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| FOR SALE TOOLS --- Semiconductor Fabrication |
|
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20080723f3K01 | Canon | MPA600FA | Mask Aligner (W/F Size= 6") | 1985 | 1 | ![]() |
| 20080717f1K14 | TOK | TR8171UD-TM | (8")SOG Coat | Inq. | 1 | ![]() |
| 20080605f2E05 | NIKON | S308F | Scanner (W/F=200mm) | Inq. | 1 | ![]() |
| 20080605f2E06 | NIKON | SF-100 | 4X SF Stepper (W/F=200mm) | Inq. | 1 | ![]() |
| 20080605f2E07 | NIKON | SF-100 | Stepper (W/F=200mm) | Inq. | 1 | ![]() |
| 20080605f2E08 | TEL | Act-8 | Track,Coat/Develop (W/F=200mm) | Inq. | 1 | ![]() |
| 20080605f2E09 | Canon | AS4 | Arf Scanner (W/F=200mm) | Inq. | 1 | ![]() |
| 20080605f2E10 | JEOL | JBX-3030MV | Electron Beam Lithography (W/F=200mm) | Inq. | 1 | ![]() |
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20080826f1O004 | 3M | JS3000-4609-6 | (8")Insulator support etcher![]() | 2005 | 1 | ![]() |
| 20080825f1O005 | HITACHI | M-511A | (8")Dry Etch, Si![]() | 2005 | 1 | ![]() |
| 20080801f9L02 | ULVAC | RH-200 | Dry Etching System | 1990 | 1 | ![]() |
| 20080717f1K11 | HITACHI | M531A | (8")W-Interconnection Etch | Inq. | 1 | ![]() |
| 20080717f1K10 | HITACHI | M612 | (8")Poly Silicon Etch | Inq. | 1 | ![]() |
| 20080717f1K09 | TOK | TEC 3822 | (8")Plasma Etch/2 chamber | Inq. | 2 | ![]() |
| 20080717f1K08 | TEL | UNITY85DD | (8")Oxide Etch/2 chamber | Inq. | 1 | ![]() |
| 20080717f1K07 | TEL | UNITY85DD | (8")Oxide Etch (BS SAC) | Inq. | 1 | ![]() |
| 20080613f1Y05 | Canon | GIR-261R | Dry EtchiGIR-3j | 1998 | 1 | ![]() |
| 20080613f1Y04 | ALCATEL | AMS-200 | Deep RIEiD-RIEj | 2005 | 1 | ![]() |
| 20080507f6Y01 | Alcatel | MS200 I-Productivity | Deep RIE | 2005 | 1 | ![]() |
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20080825f1O002 | ANELVA | I-1052 | (8")Sputter![]() | 1989 | 1 | ![]() |
| 20080801p2L01 | ULVAC | MLH-2308RE | (5")Sputter | 1988 | 1 | ![]() |
| 20080801f9L06 | Shinko Seiki | Inq. | Plasma reflow system@ | 2006 | 1 | ![]() |
| 20080801f9L05 | EBARA | UFP-200/300 | Bump plating machine | 2005 | 1 | ![]() |
| 20080801f9L04 | EBARA | UFP-200/300 | Plating machine -low temperature- | 2006 | 1 | ![]() |
| 20080801f9L03 | EEJA | CP2001-02-0059 | CUP-PLATER semi-auto type | 2001 | 1 | ![]() |
| 20080729f1K04 | TEL | Alpha-8SE | (8")Furnace-Vert. | 2001 | 1 | ![]() |
| 20080729f1K03 | TEL | Alpha-8SE | (8")Furnace-Vert. | 2004 | 1 | ![]() |
| 20080729f1K02 | TEL | Alpha-8SE | (8")Furnace-Vert. | 2004 | 1 | ![]() |
| 20080729f1K01 | TEL | Alpha-8SE | (8")Furnace-Vert. | 2001 | 1 | ![]() |
| 20080717f1K01 | VARIAN | VIISION80 LE | (8")Ion Implant / H/Current | Inq. | 1 | ![]() |
| 20080717f1K05 | TEL | Alpha-808SC | (8")Furnace-NP SiN | Inq. | 1 | ![]() |
| 20080717f1K04 | TEL | Alpha-808SC | (8")Furnace-NP Poly | Inq. | 3 | ![]() |
| 20080717f1K03 | TEL | Alpha-808SC | (8")Furnace-TEOS | Inq. | 3 | ![]() |
| 20080717f1K02 | TEL | Alpha-808SC | (8")Furnace-TEOS | Inq. | 3 | ![]() |
| 20080717f1K13 | TEL | MB2(3CH) | (8")CVD WSi depo | Inq. | 1 | ![]() |
| 20080717f1K12 | DNS | LA820 | (8")RTA | Inq. | 1 | ![]() |
| 20080711f2L03 | ULVAC | MLH-2308RE | Sputter(5") | 1988 | 1 | ![]() |
| 20080710f0K01 | AMAT | P-5000 | PECVD(WCVD, 8") | 1992 | 1 | ![]() |
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20080801f2L04 | DNS | FC-821L | (8")Cleaning tool | 2001 | 1 | ![]() |
| 20080801f2L03 | DNS | FL-820L | (8")Clean Tool | 1997 | 1 | ![]() |
| 20080730f1K05 | DNS | WS-820L | (8")Wet Etch Sys. | Inq. | 1 | ![]() |
| 20080730f1K04 | DNS | WS-820L | (8")Wet Etch Sys. | Inq. | 1 | ![]() |
| 20080730f1K03 | DNS | WS-820L | (8")Wet Etch Sys. | Inq. | 1 | ![]() |
| 20080730f1K02 | DNS | WS-820L | (8")Wet Etch Sys. | Inq. | 1 | ![]() |
| 20080717f1K06 | DNS | FL-820L | Wet Station / Closed Type Light Etch | Inq. | 4 | ![]() |
| 20080711f4L02 | Chemical Art Technology | Inq. | Draft Chamber(8") | 1995 | 1 | ![]() |
| 20080711f4L01 | Puretron | MM-1-W-SC-A | Ozone water systems(8") | 1995 | 1 | ![]() |
| 20080702f2H04 | DNS | FL-820L | Clean Tool | 1997 | 1 | ![]() |
| 20080605f2E13 | DNS | FS-820L | Wet Bench (Clean Tool) (W/F=200mm) | Inq. | 1 | ![]() |
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20080827f1L002 | Litel Instruments | Litel Reticle | Interferometer![]() | 2000 | 1 | ![]() |
| 20080827f1L001 | EBARA | ET1600WS | Turbo Molecular Pump![]() | 2006 | 2 | ![]() |
| 20080826f1O007 | Chuo Riken | CT-50UDP (2 Bath) | (8")Clean Oven![]() | 2005 | 1 | ![]() |
| 20080825f1O004 | DNS | AS2000 | (8")Post CMP Clean![]() | 2005 | 1 | ![]() |
| 20080825f1O003 | TSK | ChaMP-232 | (8")CMP, Cu![]() | 2005 | 1 | ![]() |
| 20080801f9L10 | Chamical Art | Inq. | draft chamber | 1995 | 1 | ![]() |
| 20080801f9L09 | Puretron | MM-1-W-SC-A | ozone water systems | 1995 | 1 | ![]() |
| 20080801f9L08 | HITACHI | PCV-843BN | Clean bench | 1991 | 1 | ![]() |
| 20080801f9L07 | Air Tech | ACB-521CFS | Clean both | 1991 | 1 | ![]() |
| 20080801f8L01 | Dan-Takuma | SCH-1802C-RS-M | Reticle Stocker | 1990 | 1 | ![]() |
| 20080711f3L02 | HITACHI | PCV-843BN | Clean Bench | 1991 | 3 | ![]() |
| 20080711f3L01 | Air Tech | ACB-521FS | Clean Booth | 1991 | 1 | ![]() |
| 20080613f1Y12 | Inq. | LZ-2100GFW12 | Leak Test | Inq. | 1 | ![]() |
| 20080613f1Y11 | Fukuda | MS-5085 | Leak Test | 2004 | 1 | ![]() |
| 20080613f1Y10 | Fukuda | MS-5085 | Leak Test | 2004 | 1 | ![]() |
| 20080613f1Y09 | Fukuda | MS-5085 | Leak Test | 2004 | 1 | ![]() |
| 20080613f1Y08 | Cosmo | LZ-2100G- 03FW89 | Leak Test | Inq. | 1 | ![]() |
| 20080613f1Y07 | Cosmo | LZ-2100G- 03FW89 | Leak Test | Inq. | 1 | ![]() |
| 20080613f1Y06 | Inq. | NR030-2945 | Peeling Tool | 2004 | 1 | ![]() |
( Go to ---> MENU , FAB , ASSY , TEST , Metrology , LCD etc. )
| FOR SALE TOOLS --- Semiconductor Metrology / Inspection/Other |
|
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20080826f1O003 | HITACHI | S-3600N | (8")SEM![]() | 2005 | 1 | ![]() |
| 20080826f1O002 | Hitachi Kenki Finetech | FS300i | (8")Scanning Accoustic Tomograph![]() | 2005 | 1 | ![]() |
| 20080801f9L01 | Veeco | Wyko NT1100 | (8")Measurement System | 2005 | 1 | ![]() |
| 20080801f2L06 | HORIBA | DEGILEM@550 | Film Thick Meas. | 2004 | 1 | ![]() |
| 20080801f2L05 | SONY | ILS-10 | Wafer Surface Insp. | 2000 | 1 | ![]() |
| 20080730f1K01 | Leica | INS3000 | (8")Review Station | Inq. | 1 | ![]() |
| 20080723a2L01 | ICOS | CI-9250 | Macro Inspection | 2004 | 1 | ![]() |
| 20080613f1Y03 | EV Group | EVG40 | Microscope(Dual side) | 2005 | 1 | ![]() |
| 20080613f1Y02 | Rigaku | ZSX100e | X-ray Fluorescence Spectrometer | 2000 | 1 | ![]() |
| 20080613f1Y01 | TOPCON | WM3-2 | Surface Inspection | 1998 | 1 | ![]() |
| 20080605f2E15 | HITACHI | S-8820 | CD SEM (W/F=200mm) | Inq. | 1 | ![]() |
| 20080605f2E16 | AMAT | SEM vision CX | INSPECT SEM (W/F=200mm) | Inq. | 1 | ![]() |
| 20080605f2E17 | AMAT | SEM vision CX | INSPECT SEM (W/F=200mm) | Inq. | 1 | ![]() |
| 20080605f2E18 | AMAT | SEM vision CX | INSPECT SEM (W/F=200mm) | Inq. | 1 | ![]() |
| 20080605f2E19 | NIKON | OPT-3A | Microscope (W/F=200mm) | Inq. | 1 | ![]() |
| 20080605f2E20 | LEICA | INS2000 | Review Station (W/F=200mm) | Inq. | 1 | ![]() |
( Go to ---> MENU , FAB , ASSY , TEST , Metrology , LCD etc. )
| FOR SALE TOOLS --- LCD Manuf. / Elec. Component / Machine Tools |
|
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20080801c5L05 | Dan-Takuma | SCHQR2504BS-TS | Drying Chamber | 1996 | 1 | ![]() |
| 20080801c5L04 | SHOWA DENKO | HAD30 | "AL-RIE adsorption cylinder box" | 1996 | 1 | ![]() |
| 20080801c5L03 | AIR TECH | AML-1500S | Draft Chamber | Inq. | 1 | ![]() |
| 20080801c5L02 | AIR TECH | AHO-100-56M | Clean air oven | Inq. | 1 | ![]() |
| 20080801c5L01 | TOYOTA | 3FB15 | ForkLift Truck | 1976 | 1 | ![]() |
| 20080801c1L02 | Matsunaga Mfg. | FCV-2637-3 | Power Freq. Exchanger | 2003 | 1 | ![]() |
| 20080801c1L01 | HISAKA Works | UX-315A-NH9-77 | Heat Exchanger | 2003 | 1 | ![]() |
| 20080723p1W01 | LG | PTML | Mask Blanks Inspection | 2004 | 1 | ![]() |
| 20080710p1B10 | ODP | KLA6020 | Automatic Optical Inspection | Inq. | 1 | ![]() |
| 20080710p1B09 | MECS | 308FK19900081 | AUTO LOADER | Inq. | 1 | ![]() |
| 20080710p1B08 | ODP | KLA6510 | Review Station | Inq. | 1 | ![]() |
| 20080710p1B07 | DNS | SRG_360_A | AUTO DEVELOPER | Inq. | 1 | ![]() |
| 20080710p1B06 | DEAYAUN | HB300K | SOLDERING SYSTEM | Inq. | 1 | ![]() |
| 20080710p1B05 | SUNTECH WIN | STW-K1-55 | KNIFE CLEANER | Inq. | 1 | ![]() |
| 20080710p1B04 | SHINDO | MAX7 | Before PI Clean | Inq. | 1 | ![]() |
| 20080710p1B03 | OSUNGLST | OS-OVN11 | CURE OVEN | Inq. | 1 | ![]() |
| 20080710p1B02 | Hitach | Inq. | CD Meter | Inq. | 1 | ![]() |
| 20080710p1B01 | Toray | TRT920 | Titler | Inq. | 1 | ![]() |
| 20080616m2B01 | Okamoto | PL500 | Polishing Tool | 2002 | 1 | ![]() |
| 20080421p3B07 | Inq. | Inq. | Hot Plate (110'C) (Size=1400x1600) | Inq. | 1 | ![]() |
| 20080421p3B06 | LG | PMI1100 | Surface Insp? (Size=1100mm) | Inq. | 1 | ![]() |
| 20080421p3B05 | DNS | DSCH1500 | Cleaning Tool (Size=1400mm) | Inq. | 1 | ![]() |
| 20080421p3B04 | LFT | SL465D2 | W/B Defect Repair (Size=1100mm) | Inq. | 1 | ![]() |
| 20080421p3B03 | Lasertec | 1LM1120 | CD Meas. (Size=1120mm) | Inq. | 1 | ![]() |
| 20080421p3B02 | JUNSAN | JMP2006 | Dev/Etch/Strip (Size=1220x1400) | Inq. | 1 | ![]() |
| 20080421p3B01 | HIMT | MW1100 | Exposure Tool (Kr+ Laser) (Size=1100mm) | Inq. | 1 | ![]() |
( Go to ---> MENU , FAB , ASSY , TEST , Metrology , LCD etc. )
| FOR SALE TOOLS --- Semiconductor Assembly and SMT | ||||||
|
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20080827c1L003 | FUJIIMPULSE | FV-600-NG-10W | Vacuum and gas flush sealer![]() | 2000 | 1 | ![]() |
| 20080714a2W14 | SHINKAWA | SPA-210 | DIE ATTACHER | 2000 | 1 | ![]() |
| 20080714a2W13 | SHINKAWA | SPA-200 | DIE ATTACHER | 2000 | 1 | ![]() |
| 20080714a2W12 | SHINKAWA | SPA-210 | DIE ATTACHER | 2001 | 1 | ![]() |
| 20080714a2W11 | SHINKAWA | SPA-210 | DIE ATTACHER | 2001 | 1 | ![]() |
| 20080714a2W10 | SHINKAWA | SPA-210 | DIE ATTACHER | 2001 | 1 | ![]() |
| 20080714a2W09 | OSUNG LST | 01021142110-1 | VACUUM CHAME | 2001 | 1 | ![]() |
| 20080714a2W08 | OSUNG LST | OS4-120AVC | CURE OVEN | 1999 | 1 | ![]() |
| 20080714a2W07 | June Tech | JTS2000W | MBT SORTER | 1998 | 1 | ![]() |
| 20080714a2W06 | June Tech | JTS2000W | MBT SORTER | 1997 | 1 | ![]() |
| 20080714a2W05 | June Tech | JTS2000W | MBT SORTER | 1998 | 1 | ![]() |
| 20080714a2W04 | June Tech | JTS2000W | MBT SORTER | 1997 | 1 | ![]() |
| 20080714a2W03 | SECRON | UTS-2001 | STACK-TACK | 2001 | 1 | ![]() |
| 20080714a2W02 | GENERAL SCANNING | LM6000 | MARKER | 1997 | 1 | ![]() |
| 20080714a2W01 | GENERAL SCANNING | LM6000 | MARKER | 1996 | 1 | ![]() |
| 20080708a1E02 | A.E Advanced | MWM-850 | Wafer mounting | Inq. | 1 | ![]() |
| 20080708a1E01 | KEYENCE | ML-9100 | Laser mark | Inq. | 2 | ![]() |
| 20080616a2B02 | DYNATEX | GST-150 | Scribeer Breaker | 2002 | 1 | ![]() |
| 20080613a2Y06 | DAGE | MODEL 14000 | BUMP Share Tester | 2000 | 1 | ![]() |
| 20080603a1N05 | KIGIANT | 200 tons | Mold Press | 1997 | 11 | ![]() |
| 20080603a1N06 | GPD | BGA | molding machine | 1998 | 1 | ![]() |
| 20080603a1N07 | INQ | UPH 22000 | Wafer molding machine | 1998 | 1 | ![]() |
| 20080603a1N08 | ASM | Inq. | BGA margin cutter | 1998 | 1 | ![]() |
| 20080603a1N09 | YF-02 | BGA | BGA washer | 1998 | 1 | ![]() |
| 20080603a1N10 | KINEGY | AFL-CH2-04S | INQ | 1997 | 15 | ![]() |
| 20080603a1N12 | DEMIN | SIZE40~58mm | preheater | 1998 | 2 | ![]() |
| 20080603a1N13 | DEMIN | SSOP48L | preheater | 1998 | 1 | ![]() |
| 20080603a1N14 | GTA | ZX-CO-106 | laser printer CO2 | 1998 | 1 | ![]() |
| 20080603a1N16 | GPM | SOJ42 SSOP48 | shaper | 1998 | 2 | ![]() |
| 20080603a1N17 | YAMADA | SOJ 24/26 | auto shaper | 1997 | 1 | ![]() |
| 20080603a1N18 | ASM | SOJ 24/26 | shaper-2 | 1997 | 1 | ![]() |
| 20080603a1N19 | EVER TECH | FOR TRAY QFP TSOP FP-550 | lead scan | 1998 | 1 | ![]() |
| 20080603a1N20 | EVER TECH | SSOP-48/56L | semi-auto lead scan | 1998 | 2 | ![]() |
| 20080603a1N21 | EVER TECH | SPJ 300/400MIL SSR-300A | lead scan | 1998 | 1 | ![]() |
| 20080603a1N22 | Motec | BIBU100 | unloader | 1997 | 1 | ![]() |
| 20080603a1N23 | Motec | BIBL100 | loader | 1997 | 1 | ![]() |
| 20080603a1N24 | Motec | BIBL100 | unloader/loader | 1998 | 1 | ![]() |
| 20080603a1N25 | Motec | PPLU 100 | unloader/loader | 1998 | 1 | ![]() |
| 20080603a1N26 | GTA electronic | ZX-LU-101 | laser marker | 1997 | 1 | ![]() |
| 20080603a1N27 | YAG | Inq | laser marker | 1997 | 1 | ![]() |
| 20080603a1N28 | E&R engineering | PR2000 | ink marker | 2000 | 1 | ![]() |
| 20080603a1N29 | MISUZU | BA-1100 | INQ | 1998 | 1 | ![]() |
| 20080602a2B07 | OPTO Sys. | LPAM7000V16-T | Chip Sorter | 2001 | 1 | ![]() |
| 20080602a2B06 | ASM | MS896 | Chip Sorter | 2001 | 1 | ![]() |
| 20080602a2B05 | OPTO Sys. | WPOH-105AS-T | CHIP TEST | 2001 | 1 | ![]() |
| 20080602a2B04 | JT | JCS-6300 | Chip Sorter | 2001 | 1 | ![]() |
| 20080602a2B03 | JT | JCP-1000 | CHIP TEST | 2001 | 1 | ![]() |
| 20080418a1P26 | MATSUO | Inq. | Laser Marker | 2000 | 1 | ![]() |
| 20080418a1P25 | MATSUO | Inq. | Laser Marker | 1995 | 1 | ![]() |
| 20080418a1P24 | NEC | Inq. | L/Mark Handler | 2001 | 2 | ![]() |
| 20080418a1P23 | SUNX | LP-F10 | Laser Marker | 2000 | 1 | ![]() |
| 20080418a1P22 | MIYACHI | ML-2050A | Laser Spot Welder | 2002 | 2 | ![]() |
| 20080418a1P21 | MIYACHI | ML-2050A | Laser Spot Welder | 2001 | 1 | ![]() |
| 20080418a1P20 | NEC? | CAMS-1 | Mold Press | 2001 | 1 | ![]() |
| 20080418a1P19 | Apic Yamada | MS-7050F | Mold Press | 1997 | 1 | ![]() |
| 20080418a1P18 | NEC | SL-432G2 | Laser Trimer | 2000 | 2 | ![]() |
| 20080418a1P17 | NEC | SL-432G2 | Laser Trimer | 1998 | 1 | ![]() |
| 20080418a1P16 | NEC | SL-432G2 | Laser Trimer | 1997 | 3 | ![]() |
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20080801s3L02 | Yasukawa Sangyo | Y600 | Reflow Oven | 2002 | 1 | ![]() |
| 20080801s3L01 | shibuya | SBM-100 | Ball Attachemnet Tool | 1998 | 1 | ![]() |
| 20080711s2L02 | Yasukawa Sangyo | Y600 | Reflow Oven | 2002 | 1 | ![]() |
| 20080630s1M02 | OMRON | VT-WIN-L | Solder Inspection | 1997 | 1 | ![]() |
| 20080630s1M01 | OMRON | VT-WIN-LH | Solder Inspection (With Numbering tool) | 2000 | 1 | ![]() |
( Go to ---> MENU , FAB , ASSY , TEST , Metrology , LCD etc. )
| FOR SALE TOOLS --- Semiconductor Test Systems |
|
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20080828t1L001 | TERADYNE | Catalyst | Test System, Mixed-signal/SOC digital ![]() | Inq. | 1 | ![]() |
| 20080822t4L020 | YOKOGAWA | TS6700 | Tester![]() | 2000 | 1 | ![]() |
| 20080821t2L005 | YOKOGAWA | ST6730 | Test System, FPD Driver | 2006 | 1 | ![]() |
| 20080801t7L01 | YOKOGAWA | TS6000 | Tester | 2000 | 7 | ![]() |
| 20080801t4L02 | YOKOGAWA | TS6000 | Tester | 2000 | 7 | ![]() |
| 20080801t4L01 | YOKOGAWA | TS6000 | Tester | 2000 | 4 | ![]() |
| 20080801t0L03 | ADVANTEST | T5335P | Tester | 1998 | 1 | ![]() |
| 20080801t0L02 | ADVANTEST | T5335P | Tester | 1998 | 1 | ![]() |
| 20080801t0L01 | ADVANTEST | T5335P | Tester | 1997 | 1 | ![]() |
| 20080725t1K01 | Agilent | 83000 | Tester - SoC | 1995 | 1 | ![]() |
| 20080724t2E01 | Credence | Kalos 2 | Tester - Memory | Inq. | 1 | ![]() |
| 20080724t1K01 | Agilent(HP) | 4062UX | Tester (Parametric) | 1995 | 1 | ![]() |
| 20080723t4K01 | Credence | SAPPHIRE@NP | Tester - Logic | 2006 | 1 | ![]() |
| 20080722t2K01 | Agilent | V3304 | TESTER/Memory | 1997 | 20 | ![]() |
| 20080722t1K01 | YOKOGAWA | TS1000 | TESTER/M-signal | 2004 | 2 | ![]() |
| 20080714t1W08 | ADVANTEST | T5365 | Tester/Memory | 1994 | 1 | ![]() |
| 20080714t1W07 | ADVANTEST | T5365 | Tester/Memory | 1995 | 1 | ![]() |
| 20080714t1W06 | ADVANTEST | T5365 | Tester/Memory | 1996 | 1 | ![]() |
| 20080714t1W05 | ADVANTEST | T5365 | Tester/Memory | 1995 | 1 | ![]() |
| 20080714t1W04 | ADVANTEST | T5365A | Tester/Memory | 1996 | 1 | ![]() |
| 20080714t1W03 | ADVANTEST | T5365A | Tester/Memory | 1996 | 1 | ![]() |
| 20080714t1W02 | ADVANTEST | T5365 | Tester/Memory | 1996 | 1 | ![]() |
| 20080714t1W01 | ADVANTEST | T5365 | Tester/Memory | 1994 | 1 | ![]() |
| 20080711t2L01 | YOKOGAWA | TS6000 | Tester | 2000 | 4 | ![]() |
| 20080711t1L01 | ADVANTEST | T5581 | Tester/Memory | 1996 | 1 | ![]() |
| 20080707t2E15 | Advantest | T3347 | Tester | Inq. | 1 | ![]() |
| 20080707t2E14 | Advantest | T6673 | Tester | Inq. | 1 | ![]() |
| 20080707t2E13 | VERIGY | 83000 | Tester | Inq. | 7 | ![]() |
| 20080707t2E12 | LTX | Trillium | Tester | Inq. | 3 | ![]() |
| 20080707t2E11 | LTX | DELTA-STE | Tester | Inq. | 9 | ![]() |
| 20080707t2E10 | LTX | Fusion CX | Tester | Inq. | 2 | ![]() |
| 20080707t2E09 | Credence | Octet | Tester | Inq. | 3 | ![]() |
| 20080707t2E08 | Credence | Quartet | Tester | Inq. | 6 | ![]() |
| 20080707t2E07 | Credence | MT1101 | Tester | Inq. | 5 | ![]() |
| 20080707t2E06 | Credence | SC212 | Tester | Inq. | 1 | ![]() |
| 20080707t2E05 | Credence | Duo/SX | Tester | Inq. | 10 | ![]() |
| 20080707t2E04 | Teradyne | J971SP | Tester | Inq. | 5 | ![]() |
| 20080707t2E03 | Teradyne | A585 | Tester | Inq. | 2 | ![]() |
| 20080707t2E02 | Teradyne | A575 | Tester | Inq. | 5 | ![]() |
| 20080707t2E01 | Teradyne | Tiger | Tester | Inq. | 3 | ![]() |
| 20080627t1W01 | LTX | E100 | Tester | 1994 | 1 | ![]() |
| 20080620t2K02 | ADVANTEST | T5581C | Tester/Memory | Inq. | 1 | ![]() |
| 20080620t2K01 | ADVANTEST | T5581D | Tester/Memory | Inq. | 1 | ![]() |
| 20080616t1E01 | ADVANTEST | T5771 | Tester | 2003 | 2 | ![]() |
| 20080603t2N02 | Schlumberger | S21 | Tester | 1998 | 2 | ![]() |
| 20080603t3N01 | HITACHI | HA5060 | Tester | 1998 | 6 | ![]() |
| 20080603t3N02 | ADVANTEST | T5365 | Tester | 1997 | 4 | ![]() |
| 20080603t3N05 | MULTITEST | SOP28 | F.T TESTER HANDLER | 1997 | 1 | ![]() |
| 20080605t1E03 | TERADYNE | J996FA | Tester | Inq. | 2 | ![]() |
| 20080605t1E04 | ADVANTEST | T5335P | Tester | Inq. | 3 | ![]() |
| 20080415t1B01 | Shibasoku | S230 | Tester | 2003 | 4 | ![]() |
| 20080414t3H01 | Yokogawa | TS670 | Tester | 2005 | 1 | ![]() |
| 20080227t3W03 | Credence | Kalos | Tester (for NAND/NOR/NVM etc.) | 2005 | 1 | ![]() |
| 20080227t3W02 | Credence | Kalos | Tester (for NAND/NOR/NVM etc.) | 2004 | 1 | ![]() |
| 20080227t3W01 | Credence | Kalos | Tester (for NAND/NOR/NVM etc.) | 2002 | 1 | ![]() |
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20080822t1L006 | TSK | UF200S | Prober![]() | 2002 | 1 | ![]() |
| 20080822t1L005 | TSK | UF200 | Prober![]() | 2000 | 1 | ![]() |
| 20080822t1L004 | TSK | UF200 | Prober![]() | 2000 | 1 | ![]() |
| 20080822t1L003 | TSK | UF200 | Prober![]() | 1998 | 1 | ![]() |
| 20080822t1L002 | TSK | UF200 | Prober![]() | 2000 | 1 | ![]() |
| 20080822t1L001 | TSK | UF200 | Prober![]() | 2000 | 1 | ![]() |
| 20080801t0L05 | TSK | A-PM-90A | Prober | 1998 | 2 | ![]() |
| 20080801t0L04 | TEL | P-8 | Prober | 1997 | 2 | ![]() |
| 20080616t1E02 | TSK | UF200A | Prober | 2003 | 4 | ![]() |
| 20080613t2Y02 | Electroglas | 2001XA | Prober | 1996 | 1 | ![]() |
| 20080605t1E01 | TEL | P-8 XL | Prober | Inq. | 4 | ![]() |
| 20080605t1E02 | TSK | A-PMK-90A | Prober | Inq. | 6 | ![]() |
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20080714t1W13 | ADVANTEST | M6841 | HANDLER | 1995 | 1 | ![]() |
| 20080714t1W12 | ADVANTEST | M6841 | HANDLER | 1995 | 1 | ![]() |
| 20080714t1W11 | ADVANTEST | M6841 | HANDLER | 1993 | 1 | ![]() |
| 20080714t1W10 | ADVANTEST | M6841 | HANDLER | 1996 | 1 | ![]() |
| 20080714t1W09 | ADVANTEST | M6841 | HANDLER | 1995 | 1 | ![]() |
| 20080711t1L03 | ADVANTEST | M6741A | Handler | 1997 | 1 | ![]() |
| 20080711t1L02 | ADVANTEST | M6741A | Handler | 1997 | 1 | ![]() |
| 20080704t2W03 | ADVANTEST | M3841A | Handler | Inq. | 1 | ![]() |
| 20080704t2W02 | Mirae | MR5400 | Handler | Inq. | 1 | ![]() |
| 20080618t1K01 | ADVANTEST | M7521A | Handler | Inq. | 1 | ![]() |
| 20080613t2Y03 | K&S | Inq. | Handler | 1991 | 1 | ![]() |
| 20080603t2N01 | E&R eng. | 301 | Handler | 1997 | 1 | ![]() |
| 20080603t3N03 | ADVANTEST | M6862D | Handler M6862D | 2005 | 1 | ![]() |
| 20080603t3N04 | SEMIJESS | Inq. | HANDLER | 1999 | 1 | ![]() |
| 20080603t3N06 | MULTITEST | MT8589 | HANDLER SOP450 SS | 1998 | 1 | ![]() |
| 20080603t3N07 | MULTITEST | Inq. | MT8589 DUALSIT HANDLER | 1999 | 1 | ![]() |
| TTC ID | MAKER | MODEL | DESCRIPTION | VIN. | QTY | INQ. |
| 20080828t2K002 | Tektronix | 370 | Curve Tracer![]() | Inq. | 1 | ![]() |
| 20080813t1D04 | cosmic | Inq. | Panel's monoclome color evaluation tool | 2005 | 1 | ![]() |
| 20080813t1D03 | HP(Agilent) | 437B | Power Meter | 1997 | 1 | ![]() |
| 20080813t1D02 | Rohde & Schwarz | SMHU58 | Signal Generator | Inq. | 1 | ![]() |
| 20080813t1D01 | Leader Electronics | LG 3801 | DVB-T SIGNAL GENERATOR | 2004 | 1 | ![]() |
| 20080801t4L03 | RVSI | GS-7100 | BGA Inspection system | 2000 | 2 | ![]() |
| 20080711t5L06 | Acqiris | 732901 | Measurement System | 2003 | 1 | ![]() |
| 20080711t5L05 | Sun Micro. | Ultra 60 | Work Station | 1998 | 1 | ![]() |
| 20080711t5L04 | WAVETEK | MODEL193 | Signal Generator | 1985 | 1 | ![]() |
| 20080711t5L03 | Tektronix | TEK2465BDV | Osciloscope | 1991 | 1 | ![]() |
| 20080711t5L02 | Toyo Corp. | SMB200 | Smart-Bit system | 2001 | 1 | ![]() |
| 20080711t5L01 | HP | 16500B | Logic Anlyzer | 1996 | 1 | ![]() |
| 20080619t1H01 | Agilent(HP) | 54120A | Osciloscope | 1989 | 1 | ![]() |
| 20080619t1H02 | Agilent(HP) | 54120B | Osciloscope | 1989 | 1 | ![]() |
| 20080619t1H03 | RVSI | GS-7100 | BGA Inspection system | 2000 | 1 | ![]() |
| 20080613t2Y05 | Agilent(HP) | 8753E | Network Analyzer | 2002 | 1 | ![]() |
| 20080613t2Y04 | Agilent(HP) | 8753E | Network Analyzer | 1999 | 1 | ![]() |
| 20080613t2Y01 | Plumfive | 2001CXT | TEG Probe | 1998 | 1 | ![]() |
| 20080603t2N03 | Top Forward service | TFS2700 | laser scan | 1997 | 2 | ![]() |
| 20080603t2N04 | Top Forward service | TFS2700 | laser scan | 1998 | 1 | ![]() |
| 20080603t2N05 | Top Forward service | TFS-200 | lead scan | 1997 | 1 | ![]() |
| 20080603t2N06 | SEMIJESS | ST-200R | Tape&reel | 1999 | 1 | ![]() |
| 20080603t2N07 | SEMIJESS | ST-200R | Tape&reel | 2001 | 1 | ![]() |
| 20080603t2N08 | JEC | 1600C | Burn-in Oven | 1997 | 1 | ![]() |
| 20080603t2N09 | ADEC | 7056DC | Burn-in Oven | 1997 | 3 | ![]() |
| 20080603t3N08 | JS-400R | SOJ40 | OPEN/SHORT loader | 1998 | 1 | ![]() |
| 20080603t3N09 | MULTITEST | 8704I | loader-MULTITEST | 1998 | 2 | ![]() |
| 20080605t1E05 | ESI | 9350 | Laser Repair | Inq. | 1 | ![]() |
| 20080605t1E06 | AEHR | MTX-30000P | Burn-in and Test | Inq. | 1 | ![]() |
| 20080605t1E07 | KEITHLEY | S300 | Paranmetric Test | Inq. | 2 | ![]() |
| 20080418t1P39 | KATO | SP-61NX-A-S | Temp-cycle Tester | 1999 | 2 | ![]() |
| 20080418t1P38 | MACO | Inq. | RF Handler | 2000 | 1 | ![]() |
| 20080418t1P37 | Venture Kogyo | R2123M | RF Handler | 1998 | 2 | ![]() |
| 20080418t1P36 | Inq. | Inq. | RF Tester | 1996 | 1 | ![]() |
| 20080418t1P35 | ADVANTEST | Universal MPX | Pre Amplifier | 1999 | 1 | ![]() |
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