTHdag-ser-E12518 | Dage/Nordson | SERIES 4000 | Other: Bond tester | 2009 | 1 | ||
| * | 5OTHdat-alp-A1714 | Data Systems | ALP-7012LA | Other: LD DRIVER | Inq. | 1 | |
| 5OTHdit-rdf-K6336 | Ditect | RDF-D3 | Other: Hi-speed camera | 2010 | 1 | ||
| 5OTHeco-サーモ-Q11274 | Ecomott | サーモロイドPro Ver１ | OTH:Body temperature screening solution Thermoroid pro | 2020 | 20 | ||
| 5OTHesp-tsa-E11289 | ESPEC | TSA-71H-W | OTH:Thermal Shock Testing | 2008 | 1 | ||
| 5OTHesp-tsa-E11290 | ESPEC | TSA-201S-W | OTH:Thermal Shock Testing | 2006 | 1 | ||
| 5OTHesp-tsa-E7102 | Espec | TSA-71H-W | other: Thermal shock tester | 2001 | 1 | ||
| 5OTHesp-tsa-L12812 | ESPEC | TSA-70L-A | other: Thermal Shock Chamber | Inq. | 1 | ||
| * | 5OTHesp-tsb-C0537 | ESPEC | TSB-2 | Other: Thermal Shock Chamber | 1999 | 1 | |
| 5OTHeta-nt2-R5462 | ETAC | NT2031W | Other: Temperature Cycle Chamber | Inq. | 1 | ||
| * | 5OTHeve-kf--P0849 | Everfine | KF-2 | Other: Switching Transistor Selector | Inq. | 1 | |
| * | 5OTHeve-kf--P0850 | Everfine | KF-2 | Other: Switching Transistor Selector | Inq. | 1 | |
| 5OTHftd-0.8-F12338 | FTD | 0.8*0.8 TR test socket and socket board | other: PCB Components and Test Station Socket | Inq. | 1 | ||
| 5OTHfuj-ape-Q9489 | fujita | APE-PWIGBT | OTH:Bias tester | 2010 | 1 | ||
| 5OTHfuj-fth-Q7342 | Fujita | FTH-100 | other: Tharmalfet tester | 2000 | 1 | ||
| * | 5OTHfuk-msx-L0414 | FUKUDA | MSX-5086 | Other: Leak Detector | Inq. | 1 | |
| 5OTHgia-inq-A0929 | Giant Force Instrument Enterprise | Inq. | Other: High / low temperature test equipment | 2012 | 1 | ||
| 5OTHhac-210-K9970 | HACH | 2100P | OTH:Turbidimeter | inq | 1 | ||
| 5OTHhay-laa-K6048 | Hayashi-Repic | LAA-150UE | other: Light Source | Inq. | 1 | ||
| 5OTHhay-lum-K6047 | Hayashi-Repic | Luminar Ace | other: Light Source | Inq. | 1 | ||
| * | 5OTHhil-cht-V3936 | HILA | CHT-6A | Other: Thermometer | Inq. | 1 | |
| 5OTHhio-312-Q7401 | Hioki | 3127 | Other: Clamp on tester | Inq. | 1 | ||
| 5OTHhio-315-Q10400 | HIOKI | 3158 | OTH:Voltage HiTester | 2007/2010/2013/2015 | 5 | ||
| 5OTHhio-380-Q7501 | Hioki | 3805 | other: High Tester | 2005 | 1 | ||
| 5OTHhio-lr8-Q9687 | HIOKI | LR8431 | OTH:Memory High Logger | inq. | 1 | ||
| 5OTHhir-pc--Q6508 | Hirayama | PC-204RⅢ | other: Pressurecooker | 1990 | 1 | ||
| 5OTHhit-ec--Q9488 | Hitachi | EC-45MHPS | OTH:temperature and humidity Testing Chamber | 2010 | 1 | ||
| 5OTHhit-es--Q6481 | Hitachi | ES-76LH | other: Thermal shock tester | 2007 | 1 | ||
| * | 5OTHhit-i-2-P4814 | Hitachi | I-20 MI-SCOPE-120 | Other: Ultrasonic scan analyzer | Inq. | 1 | |
| 5OTHhit-mi--E9405 | Hitachi Power Solutions | mi-scopeMI-25 | OTH:Ultrasonic imaging equipment | 1997 | 1 | ||
| * | 5OTHhum-a-q-L0875 | Humo | A-QB-210 | Other: Blank Frequency Sorter | 2004 | 1 | |
| 5OTHima-svf-E11059 | IMADA | SVF-500NA-SL | OTH:Tensile and Compression Testing | 2004 | 1 | ||
| 5OTHinf-ul1-A11512 | INFICON | UL1000 | other: 4Helium Leak Detector/4in | Inq. | 1 | ||
| 5OTHinq-el1-L11107 | inq. | EL140 | OTH:EL Tester | inq. | 1 | ||
| 5OTHinq-inq-A0924 | Inq. | Inq. | Other: RPT | 2013 | 1 | ||
| 5OTHinq-inq-A0930 | Inq. | Inq. | Other: Cleaning device | 2010 | 1 | ||
| 5OTHinq-inq-A0931 | Inq. | Inq. | Other: Storage facility | 2013 | 1 | ||
| 5OTHinq-inq-K6044 | Inq. | Inq. | other: Depth Gauge | Inq. | 1 | ||
| 5OTHinq-inq-S0970 | Inq. | Inq. | Other: Performance Board | 1991 | 1 | ||
| * | 5OTHinq-jtx-A0922 | Inq. | JTXBJ-075 | Other: Inq. | 2010 | 1 | |
| * | 5OTHinq-lta-Q0155 | Inq. | LTA-330A | Other: Wafer Lifetime Measuring/5in. | Inq. | 1 | |
| * | 5OTHiso-ven-L0447 | Isothermal | VENUS 125B | Other: Thermometer Calibrator | Inq. | 1 | |
| 5OTHite-ap--Q9490 | iTEC | AP-20-3S-OP/AP-20-3S-BT | OTH:OP tester | 2004 | 2 | ||
| * | 5OTHjad-lpw-V3938 | JADEVER | LPWN-1530 | Other: Elec. Balance For Analysis | Inq. | 1 | |
| 5OTHjtk-jtk-F12329 | JTK | JTK-DIG32 | other: Leakage tester | 2015 | 1 | ||
| 5OTHjtk-jtk-F12330 | JTK | JTK-DIG32 | other: Leakage tester | 2016 | 1 | ||
| 5OTHjtk-jtk-F12331 | JTK | JTK-DIG32 | other: Leakage tester | 2017 | 1 | ||
| 5OTHjtk-jtk-F12332 | JTK | JTK-DIG32 | other: Leakage tester | 2017 | 1 | ||
| 5OTHjtk-jtk-F12333 | JTK | JTK-DIG32 | other: Leakage tester | 2018 | 1 | ||
| 5OTHjtk-jtk-F12334 | JTK | JTK-DIG32 | other: Leakage tester | 2016 | 1 | ||
| 5OTHjtk-jtk-F12335 | JTK | JTK-DIG32 | other: Leakage tester | 2016 | 1 | ||
| 5OTHkey-lc--E10774 | Keyence | LC-2101 | OTH:laser displacement meter | inq | 1 | ||
| 5OTHkey-lc--E10775 | Keyence | LC-2210 | OTH:laser displacement meter | inq | 1 | ||
| 5OTHkoh-k2--Q10897 | Kohzu | K2-200 | OTH:Flatness measuring | inq. | 1 | ||
| 5OTHkok-cx1-K11685 | Kokusai electric | CX1204 | oth: Exhaust Controller | 1994 | 1 | ||
| 5OTHkur-mic-Q8282 | Kurashiki kako | MICRO-ｇ | Other: surface plate | 1991 | 1 | ||
| 5OTHly--inq-L0570 | LY-MI | Inq. | Other: Blank Sorter | 2007 | 1 | ||
| 5OTHly--inq-L0571 | LY-MI | Inq. | Other: Blank Sorter | 2008 | 1 | ||
| * | 5OTHmat-mmt-C0909 | Matsuzawa | MMT-X7A | Other: Hardness Tester | Inq. | 1 | |
| 5OTHmau-181-Q7505 | MAURY MICROWAVE | 1819B | Oth: Stub tuner | 2005 | 1 | ||
| 5OTHmau-804-Q7395 | MAURY MICROWAVE | 8045C | Oth: Slide screw tuner | Inq. | 2 | ||
| * | 5OTHmei-ms--W0981 | MEISHO | MS-9000GTIR | Other: BGA Rework Station | 2011 | 1 | |
| 5OTHmic-inq-E7100 | Michinokumachinery | Inq. | Other: strength tester | 2008 | 1 | ||
| 5OTHmic-mmd-Q7524 | Micronix | MMD850 | oth: Microwave detector | 2005 | 1 | ||
| 5OTHmic-mt3-Q10038 | Microtrac | MT3100II/SDC | OTH:Particle size distribution analyzer | 2016 | 1 | ||
| 5OTHmin-zhl-Q7399 | MINI-CIRCUITS | ZHL-4240 | Oth: High frequency amplifier | Inq. | 1 | ||
| 5OTHmis-msn-Q10787 | MISUMI | MSND2.3-30 | OTH:Temperature Sensor | inq | 1 | ||
| 5OTHmis-msn-Q10790 | MISUMI | MSND2.3-30 | OTH:Temperature Sensor | inq | 1 | ||
| 5OTHmit-cd--E10777 | Mitutoyo | CD-45C | OTH:vernier calipers | inq | 1 | ||
| * | 5OTHmit-id--R0172 | MITUTOYO | ID-C112C | Other: Digimatic Indicator | Inq. | 1 | |
| 5OTHmit-inq-L0497 | Mitutoyo | Inq. | Other: Cage Block | Inq. | 1 | ||
| 5OTHmit-inq-M9533 | MITUTOYO | inq. | OTH:CNC VISION MEASURING SYSTEM | inq. | 1 | ||
| 5OTHmit-leg-Q12053 | Mitutoyo | LEGEX574 | Other: CNC Image measurement /3D | 2007 | 1 | ||
| * | 5OTHmit-pj3-L0878 | Mitutoyo | PJ300 302-926 | Other: Projector | Inq. | 1 | |
| 5OTHmol-242-A12614 | Molecular Analytics | 2427052-8 | other: Multiopoint Sampling System | Inq. | 1 | ||
| 5OTHmt/-inq-Q7356 | MT/Hitachi-hitech | Inq. | Other: EEPROM meas. board | 2010 | 1 | ||
| 5OTHmul-bga-F12361 | Multitest | BGA1.6*1.6 test kit | Other: Kit | Inq. | 1 | ||
| 5OTHmul-tes-F12347 | Multitest | TEST KIT for 0.8*0.8 | Other: Kit | Inq. | 1 | ||
| 5OTHmur-hm--Q9884 | Murakamishikisaigijutsu | HM-150 | OTH:haze meter | inq | 2 | ||
| 5OTHnar-375-Q7500 | NARDA | 3752 | Oth: PHASE SHIFTER | 2005 | 1 | ||
| 5OTHnf-165-Q7499 | NF | 1650 | Oth: Pattarn synthesizer | 1994 | 1 | ||
| 5OTHnf-ck1-Q7382 | NF | CK1620 | Oth: Clock synthesizer | Inq. | 2 | ||
| 5OTHnf-ck1-Q7424 | NF | CK1615 | Oth: Clock synthesizer | Inq. | 2 | ||
| 5OTHnf-es2-Q7393 | NF | ES2000B | Oth: Power environment simulator | Inq. | 1 | ||
| 5OTHnf-es2-Q7394 | NF | ES2000S | Oth: Power environment simulator | Inq. | 1 | ||
| * | 5OTHnih-rw--L0471 | Nihon Koshuha | RW-1000E | Other: High-freq. Induction Heating | Inq. | 2 | |
| * | 5OTHnik-6d-L0779 | Nikon | 6D | Other: Autocollimator | Inq. | 2 | |
| 5OTHnik-v-1-K10431 | Nikon | V-12 | OTH:projector | 1985 | 1 | ||
| 5OTHnik-v-1-N8278 | Nikon | V-128 | other: Profile projector | Inq. | 1 | ||
| * | 5OTHnik-v-1-T0982 | Nikon | V-12 | Other: Projector | 1987 | 1 | |
| 5OTHnik-vmr-P12630 | Nikon | VMR-H3030 | Other: CNC measurement | 2008 | 1 | ||
| 5OTHnik-vmz-M11704 | Nikon | VMZ-R3020 | Other: CNC Image measurement /QV | Inq. | 1 | ||
| 5OTHnik-vmz-M12856 | Nikon Metrology | VMZ-K6555 | Other: Confocal Video Measuring System | Inq. | 1 | ||
| 5OTHnor-dag-F10933 | Nordson | DAGE4000 | OTH:BOND TESTER | inq. | 2 | ||
| 5OTHnsk-hm--P6424 | NSK | HM-90 | other: Micron Depth Tester | Inq. | 1 | ||
| 5OTHoga-grt-Q9442 | Ogasawara Precision | GRT-04 | OTH:Gear Meshing Tester | inq. | 1 | ||
| 5OTHoha-ex2-Q8488 | OHAUS | EX2202G | oth: Electronic scale | Inq. | 2 | ||
| 5OTHors-aos-Q10044 | ORSA | AOS303-445-30 | OTH:Single-mode fiber blue light source | 2016 | 1 | ||
| 5OTHors-hpb-Q10045 | ORSA | HPB455-3 | OTH:Multimode Fiber Blue Light Source | 2016 | 1 | ||
| 5OTHots-qe2-Q10039 | Otsuka | QE2100 | OTH:Quantum Effect Measurement System | 2016 | 1 | ||
| 5OTHots-ret-N8279 | Otsuka | RETS-1100ML | other: GAP measuring machine | Inq. | 1 | ||
| 5OTHoyo-ait-E10059 | OYO | AITOS | OTH:Light Source | inq | 3 | ||
| 5OTHoyo-aw1-E10078 | OYO | AW1050 | OTH:light source | inq | 1 | ||
| 5OTHoyo-aw1-K6195 | OYO | AW1050 | other: Light Source | Inq. | 1 | ||
| 5OTHpan-pan-B8176 | Panasonic | Panadac944A-210 | Other: Coplanarity check system | Inq. | 1 | ||
| * | 5OTHpea-ac--L0778 | Pearl | AC-140F | Other: Autocollimator | Inq. | 1 | |
| 5OTHpei-el--L11110 | Peide | EL-1.4MD-AS | OTH:EL Tester | inq. | 1 | ||
| * | 5OTHphi-ir3-A0581 | Philips | IR3100 | Other: Wafer Infrared Depth Measuring Instrument/12in. | Inq. | 2 | |
| 5OTHpro-inq-Q7365 | Production Technology Center Kyushu | Inq. | Other: Substrate strength tester | 2008 | 1 | ||
| 5OTHpro-mtg-Q9540 | PROTEC | MTG-08A | OTH:Metal mask tension gauge | inq. | 1 | ||
| 5OTHqui-820-L11111 | Quicksun | 820A | OTH:Power Simulation Test | inq. | 1 | ||
| * | 5OTHr&k-aa1-P1311 | R&K | AA160-RS | Other: RF Power Amplifier | Inq. | 16 | |
| 5OTHr2d-2lp-M12842 | R2D Automation | 2LP | other: Comet sorter/150-200mm | Inq. | 1 | ||
| 5OTHrhe-ptr-E9815 | RHESCA | PTR-10 | OTH:Bond tester | 1996 | 1 | ||
| 5OTHrhe-ptr-L12805 | Rhesca | PTR-1000 | Other: Bonding tester | Inq. | 1 | ||
| 5OTHrhe-ptr-Q12072 | Rhesca | PTR-1000 | oth: Bonding tester | 2001 | 1 | ||
| * | 5OTHrob-ro--E5006 | ROBERT | RO-27 | Other: Aging machine | 2001 | 3 | |
| 5OTHroh-inq-Q7398 | Rohde & Schwarz | Inq. | Oth: Radio tester | Inq. | 1 | ||
| * | 5OTHsan-abs-L0874 | Sanseidenshi | ABS-28GF | Other: Blank Frequency Sorter | Inq. | 1 | |
| * | 5OTHsan-at--L0872 | Sanseidenshi | AT-24AS | Other: Frequency Sorter | Inq. | 1 | |
| * | 5OTHsan-at--L0873 | Sanseidenshi | AT-24AS | Other: Frequency Sorter | Inq. | 1 | |
| 5OTHsan-inq-R0340 | SANWA | Inq. | Other: TDDB Probe Station | 1996 | 1 | ||
| 5OTHsan-sc--Q10742 | SANYU | SC-701C | Other: Carbon Coater | Inq. | 1 | ||
| * | 5OTHsan-sdc-L0416 | Sansei | SDC-1040 | Other: Digital comparator | Inq. | 5 | |
| * | 5OTHsan-ss--L0477 | Sansei | SS-868E | Other: Universal Crossing Counter | Inq. | 3 | |
| 5OTHsar-cp2-K9969 | Sartorius | CP224S | OTH:electronic balance | inq | 1 | ||
| 5OTHsem-faa-Q12788 | Semiconductor Diagnostics Inc | FAaST 230-SPV | other: SPV measuring | 2008 | 1 | ||
| * | 5OTHsem-wt--R0338 | SEMILAB | WT-85 | Other: Life time measuring | Inq. | 1 | |
| 5OTHshi-auy-Q12823 | SHIMADZU | AUY200 | other: Analytical Balance | Inq. | 1 | ||
| 5OTHshi-ehf-E7281 | Shimazu | EHF-FB10KN-10LA | Other: Servo Parsa | 2000 | 1 | ||
| * | 5OTHshi-mse-K1419 | Shimadzu | MSE-4000 | Other: Leak Detector/He | 1998 | 1 | |
| 5OTHshi-mst-A5427 | SHIMADZU | MST-I | other: Micro Autograph | Inq. | 1 | ||
| 5OTHshi-smx-Q10756 | SHIMADZU | SMX-1000 | Other: X-Ray system | Inq. | 1 | ||
| 5OTHshi-uv2-E10780 | SHINDAIGO | UV225 | OTH:vacuum packaging machine | inq | 1 | ||
| 5OTHsig-inq-Q10043 | SIGMA KOKI | inq | OTH:Auto-rotating stages and controllers | 2021 | 1 | ||
| 5OTHsig-sgs-Q9959 | Sigma Koki | SGSP20-20+SHOT202 | OTH:Autostage+ stage controller | inq | 3 | ||
| 5OTHson-inq-Q7531 | SONY | Inq. | oth: DD digital photo camera | 1994 | 1 | ||
| * | 5OTHta -dsc-V3566 | TA Instruments | DSC-Q20 | Other: Differential Scanning Calorimeter | Inq. | 1 | |
| * | 5OTHta -dsc-V3567 | TA Instruments | DSC-Q10 | Other: Differential Scanning Calorimeter | Inq. | 1 | |
| * | 5OTHtak-tr4-L0437 | Takeda | TR4120 | Other: Tracking Scope | Inq. | 1 | |
| * | 5OTHtdk-gen-W0890 | TDK | GEN8-400-D | Other: Programmable Power Supplies/DC | Inq. | 2 | |
| * | 5OTHtek-er8-R3955 | Teknologue | ER8940A | Other: Tester | Inq. | 1 | |
| 5OTHtek-i-s-P12637 | TEKSCAN | I-Scan System | other: Pressure Mapping System | 2016 | 1 | ||
| 5OTHtek-stc-Q7352 | Tektronix | STC399X-99158-7 | Other: GPIB controller | 2000 | 1 | ||
| 5OTHthe-dx6-A12137 | Thermo Fisher | DX600 | Other: Metrology system | 2002 | 1 | ||
| * | 5OTHtop-20--V3945 | TOP | 20-A | Other: Thermometer | Inq. | 3 | |
| 5OTHtro-fm2-A10317 | Tropel | FM200 | OTH:Flatness measuring | inq | 1 | ||
| 5OTHtsk-em--Q5883 | TSK | EM-21 | other: Tester | 2000 | 1 | ||
| * | 5OTHulv-gi--L0492 | ULVAC | GI-PRAY | Other: Vacuum Meter | Inq. | 1 | |
| 5OTHxyz-con-P10206 | XYZTEC | CONDOR 70 | OTH:Wire pull Tester | inq | 1 | ||
| 5OTHxyz-con-P10207 | XYZTEC | CONDOR 100 | OTH:Wire pull Tester | inq | 1 | ||
| 5OTHyok-417-Q7407 | Yokogawa | 4177-100-11 | Oth: μR100 RBI recorder | Inq. | 1 | ||
| 5OTHyok-ax2-Q7421 | Yokogawa | AX220 | Oth: SD card protocol analyzer | Inq. | 1 | ||
| * | 5OTHyok-cm5-P2084 | Yokogawa | CM500 | Other: Gas monitor | Inq. | 1 | |
| 5OTHyok-ur1-A12598 | YOKOGAWA | UR100 | other: Chart Recorder | Inq. | 1 | ||
| * | 5OTHysc-htc-V3925 | YSC | HTC-2 | Other: Thermometer | Inq. | 4 | |
| 5OTHz.c-tc--G12092 | Z.C. AUTO | TC-485 | other: Ceramic disc appearance inspection | Inq. | 1 | ||
| * | 5OTHzyv-kz1-P2733 | Zyves | KZ100 | Other: NANO probe | Inq. | 1 |
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