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| FOR SALE TOOLS --- Semiconductor Test Systems |
|
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20081224t4E009 | Mosaid | MS3400 | Tester, Memory | 1993 | 1 |  |
| 20081224t4E008 | Mosaid | MS3400 | Tester, Memory | 1992 | 1 | |
| 20081224t4E007 | Mosaid | MS4105 | Tester, Memory | 1993 | 1 | |
| 20081216t1E013 | ANDO | AL6082 | Tester | 1999 | 1 | |
| 20081216t1E009 | Advantest | T5362 | Tester | 1992 | 1 | |
| 20081216t1E008 | Advantest | T5362 | Tester | 1991 | 1 | |
| 20081216t1E007 | Advantest | T5363 | Tester | 1993 | 1 | |
| 20081216t1E006 | Advantest | T5363 | Tester | 1992 | 2 | |
| 20081216t1E002 | Asia | T7164 | Tester | 1998 | 4 | |
| 20081216t1E001 | Asia | T7164 | Tester | 1997 | 1 | |
| 20081215t3O091 | ADVANTEST | T8331 | Tester | Inq. | 4 | |
| 20081215t3O090 | ADVANTEST | T3156 | Tester | Inq. | 1 | |
| 20081215t2W070 | STATEC | STA2050 | (4")EDS Tester | Inq. | 1 | |
| 20081209t2E002 | Agilent(HP) | 83000 | Tester | Inq. | 4 | |
| 20081124t4E011 | LTX | Delta-Master | Tester | 1996 | 1 | |
| 20081124t4E010 | LTX | Delta-Master | Tester | 1996 | 1 | |
| 20081124t3E009 | LTX | Delta-STE | Tester | 1998 | 1 | |
| 20081124t3E008 | LTX | Delta-STE | Tester | 1997 | 1 | |
| 20081124t2E007 | Schlumberger | ITS CV II | Tester | Inq. | 1 | |
| 20081124t2E006 | Schlumberger | ITS CV II | Tester | Inq. | 1 | |
| 20081124t2E005 | Schlumberger | ITS CV II | Tester | Inq. | 1 | |
| 20081124t2E004 | Schlumberger | ITS CV II | Tester | Inq. | 1 | |
| 20081124t2E003 | Schlumberger | ITS CV II | Tester | Inq. | 1 | |
| 20081124t1E001 | ADVANTEST | T5377S | Tester | Inq. | 1 | |
| 20081106t1E024 | Shibasoku | WL93a | Tester | 1999 | 1 | |
| 20081106t1E023 | KVD | Inq. | Tester, CMOS | Inq. | 14 | |
| 20081106t1E022 | KVD | Inq. | Tester, CMOS | 2000 | 4 | |
| 20081106t1E021 | (LTX-)Credence | Kalos | Tester, Memory | Inq. | 5 | |
| 20081106t1E019 | VERIGY(Agilent) | 93000 | Tester | 1993 | 1 | |
| 20081106t1E018 | VERIGY(Agilent) | 93000 | Tester | 1994 | 1 | |
| 20081104t2E017 | TERADYNE | FLEX-RF | Tester | Inq. | 5 | |
| 20081023t2E003 | VERIGY(Agilent) | Versa 3304 | Tester | Inq. | 4 | |
| 20081017t2L004 | ASIA | T7164J | Tester? | 1997 | 15 | |
| 20081017t2L003 | ADVANTEST | T3335P | Tester,Memory | 1992 | 3 | |
| 20081017t2L002 | ADVANTEST | T5371 | Tester,Memory | 2000 | 2 | |
| 20081010t1L001 | LTX-Credence | LTX-77 | Tester | 1985 | 1 | |
| 20081006t2L003 | ADVANTEST | T5581P | Tester | 2003 | 2 | |
| 20081001t3C032 | TERADYNE | Catalyst | Test System, Mixed-signal/SOC digital | Inq. | 1 | |
| 20080929t1L014 | ADVANTEST | T6672 | Tester/Logic | 2000 | 2 | |
| 20080929t1L013 | YOKOGAWA | TS6000 | Tester | 2000 | 6 | |
| 2008092421L004 | ADVANTEST | T6575 | PDP Driver Test System | 2003 | 1 | |
| 2008092421L002 | ADVANTEST | T6271 | PDP Driver Test System | 2005 | 1 | |
| 2008092421L003 | ADVANTEST | T3347 | Tester, Logic/Analog | 1998 | 3 | |
| 20080922t3L026 | ADVANTEST | T5371 | Tester, Memory | 2001 | 1 | |
| 20080926t2L002 | TSK | UF200SA | Automatic Wafer Prober | 2004 | 1 | |
| 2008092421L008 | TSK | UF200 | Automatic Wafer Prober | 2000 | 1 | |
| 2008092421L007 | TSK | UF200 | Automatic Wafer Prober | 1999 | 1 | |
| 2008092421L006 | TSK | UF200 | Automatic Wafer Prober | 1996 | 2 | |
| 2008092421L005 | TSK | UF200 | Automatic Wafer Prober | 1998 | 1 | |
| 20080924t1L001 | Opto System | WPFR4200 | Semi Automatic Backside Prober for LED | 2008? | 1 | |
| 20080922t3L026 | ADVANTEST | T5371 | Tester, Memory | 2001 | 1 | |
| 20080918t2E002 | ADVANTEST | T5593 | Tester, Memory | 2005 | 1 | |
| 20080917t3L005 | TERADYNE | IP750 | Tester, Image Sensor | 2003 | 1 | |
| 20080917t1B001 | Shibasoku | S230 | Tester, PDP Driver ICs (Data, Scan) | 2005 | 2 | |
| 20080908t1L004 | ADVANTEST | T6573 | Tester/SoC | 2004 | 1 | |
| 20080905t3L017 | ADVANTEST | T6672 | Tester/Logic | 2000 | 2 | |
| 20080905t3L016 | YOKOGAWA | TS6000 | Tester | 2000 | 6 | |
| 20080822t4L020 | YOKOGAWA | TS6700 | Tester | 2000 | 1 | |
| 20080821t2L005 | YOKOGAWA | ST6730 | Test System, FPD Driver | 2006 | 1 | |
| 20080801t7L01 | YOKOGAWA | TS6000 | Tester | 2000 | 7 | |
| 20080801t4L02 | YOKOGAWA | TS6000 | Tester | 2000 | 7 | |
| 20080801t4L01 | YOKOGAWA | TS6000 | Tester | 2000 | 4 | |
| 20080801t0L03 | ADVANTEST | T5335P | Tester | 1998 | 1 | |
| 20080801t0L02 | ADVANTEST | T5335P | Tester | 1998 | 1 | |
| 20080801t0L01 | ADVANTEST | T5335P | Tester | 1997 | 1 | |
| 20080714t1W08 | ADVANTEST | T5365 | Tester/Memory | 1994 | 1 | |
| 20080714t1W07 | ADVANTEST | T5365 | Tester/Memory | 1995 | 1 | |
| 20080714t1W06 | ADVANTEST | T5365 | Tester/Memory | 1996 | 1 | |
| 20080714t1W05 | ADVANTEST | T5365 | Tester/Memory | 1995 | 1 | |
| 20080714t1W04 | ADVANTEST | T5365A | Tester/Memory | 1996 | 1 | |
| 20080714t1W03 | ADVANTEST | T5365A | Tester/Memory | 1996 | 1 | |
| 20080714t1W02 | ADVANTEST | T5365 | Tester/Memory | 1996 | 1 | |
| 20080714t1W01 | ADVANTEST | T5365 | Tester/Memory | 1994 | 1 | |
| 20080711t2L01 | YOKOGAWA | TS6000 | Tester | 2000 | 4 | |
| 20080711t1L01 | ADVANTEST | T5581 | Tester/Memory | 1996 | 1 | |
| 20080707t2E15 | Advantest | T3347 | Tester | Inq. | 1 | |
| 20080707t2E14 | Advantest | T6673 | Tester | Inq. | 1 | |
| 20080707t2E13 | VERIGY | 83000 | Tester | Inq. | 7 | |
| 20080707t2E12 | LTX | Trillium | Tester | Inq. | 3 | |
| 20080707t2E11 | LTX | DELTA-STE | Tester | Inq. | 9 | |
| 20080707t2E10 | LTX | Fusion CX | Tester | Inq. | 2 | |
| 20080707t2E09 | Credence | Octet | Tester | Inq. | 3 | |
| 20080707t2E08 | Credence | Quartet | Tester | Inq. | 6 | |
| 20080707t2E07 | Credence | MT1101 | Tester | Inq. | 5 | |
| 20080707t2E06 | Credence | SC212 | Tester | Inq. | 1 | |
| 20080707t2E05 | Credence | Duo/SX | Tester | Inq. | 10 | |
| 20080707t2E04 | Teradyne | J971SP | Tester | Inq. | 5 | |
| 20080707t2E03 | Teradyne | A585 | Tester | Inq. | 2 | |
| 20080707t2E02 | Teradyne | A575 | Tester | Inq. | 5 | |
| 20080707t2E01 | Teradyne | Tiger | Tester | Inq. | 3 | |
| 20080627t1W01 | LTX | E100 | Tester | 1994 | 1 | |
| 20080616t1E01 | ADVANTEST | T5771 | Tester | 2003 | 2 | |
| 20080603t2N02 | Schlumberger | S21 | Tester | 1998 | 2 | |
| 20080603t3N01 | HITACHI | HA5060 | Tester | 1998 | 6 | |
| 20080603t3N02 | ADVANTEST | T5365 | Tester | 1997 | 4 | |
| 20080603t3N05 | MULTITEST | SOP28 | F.T TESTER HANDLER | 1997 | 1 | |
| 20080605t1E03 | TERADYNE | J996FA | Tester | Inq. | 2 | |
| 20080605t1E04 | ADVANTEST | T5335P | Tester | Inq. | 3 | |
| 20080415t1B01 | Shibasoku | S230 | Tester | 2003 | 4 | |
| 20080414t3H01 | Yokogawa | TS670 | Tester | 2005 | 1 | |
| 20080227t3W03 | Credence | Kalos | Tester (for NAND/NOR/NVM etc.) | 2005 | 1 | |
| 20080227t3W02 | Credence | Kalos | Tester (for NAND/NOR/NVM etc.) | 2004 | 1 | |
| 20080227t3W01 | Credence | Kalos | Tester (for NAND/NOR/NVM etc.) | 2002 | 1 | |
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20090105t1W042 | CASCADE | REL-5500 | (8")Semi-Auto Probe | Inq. | 1 | |
| 20090105t1W031 | Alessi | REL-4500 | (6")Prober(Manuai,With STD) | Inq. | 2 | |
| 20090105t1W030 | Alessi | REL-4500 | (6")Prober(Manuai,With STD) | Inq. | 1 | |
| 20090105t1W020 | TEL | 19S | (8")Prober | Inq. | 1 | |
| 20090105t1W019 | TEL | 19S | (8")Prober | Inq. | 1 | |
| 20090105t1W018 | VLSI TEST | S15 | (8")Test F-3 Probe Test | Inq. | 1 | |
| 20081216t1E020 | Cascade | Summit 11751 | (8")Probe station | 2001 | 1 | |
| 20081216t1E019 | Cascade | Summit 12751B | Probe station | 2004 | 1 | |
| 20081216t1E012 | TSK | A-PM-90A | Prober | 1997 | 1 | |
| 20081216t1E011 | TSK | A-PM-90A | Prober | 1994 | 1 | |
| 20081216t1E010 | TSK | A-PM-90A | Prober | 1993 | 1 | |
| 20081216t1E005 | TEL | P-8 XLT | Prober | 2000 | 1 | |
| 20081216t1E004 | TSK | UF200D | Prober | 1998 | 4 | |
| 20081216t1E003 | TSK | UF200D | Prober | 1997 | 1 | |
| 20081215t2W080 | CS Electronics | CMP-150 | (4")Manual Probe | Inq. | 1 | |
| 20081215t2W071 | TEL | 19S | (4")Prober | Inq. | 1 | |
| 20081124t1E002 | TEL | Precio | (12")Prober | Inq. | 1 | |
| 20081121t1W004 | TERADYNE | IFLEX RF | Tester | 2007 | 1 | |
| 20081121t1W003 | TERADYNE | A575 | Tester | 2001 | 2 | |
| 20081121t1W002 | TERADYNE | Catalyst | Tester | 2004 | 1 | |
| 20081121t1W001 | ADVANTEST | T5585 | Tester | 2005 | 1 | |
| 20081121t1W007 | EG | 4200 | Prober | 2002 | 3 | |
| 20081111t1E001 | TEL | P-8XL | Prober | 2003 | 2 | |
| 20081106t4E064 | Electroglas | EG1304 | Prober | Inq. | 1 | |
| 20081106t4E063 | Electroglas | EG2001 | Prober | Inq. | 3 | |
| 20081106t1E020 | TSK | UF200 | Prober | Inq. | 5 | |
| 20081106t1E017 | Electroglas | 4090µ | Prober | 2004 | 1 | |
| 20081106t1E016 | Electroglas | 4090µ | Prober | 2002 | 1 | |
| 20081106t1E015 | Electroglas | 4090µ | Prober | 2001 | 1 | |
| 20081106t1E014 | TEL | P-8 | Prober | 1996 | 5 | |
| 20081104t1A013 | Electroglas | 2001XA | Prober | 1996 | 1 | |
| 20081017t2L007 | TEL | P8XLT | Prober | 2000 | 1 | |
| 20081017t2L006 | TEL | P8T | Prober | 1997 | 15 | |
| 20081017t2L005 | TEL | P8XL | Prober | 2000 | 4 | |
| 20081002t1L001 | TEL | 19S | Prober | Inq. | 3 | |
| 20080930t1C001 | TSK | UF3000 | (12")Prober | 2005 | 1 | |
| 20080918t1L001 | TEL | P-8 XL | Prober | 2006 | 2 | |
| 20080917t3L004 | TSK | UF200SA | Prober | 2002 | 1 | |
| 20080917t2P003 | TEL | 19S | (6")Prober | 1990 | 1 | |
| 20080902t2W005 | TSK | A-PM-90A | Prober | 1996 | 1 | |
| 20080902t2W004 | TSK | A-PM-90A | Prober | 1995 | 1 | |
| 20080902t2W003 | TSK | A-PM-90A | Prober | 1995 | 1 | |
| 20080822t1L006 | TSK | UF200S | Prober | 2002 | 1 | |
| 20080822t1L005 | TSK | UF200 | Prober | 2000 | 1 | |
| 20080822t1L004 | TSK | UF200 | Prober | 2000 | 1 | |
| 20080822t1L003 | TSK | UF200 | Prober | 1998 | 1 | |
| 20080822t1L002 | TSK | UF200 | Prober | 2000 | 1 | |
| 20080822t1L001 | TSK | UF200 | Prober | 2000 | 1 | |
| 20080801t0L05 | TSK | A-PM-90A | Prober | 1998 | 2 | |
| 20080801t0L04 | TEL | P-8 | Prober | 1997 | 2 | |
| 20080616t1E02 | TSK | UF200A | Prober | 2003 | 4 | |
| 20080613t2Y02 | Electroglas | 2001XA | Prober | 1996 | 1 | |
| 20080605t1E01 | TEL | P-8 XL | Prober | Inq. | 4 | |
| 20080605t1E02 | TSK | A-PMK-90A | Prober | Inq. | 6 | |
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20081216t1E015 | ANDO | AHM-912 | Auto-Handler | 1999 | 2 | |
| 20081216t1E014 | ANDO | AHM-912 | Auto-Handler | 1998 | 2 | |
| 20081121t1W006 | Synax | 12xx | Handler | 1999 | 1 | |
| 20081121t1W005 | Techwing | TW302 | Handler | 2008 | 2 | |
| 20081106t4E065 | DCI | Galaxy2050 | Handler | Inq. | 2 | |
| 20081106t3E031 | WTS | WTS-3900 | Handler | 2001 | 1 | |
| 20081106t3E030 | SinJa | JS200 | Handler | Inq. | 1 | |
| 20081106t3E029 | SinJa | JT100 | Handler | 2000 | 1 | |
| 20081106t1E026 | Hitachi | Inq. | Tray Handler | 2001 | 1 | |
| 20081106t1E025 | Hitachi | Inq. | Tray Handler | 2000 | 1 | |
| 20081106t1E012 | MCT | 5100 | Handler | Inq. | 2 | |
| 20081106t1E011 | Contrel | SH-300 | Handler | Inq. | 1 | |
| 20081106t1E010 | YOTEK | SC-100 | Handler | Inq. | 1 | |
| 20081106t1E009 | Semijess | JQ-200 | Handler | Inq. | 4 | |
| 20081106t1E008 | MCT | 5100 Dual | Handler | Inq. | 1 | |
| 20081106t1E007 | Tripod | IE-9DHCC | Handler | Inq. | 1 | |
| 20081010t2W011 | SYNAX | 1701 | Test Handler | 1999 | 1 | |
| 20081006t2L005 | DENKEN | DKH-2300KM | Handler | 2006 | 1 | |
| 20080929t1L012 | YOKOGAWA | HS2000-H12 | Handler | 2000 or 2001 | 9 | |
| 20080918t2E003 | ADVANTEST | M6542AD | Dynamic Test Handler | Inq. | 2 | |
| 20080917t1B002 | YOKOGAWA | AHM861 | Handler | 2005 | 2 | |
| 20080905t3L018 | STK Technology | PBS-HT22441 | Burn-in Machine | 2000 or 2001 | 13 | |
| 20080903t1J018 | ESI | Model 9820 | (12")Laser Repair | 2002 | 1 | |
| 20080903t1J017 | ESI | Model 9820 | (12")Laser Repair | 2002 | 1 | |
| 20080903t1J016 | ESI | Model 9820 | (12")Laser Repair | 2002 | 1 | |
| 20080905t3L020 | Todoh Seisakujo | TRｰ8200C | Burn-in Handler | 1999 | 1 | |
| 20080905t3L019 | STK Technology | BD-500 | Burn-in Handler | 2000 | 1 | |
| 20080905t3L015 | YOKOGAWA | HS2000-H12 | Handler | 2000 to 2001 | 9 | |
| 20080714t1W13 | ADVANTEST | M6841 | HANDLER | 1995 | 1 | |
| 20080714t1W12 | ADVANTEST | M6841 | HANDLER | 1995 | 1 | |
| 20080714t1W11 | ADVANTEST | M6841 | HANDLER | 1993 | 1 | |
| 20080714t1W10 | ADVANTEST | M6841 | HANDLER | 1996 | 1 | |
| 20080714t1W09 | ADVANTEST | M6841 | HANDLER | 1995 | 1 | |
| 20080711t1L03 | ADVANTEST | M6741A | Handler | 1997 | 1 | |
| 20080711t1L02 | ADVANTEST | M6741A | Handler | 1997 | 1 | |
| 20080704t2W03 | ADVANTEST | M3841A | Handler | Inq. | 1 | |
| 20080704t2W02 | Mirae | MR5400 | Handler | Inq. | 1 | |
| 20080613t2Y03 | K&S | Inq. | Handler | 1991 | 1 | |
| 20080603t2N01 | E&R eng. | 301 | Handler | 1997 | 1 | |
| 20080603t3N03 | ADVANTEST | M6862D | Handler M6862D | 2005 | 1 | |
| 20080603t3N04 | SEMIJESS | Inq. | HANDLER | 1999 | 1 | |
| 20080603t3N06 | MULTITEST | MT8589 | HANDLER SOP450 SS | 1998 | 1 | |
| 20080603t3N07 | MULTITEST | Inq. | MT8589 DUALSIT HANDLER | 1999 | 1 | |
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20081224t4E010 | JELIGHT | Model 1224 | EPROM Eraser | 2005 | 1 | |
| 20081224t1O001 | Agilent | E5270A | Parametric Measurement | 2004 | 1 | |
| 20081216t1E017 | Micro Vision | M851 | Mark & Lead Inspection | 1994 | 1 | |
| 20081216t1E016 | ESI | 9350 | Laser Repair | 1999 | 1 | |
| 20081215t2W082 | HIPOTRONICS | KVM200D | (4")KiloVolt Meter | Inq. | 1 | |
| 20081215t2W081 | KEITHLEY | K220 | (4")Current Source | Inq. | 1 | |
| 20081215t2W072 | TEKTRONIX | 370A | (4")Curve Tracer | Inq. | 1 | |
| 20081121c1O011 | Sun Microsystems | ULTRA30 | Work Station | 1998 | 1 | |
| 20081121c1O010 | YOKOGAWA | AS904-S02 | IC Emulator | 2001 | 2 | |
| 20081121t1W009 | GuideTech | Femto2000 | Continuous Time Interval Analyzer | 2005 | 1 | |
| 20081121t1W008 | GuideTech | GT4000 | Continuous Time Interval Analyzer | 2007 | 1 | |
| 20081117t2O046 | Agilent(HP) | 8970B | Noise Figure Meter | 2002 | 1 | |
| 20081117t2O045 | Anritsu | MA2444A | High Accuracy Power Sensor | 2001 | 1 | |
| 20081117t2O044 | Anritsu | ML2438A | Power Meter, 2ch | 2001 | 1 | |
| 20081117t2O043 | Agilent | 346B | Noise source | 2002 | 1 | |
| 20081117t2O042 | Agilent | 3478A | Digital Multimeters | Inq. | 2 | |
| 20081117t2O041 | Agilent | E9300A | Average power sensor | 2000 | 2 | |
| 20081117t2O040 | Agilent | E4419B | Power meter | 2000 | 1 | |
| 20081117t2O039 | Tektronix | 11302A/11A32/11A32 | Oscilloscope | Inq. | 1 | |
| 20081117t2O038 | Iwatsu | VOAC7411 | Digital Multimeters | Inq. | 1 | |
| 20081117t2O037 | Iwatsu | SS-5710 | Synchroscope | Inq. | 1 | |
| 20081117t2O036 | Agilent | 3400B | RMS Voltmeter | Inq. | 1 | |
| 20081113t1O011 | Produce | Inq. | Test evaluation tool | 2006 | 1 | |
| 20081113t1O010 | Produce | CIT-1000 | Macro inspection tool | 2006 | 2 | |
| 20081113t1O009 | Produce | CTS-1000 | Final test and Laser mark | 2006 | 2 | |
| 20081113t1O008 | Produce | CFA-1000 | Focus adjustment tool | 2006 | 2 | |
| 20081113t1O007 | Produce | CIT-1000 | Macro inspection tool | 2005 | 2 | |
| 20081113t1O006 | Produce | CTS-1000 | Final test and Laser mark | 2005 | 2 | |
| 20081113t1O005 | Produce | CFA-1000 | Focus adjusting tool | 2005 | 2 | |
| 20081113t1O004 | Fuji Machine | BI-800 | Lens barrel inserter | 2005 | 2 | |
| 20081113t1O003 | Fuji Machine | HA-800 | Lens holder Mounter | 2005 | 1 | |
| 20081113t1O002 | Fuji Machine | GA-800 | Glass Mounting Tool | 2005 | 1 | |
| 20081113t1O001 | Shin-Ohtsuka | SK-04F-6101 | Cleaning tool | 2005 | 1 | |
| 20081106t4E062 | Tektronix | TDS754C | Oscilloscope | Inq. | 1 | |
| 20081106t4E061 | Tektronix | TDS210 | Oscilloscope | Inq. | 1 | |
| 20081106t4E060 | SRS | PS350/5000V-25W | Power Supply | Inq. | 2 | |
| 20081106t4E059 | Xantrex | XT250-0.25 | Power Supply,DC | Inq. | 1 | |
| 20081106t4E058 | Xantrex | XT120-0.5 | Power Supply,DC | Inq. | 1 | |
| 20081106t4E057 | Xantrex | XDL35-5T | Power Supply,DC | Inq. | 1 | |
| 20081106t4E056 | GW | GPC-1850D | Power Supply | Inq. | 2 | |
| 20081106t4E055 | SRS | Model 630 | Channel Thermocouple Monitor | Inq. | 1 | |
| 20081106t4E054 | Citizen | CLP-7401 | Label Printer | Inq. | 2 | |
| 20081106t4E053 | HP(Agilent) | 8110A | Pulse Generator | Inq. | 1 | |
| 20081106t4E052 | SRS | PS350/5000V-25W | Power Supply | Inq. | 23 | |
| 20081106t1E013 | Inq. | JP400 | Sorting Tool | Inq. | 9 | |
| 20081104t1A016 | HP(Agilent) | 8753E | Network Analyzer | 2002 | 1 | |
| 20081104t1A015 | Mitsubishi | RD17MX | CRT | 1999 | 1 | |
| 20081104t1A014 | Plumfive | 2001CXT | TEG Probe | 1998 | 1 | |
| 20081017t2L008 | ESI | Model 9350 | (8") Laser Repair | 1999 | 1 | |
| 20081010t1D003 | HP/Agilent | 346A | Noise Source | 1985 | 1 | |
| 20081010t1L002 | Cascade Microtech | PS21 | (8")Automatic Prober, High/Low Temperature | 1998 | 1 | |
| 20081006t2D006 | ANDO | AQ-6315A | Spectrum Analyzer | 1994 | 1 | |
| 20081004t2E012 | AEHR | MTX-30000P | (8")Burn-in Tool | Inq. | 1 | |
| 20081002t2A031 | MACO | Inq. | RF Handler | 2000 | 1 | |
| 20081002t2A030 | Venture Kogyo | R2123M | RF Handler | 1998 | 2 | |
| 20081002t2A029 | Inq. | Inq. | RF Tester | 1996 | 1 | |
| 20081002t2A028 | ADVANTEST | Universal MPX | Pre Amplifier | 1999 | 1 | |
| 20080922t2L022 | Panasonic | VP7633A | Stereo Modulator | 1989 | 1 | |
| 20080922t2L021 | Panasonic | VP-8254A | AM STEREO SIGNAL GENERATOR | 1991 | 1 | |
| 20080922t2L020 | Tektronix | 2445B | Osciloscope | 1991 or 1992 | 2 | |
| 20080922t2L019 | Tektronix | 2445 | Osciloscope | 1986 | 1 | |
| 20080922t2L018 | Shibasoku | TP30C1 | Color still image ringer | 1990 | 1 | |
| 20080922t2L017 | Tektronix | 1410R | Video SG | 1986 | 1 | |
| 20080922t2L016 | HP (Agilent) | 3312A | Function Generator | 1992 | 1 | |
| 20080922t2L015 | Eiden | 115K(US) | TV Signal Generator(US Type, RF/IF) | 1989 | 1 | |
| 20080922t2L014 | Eiden | 115K | TV modulator | 1995 | 1 | |
| 20080922t2L013 | HP (Agilent) | 8662A | Signal Generator (For TV Tuner) | 1988 | 1 | |
| 20080922t2L012 | Eiden | 406J-A | TV sound multiple modulator (JPN Mode) | 1990 | 1 | |
| 20080922t2L011 | Eiden | 146F | MULTISYSTEM TV IF MODULATOR | 1991 | 1 | |
| 20080922t2L010 | Eiden | 458C-X | TV ALL CHANNEL UP CONVERTOR | 1991 | 1 | |
| 20080922t2L009 | HP (Agilent) | 3326A | Two Channel Synthesizer | 1987 | 1 | |
| 20080922t2L008 | Shibasoku | 925D/1 | NTSC Color Video Noise Meter | 1986 | 1 | |
| 20080922t2L007 | Shibasoku | U703/1 | Color Bar Unit | 1985 | 1 | |
| 20080922t2L006 | Shibasoku | TG7/1 | TV Signal Generator | 1986 | 1 | |
| 20080922t2L005 | HP (Agilent) | 8903B | Audio Analyzer | 1985 | 1 | |
| 20080922t2L004 | ADVANTEST | TR4171 | Spectrum Analyzer | 1986 | 1 | |
| 20080922t2L003 | Eiden | 465Z | TV sound multiple modulator (US Mode) | 1984 | 1 | |
| 20080922t2L002 | HP (Agilent) | 8656A | Signal Generator | 1984 | 1 | |
| 20080925t3O011 | Agilent | 85046A（2542A00905) | S-parameter Test Set | 2006 | 1 | |
| 20080925t3O010 | Agilent | 8753ES（US39175370) | Network Analyzer | 2006 | 1 | |
| 20080925t3O009 | INFICON | UL1000 | He Leak Detector | 2006 | 1 | |
| 20080925t3O008 | KEYENCE | NR2000 | Data Logger | 2006 | 1 | |
| 20080925t3O007 | BIRD | 8890-300 | Attenuator Coaxial Hardware | 2006 | 1 | |
| 20080925t3O006 | BIRD | 8921 | Attenuator Coaxial Hardware | 2006 | 5 | |
| 20080925t3O005 | MKS(ENI) | GHW-25 | RF Plasma Generator | 2006 | 1 | |
| 20080925t3O004 | MKS(ENI) | GHW-50 | RF Plasma Generator | 2006 | 4 | |
| 20080925t3O003 | Dressler | LFGS1250D | LF Generator | 2006 | 1 | |
| 20080925t1L001 | Temptronic | TP04310A | Thermal Inducing Systems | 2003 | 2 | |
| 20080922t2L022 | Panasonic | VP7633A | Stereo Modulator | 1989 | 1 | |
| 20080922t2L021 | Panasonic | VP-8254A | AM STEREO SIGNAL GENERATOR | 1991 | 1 | |
| 20080922t2L020 | Tektronix | 2445B | Osciloscope | 1991 1992 | 2 | |
| 20080922t2L019 | Tektronix | 2445 | Osciloscope | 1986 | 1 | |
| 20080922t2L018 | Shibasoku | TP30C1 | Color still image ringer | 1990 | 1 | |
| 20080922t2L017 | Tektronix | 1410R | Video SG | 1986 | 1 | |
| 20080922t2L016 | HP (Agilent) | 3312A | Function Generator | 1992 | 1 | |
| 20080922t2L015 | Eiden | 115K(US) | TV Signal Generator(US Type, RF/IF) | 1989 | 1 | |
| 20080922t2L014 | Eiden | 115K | TV modulator | 1995 | 1 | |
| 20080922t2L013 | HP (Agilent) | 8662A | Signal Generator (For TV Tuner) | 1988 | 1 | |
| 20080922t2L012 | Eiden | 406J-A | TV sound multiple modulator (JPN Mode) | 1990 | 1 | |
| 20080922t2L011 | Eiden | 146F | MULTISYSTEM TV IF MODULATOR | 1991 | 1 | |
| 20080922t2L010 | Eiden | 458C-X | TV ALL CHANNEL UP CONVERTOR | 1991 | 1 | |
| 20080922t2L009 | HP (Agilent) | 3326A | Two Channel Synthesizer | 1987 | 1 | |
| 20080922t2L008 | Shibasoku | 925D/1 | NTSC Color Video Noise Meter | 1986 | 1 | |
| 20080922t2L007 | Shibasoku | U703/1 | Color Bar Unit | 1985 | 1 | |
| 20080922t2L006 | Shibasoku | TG7/1 | TV Signal Generator | 1986 | 1 | |
| 20080922t2L005 | HP (Agilent) | 8903B | Audio Analyzer | 1985 | 1 | |
| 20080922t2L004 | ADVANTEST | TR4171 | Spectrum Analyzer | 1986 | 1 | |
| 20080922t2L003 | Eiden | 465Z | TV sound multiple modulator (US Mode) | 1984 | 1 | |
| 20080922t2L002 | HP (Agilent) | 8656A | Signal Generator | 1984 | 1 | |
| 20080813t1D04 | cosmic | Inq. | Panel's monoclome color evaluation tool | 2005 | 1 | |
| 20080813t1D03 | HP(Agilent) | 437B | Power Meter | 1997 | 1 | |
| 20080813t1D02 | Rohde & Schwarz | SMHU58 | Signal Generator | Inq. | 1 | |
| 20080813t1D01 | Leader Electronics | LG 3801 | DVB-T SIGNAL GENERATOR | 2004 | 1 | |
| 20080801t4L03 | RVSI | GS-7100 | BGA Inspection system | 2000 | 2 | |
| 20080711t5L06 | Acqiris | 732901 | Measurement System | 2003 | 1 | |
| 20080711t5L05 | Sun Micro. | Ultra 60 | Work Station | 1998 | 1 | |
| 20080711t5L04 | WAVETEK | MODEL193 | Signal Generator | 1985 | 1 | |
| 20080711t5L03 | Tektronix | TEK2465BDV | Osciloscope | 1991 | 1 | |
| 20080711t5L02 | Toyo Corp. | SMB200 | Smart-Bit system | 2001 | 1 | |
| 20080711t5L01 | HP | 16500B | Logic Anlyzer | 1996 | 1 | |
| 20080619t1H01 | Agilent(HP) | 54120A | Osciloscope | 1989 | 1 | |
| 20080619t1H02 | Agilent(HP) | 54120B | Osciloscope | 1989 | 1 | |
| 20080619t1H03 | RVSI | GS-7100 | BGA Inspection system | 2000 | 1 | |
| 20080613t2Y05 | Agilent(HP) | 8753E | Network Analyzer | 2002 | 1 | |
| 20080613t2Y04 | Agilent(HP) | 8753E | Network Analyzer | 1999 | 1 | |
| 20080613t2Y01 | Plumfive | 2001CXT | TEG Probe | 1998 | 1 | |
| 20080603t2N03 | Top Forward service | TFS2700 | laser scan | 1997 | 2 | |
| 20080603t2N04 | Top Forward service | TFS2700 | laser scan | 1998 | 1 | |
| 20080603t2N05 | Top Forward service | TFS-200 | lead scan | 1997 | 1 | |
| 20080603t2N06 | SEMIJESS | ST-200R | Tape&reel | 1999 | 1 | |
| 20080603t2N07 | SEMIJESS | ST-200R | Tape&reel | 2001 | 1 | |
| 20080603t2N08 | JEC | 1600C | Burn-in Oven | 1997 | 1 | |
| 20080603t2N09 | ADEC | 7056DC | Burn-in Oven | 1997 | 3 | |
| 20080603t3N08 | JS-400R | SOJ40 | OPEN/SHORT loader | 1998 | 1 | |
| 20080603t3N09 | MULTITEST | 8704I | loader-MULTITEST | 1998 | 2 | |
| 20080605t1E05 | ESI | 9350 | Laser Repair | Inq. | 1 | |
| 20080605t1E06 | AEHR | MTX-30000P | Burn-in and Test | Inq. | 1 | |
| 20080605t1E07 | KEITHLEY | S300 | Paranmetric Test | Inq. | 2 | |
| 20080418t1P39 | KATO | SP-61NX-A-S | Temp-cycle Tester | 1999 | 2 | |
| 20080418t1P38 | MACO | Inq. | RF Handler | 2000 | 1 | |
| 20080418t1P37 | Venture Kogyo | R2123M | RF Handler | 1998 | 2 | |
| 20080418t1P36 | Inq. | Inq. | RF Tester | 1996 | 1 | |
| 20080418t1P35 | ADVANTEST | Universal MPX | Pre Amplifier | 1999 | 1 | |
| FOR SALE TOOLS --- SMT Relared |
|
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20081215m1T026 | Musashi Eng. | ML-5000X | Dispensor | 2007 | 1 | |
| 20081106p3E038 | Cherusal | TM-101PR-MKIII | Pulse Heat Tool | 2004 | 1 | |
| 20081106p3E037 | Elitego | EM-5700N | PCB Cutting Tool | 2004 | 1 | |
| 20081002m2A027 | Newlong | LS-150 | Screen Printer | 2000 | 1 | |
| 20081002m2A026 | JUKI | KJ-01 | Chip Mounter | 2003 | 1 | |
| 20080929s1L001 | AIKOH ENGINEERING | 1605N | Lead-free solder testing tool(supported JIS lead-free solder test method） | 2000 | 1 | |
| 20080801s3L02 | Yasukawa Sangyo | Y600 | Reflow Oven | 2002 | 1 | |
| 20080801s3L01 | shibuya | SBM-100 | Ball Attachemnet Tool | 1998 | 1 | |
| 20080711s2L02 | Yasukawa Sangyo | Y600 | Reflow Oven | 2002 | 1 | |
| 20080630s1M02 | OMRON | VT-WIN-L | Solder Inspection | 1997 | 1 | |
| 20080630s1M01 | OMRON | VT-WIN-LH | Solder Inspection (With Numbering tool) | 2000 | 1 | |
| FOR SALE TOOLS --- LCD Manuf. / Elec. Component / Machine Tools |
|
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20081219z1G004 | Koyo | DXSG320 | (12")Wafer Grinder | 2004 | 1 | |
| 20081219z1G003 | Koyo | DXSG320 | (12")Wafer Grinder | 2004 | 1 | |
| 20081219z1G002 | Koyo | DXSG320 | (12")Wafer Grinder | 2003 | 1 | |
| 20081219z1G001 | Meyer Burger | DS261 | (12")Wire Saw | 2003 | 1 | |
| 20081217z2I009 | Lapmaster SFT | LGP-708XJ | CMP Tool (for wafer Manuf.) | 1998 | 1 | |
| 20081215q1T036 | IDEX | BF-50UT-S | T-simu. vibration | 2005 | 1 | |
| 20081215q1T035 | Inq. | Inq. | Vibration Test | 2004 | 1 | |
| 20081215q1T034 | SIMCO | Inq. | De-electricity Gun | 2003 | 2 | |
| 20081215q1T033 | Inq. | SC4BH0005 | Cell washing tool | 2004 | 1 | |
| 20081215q1T032 | Inq. | Inq. | Resin spreading tool | 2004 | 1 | |
| 20081215q1T031 | Inq. | Inq. | Resin spreading unit | 2004 | 1 | |
| 20081215q1T030 | SPEC | Inq. | LCD Bonding | 2002 | 15 | |
| 20081215q1T005 | OSP | Inq. | ACF Laminate | 2003 | 1 | |
| 20081215q1T004 | SPEC | Inq. | P-Plate Laminate | 2004 | 1 | |
| 20081215q1T003 | SPEC | Inq. | P-Plate Laminate | 2003 | 1 | |
| 20081215q1T002 | SPEC | Inq. | P-Plate Laminate | 2003 | 1 | |
| 20081215q1T001 | SPEC | Inq. | P-Plate Laminate | 2002 | 1 | |
| 20080929f1D007 | Dan-Takuma | SCHQR2504BS-TS | Drying Chamber | 1996 | 1 | |
| 20080801c5L04 | SHOWA DENKO | HAD30 | AL-RIE adsorption cylinder box | 1996 | 1 | |
| 20080929f1D004 | AIR TECH | AML-1500S | Draft Chamber | Inq. | 1 | |
| 20080801c5L02 | AIR TECH | AHO-100-56M | Clean air oven | Inq. | 1 | |
| 20080801c5L01 | TOYOTA | 3FB15 | ForkLift Truck | 1976 | 1 | |
| 20080801c1L02 | Matsunaga Mfg. | FCV-2637-3 | Power Freq. Exchanger | 2003 | 1 | |
| 20080801c1L01 | HISAKA Works | UX-315A-NH9-77 | Heat Exchanger | 2003 | 1 | |
| 20080710p1B10 | ODP | KLA6020 | Automatic Optical Inspection | Inq. | 1 | |
| 20080710p1B09 | MECS | 308FK19900081 | AUTO LOADER | Inq. | 1 | |
| 20080710p1B08 | ODP | KLA6510 | Review Station | Inq. | 1 | |
| 20080710p1B07 | DNS | SRG_360_A | AUTO DEVELOPER | Inq. | 1 | |
| 20080710p1B06 | DEAYAUN | HB300K | SOLDERING SYSTEM | Inq. | 1 | |
| 20080710p1B05 | SUNTECH WIN | STW-K1-55 | KNIFE CLEANER | Inq. | 1 | |
| 20080710p1B04 | SHINDO | MAX7 | Before PI Clean | Inq. | 1 | |
| 20080710p1B03 | OSUNGLST | OS-OVN11 | CURE OVEN | Inq. | 1 | |
| 20080710p1B02 | Hitach | Inq. | CD Meter | Inq. | 1 | |
| 20080710p1B01 | Toray | TRT920 | Titler | Inq. | 1 | |
| 20080616m2B01 | Okamoto | PL500 | Polishing Tool | 2002 | 1 | |
| 20080421p3B07 | Inq. | Inq. | Hot Plate (110'C) (Size=1400x1600) | Inq. | 1 | |
| 20080421p3B06 | LG | PMI1100 | Surface Insp? (Size=1100mm) | Inq. | 1 | |
| 20080421p3B05 | DNS | DSCH1500 | Cleaning Tool (Size=1400mm) | Inq. | 1 | |
| 20080421p3B04 | LFT | SL465D2 | W/B Defect Repair (Size=1100mm) | Inq. | 1 | |
| 20080421p3B03 | Lasertec | 1LM1120 | CD Meas. (Size=1120mm) | Inq. | 1 | |
| 20080421p3B02 | JUNSAN | JMP2006 | Dev/Etch/Strip (Size=1220x1400) | Inq. | 1 | |
| 20080421p3B01 | HIMT | MW1100 | Exposure Tool (Kr+ Laser) (Size=1100mm) | Inq. | 1 | |
Copyright 2005-2008 (TTC Group) Trust Technology Corporation. All Rights Reserved.